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US5254237A Expired / Lapsed US ⏱️ 0.0 years remaining

Plasma arc apparatus for producing diamond semiconductor devices

Assignee: Individual
•
Filing: 1992-07-02
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Granted: 1993-10-19
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Expires: 2012-07-02
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Abstract

Abstract A diamond deposition system and process for producing diamond semiconductor devices. A multiple gun plasma arc deposition system allows controlled deposition of diamond-like materials on a substrate. Deposition is controlled by controlling the time duration of pulses to a main gun, an acceptor gun and donor gun in a vacuum chamber that may contain a small amount of hydrogen. The deposition process is also enhanced with microwave temperature control and substrate dithering with a transducer.

Inventors

  • 👤 Alvin A. Snaper
  • 👤 Charles W. Benfield

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-23 22:48
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32009; H01J37/32055; C; C23; C23C; C23C14/00; C23C14/06; C23C14/0605; C23C14/0611; C23C14/22; C23C14/24; C23C14/32; C23C14/325; C23C14/54; C23C14/548; H01J37/32064; H01J37/32917; H01J37/3299; H10; H10P; H10P14/00; H10P14/20; H10P14/22; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2904; H10P14/2913; H10P14/2915; H10P14/2916; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3406; H01J2237/00; H01J2237/32; H01J2237/33; H01J2237/332

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 313 words
Apparatus for producing semiconductor devices, comprising: a vacuum chamber; one or more plasma arc guns in said vacuum chamber; loading means for loading a substrate holder into said vacuum chamber; irradiating means for irradiating a substrate on said substrate holder with at least one plasma arc beam from said one or more plasma arc guns; pulse control means for applying precisely controlled time duration pulses to said one or more plasma-arc guns, said pulse control means comprising; start means for applying a start current to said one or more plasma-arc guns to strike an arc, pulse generating means applying current to said one or more plasma-arc guns to sustain said arc, clock oscillator means, a first register for starting pulses from said clock oscillator while current to said one or more plasma-arc guns is on, gate means gating pulses from said clock oscillator to said first register, a second register storing a preset pulse count representing a preselected time period when current to said one or more plasma-arc guns is on, first comparing means comparing the preset pulse count in said second register with the pulse count gated to said first register, stop pulse generating means generating a stop pulse to stop current to said one or more plasma-arc guns; a third register for storing pulses from said clock oscillator while current to said one or more plasma-arc guns is off, a fourth register storing a preset pulse count representing a preselected time period when current to said one or more plasma-arc guns is off, second comparing means for comparing the number of pulses stored in said fourth register with the number of pulses received by said third register; restart pulse generating means for restarting current to said one or more plasma-arc guns; whereby application of current to said one or more plasma-arc guns to supply material to said substrate is precisely controlled.
Claim 2
Dependent Claim 313 words
Apparatus for producing semiconductor devices, comprising: a vacuum chamber; one or more plasma arc guns in said vacuum chamber; loading means for loading a substrate holder into said vacuum chamber; irradiating means for irradiating a substrate on said substrate holder with at least one plasma arc beam from said one or more plasma arc guns; pulse control means for applying precisely controlled time duration pulses to said one or more plasma-arc guns, said pulse control means comprising; start means for applying a start current to said one or more plasma-arc guns to strike an arc, pulse generating means applying current to said one or more plasma-arc guns to sustain said arc, clock oscillator means, a first register for starting pulses from said clock oscillator while current to said one or more plasma-arc guns is on, gate means gating pulses from said clock oscillator to said first register, a second register storing a preset pulse count representing a preselected time period when current to said one or more plasma-arc guns is on, first comparing means comparing the preset pulse count in said second register with the pulse count gated to said first register, stop pulse generating means generating a stop pulse to stop current to said one or more plasma-arc guns; a third register for storing pulses from said clock oscillator while current to said one or more plasma-arc guns is off, a fourth register storing a preset pulse count representing a preselected time period when current to said one or more plasma-arc guns is off, second comparing means for comparing the number of pulses stored in said fourth register with the number of pulses received by said third register; restart pulse generating means for restarting current to said one or more plasma-arc guns; whereby application of current to said one or more plasma-arc guns to supply material to said substrate is precisely controlled.
Claim 3
Dependent Claim 46 words
The apparatus according to claim 1 in which said plasma-arc guns comprise; a main beam plasma-arc gun, an acceptor beam plasma-arc gun and a donor beam plasma-arc gun; said pulse control means selectively and independently controlling operation of said main beam, acceptor, and donor plasma-arc guns.
Claim 4
Dependent Claim 15 words
The apparatus according to claim 1 including means for controlling the temperature of said substrate.
Claim 5
Dependent Claim 40 words
The apparatus according to claim 3 in which said temperature controlling means comprises; a microwave transmitting means; temperature sensing means sensing the temperature of said substrate; and microwave power switching means controlling the output power of said microwave transmitting means.
Claim 6
Dependent Claim 24 words
The apparatus according to claim 4 in which said temperature control means controls the temperature in the range of 750 to 800 degrees Fahrenheit.
Claim 7
Dependent Claim 24 words
The apparatus according to claim 1 including means for dithering said substrate to provide smoother distribution and even flow of material to said substrate.
Claim 8
Dependent Claim 23 words
The apparatus according to claim 6 in which said means for dithering said substrate includes means for applying both mechanical and electrical dithering.
Claim 9
Dependent Claim 42 words
The apparatus according to claim 7 in which said means for mechanically dithering said substrate comprises; a dithering transducer attached to said substrate; and means for applying dithering power to said substrate; and means for applying dithering power to said dithering transducer.
Claim 10
Dependent Claim 48 words
The apparatus according to claim 8 in which said means for applying dithering power to said dithering transducer comprise; variable frequency ultrasonic oscillator; modulating means connected to said variable frequency ultrasonic oscillator to control the dithering amplitude; and a driver amplifier receiving the output of said modulating means.
Claim 11
Dependent Claim 30 words
The apparatus according to claim 7 in which said means for applying electrical dithering comprises; means for applying an AC voltage superimposed on a target DC voltage to said substrate.

References Cited (Backward Citations)

US4645895A Cited
US4648952A Cited
US4877640A Cited
US5013578A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-10-18 1997-04-19 1997-10-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-10-18 2001-04-19 2001-10-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-10-18 2005-04-19 2005-10-19 $7700.00 Window Closed / Lapsed

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