Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
177 words
A dynamic random access memory structure comprising: means for supplying a voltage VCC, a switching means having first and second sides, said first side of said switching means connected to said voltage supply means VCC, a first bitline having a first voltage level signal thereon, said first voltage level on said first bitline periodically swinging in a first, high going direction to a second high bit swing voltage level, a sense amplifier circuit connected to said first bitline, said sense amplifier including a node connected to said second side of said switching means and responsive to said voltage VCC from said voltage supply means when said switching means is activated, and control means connected to said switching means for selectively activating said switching means and connecting said voltage supply means VCC to said sense amplifier node for a given period of time for limiting the high going bit swing of said signal on said first bitline to a third voltage level V BH higher than said first voltage level and lower than said second high voltage level.
Claim 2
Dependent Claim
177 words
A dynamic random access memory structure comprising: means for supplying a voltage VCC, a switching means having first and second sides, said first side of said switching means connected to said voltage supply means VCC, a first bitline having a first voltage level signal thereon, said first voltage level on said first bitline periodically swinging in a first, high going direction to a second high bit swing voltage level, a sense amplifier circuit connected to said first bitline, said sense amplifier including a node connected to said second side of said switching means and responsive to said voltage VCC from said voltage supply means when said switching means is activated, and control means connected to said switching means for selectively activating said switching means and connecting said voltage supply means VCC to said sense amplifier node for a given period of time for limiting the high going bit swing of said signal on said first bitline to a third voltage level V BH higher than said first voltage level and lower than said second high voltage level.
Claim 3
Dependent Claim
101 words
A dynamic random access memory structure according to claim 1 further including a second bitline, a pair of first and second reference bitlines, and wherein said sense amplifier circuit further includes first, second, third and fourth transistors connected to said first and second bitlines, said sense amplifier mode being connected between said first and second transistors, said switching means includes a sense clock driver circuit having two switching transistors connected to said sense amplifier circuit, and said control means includes a bitline monitor circuit connected to said sense clock driver circuit and to said pair of first and second reference bitlines.
Claim 4
Dependent Claim
66 words
A dynamic random access memory structure according to claim 2 further including a wordline driver circuit connected between said voltage supply source VCC and a second voltage level source VSS, and a cell array including a capacitor connected to a voltage VEQ and a transistor device connected to said capacitor, to second bitline, to said wordline driver circuit and to said first voltage level source VCC.
Claim 5
Dependent Claim
57 words
A dynamic random access memory structure according to claim 3 wherein said bitline voltage swing is limited for said given time period determined by pulse widths of said sense clocks of said switching means and wherein said pulse widths of sense clocks of said switching means are activated by signals on said first and second reference bitlines.
Claim 6
Dependent Claim
81 words
A dynamic random access memory structure according to claim 2 wherein said second bitline having a first voltage level thereon, said first voltage level on said second bitline, periodically swinging in second, low going direction to a second low going voltage level, and wherein said control means limits the low going bit swing of said signal on said second bitline to a third voltage level V BLL lower than said first voltage level are lower than said second, low voltage level.