US5252178A
Expired / Lapsed
US
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Multi-zone plasma processing method and apparatus
Assignee: Texas Instruments Inc
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Filing: 1992-06-24
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Granted: 1993-10-12
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Expires: 2012-06-24
Abstract
Abstract A multi-zone multi-electrode plasma processing method for uniform plasma processing and effective in-situ fabrication reactor process chamber (10) cleaning during a plasma deposition or etch process first comprises the steps of flowing plasma deposition or etch gases into the process chamber (10) in a chopped or continuous mode (line 214) followed by flowing plasma gases into the process chamber (10) in a chopped mode (220) or a continuous mode. By intermittently activating (224) at least one plasma electrode (24 or 52) upon initiating flow of the plasma processing gas, the method generates a process plasma medium to perform the plasma-enhanced deposition or etch process. Additionally, intermittently activating the same or a different configuration of plasma electrodes (66), during the time that the process gas flows are stepped, an in-situ cleaning plasma is produced for performing a plasma-assisted chamber cleaning process. The multi-zone plasma processing method of this invention permits flexible activation of multiple plasma electrodes in a time-division-multiplexed or continuous format using one or several radio-frequency power sources in order to control plasma density and uniformity as well as ion energies near semiconductor wafer (22), process chamber walls (38), and gas showerhead (52).
Inventors
- 👤 Mehrdad M. Moslehi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 03:49
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/3244; C; C23; C23C; C23C16/00; C23C16/44; C23C16/4401; C23C16/4405; C23C16/50; C23C16/505; C23C16/509; H01J37/32009; H01J37/32082; H01J37/3266; H01J37/32798; H01J37/32853; H01J37/32862; Y; Y10; Y10S; Y10S156/00; Y10S156/916
Claims Analysis
Total Claims: 28
Claim 1
Independent Claim
105 words
A multi-zone multi-electrode plasma processing method for uniform plasma processing and effective in-situ fabrication reactor process chamber cleaning during a plasma deposition or etch process, comprising the steps of: flowing a plasma process gas into the process chamber; activating plasma electrode during said flow of said plasma process gas flow to generate a process plasma from said plasma process gas for performing a plasma-enhanced process on a semiconductor wafer; flowing an in-situ cleaning gas into the process chamber; activating a plasma electrode during said flow of said cleaning gas to generate cleaning plasma from said cleaning gas for performing an in-situ plasma-assisted chamber cleaning process.
Claim 2
Dependent Claim
105 words
A multi-zone multi-electrode plasma processing method for uniform plasma processing and effective in-situ fabrication reactor process chamber cleaning during a plasma deposition or etch process, comprising the steps of: flowing a plasma process gas into the process chamber; activating plasma electrode during said flow of said plasma process gas flow to generate a process plasma from said plasma process gas for performing a plasma-enhanced process on a semiconductor wafer; flowing an in-situ cleaning gas into the process chamber; activating a plasma electrode during said flow of said cleaning gas to generate cleaning plasma from said cleaning gas for performing an in-situ plasma-assisted chamber cleaning process.
Claim 3
Dependent Claim
20 words
The method of claim 1, wherein said plasma process and in-situ plasma-assisted chamber cleaning steps are performed continuously and sequentially.
Claim 4
Dependent Claim
21 words
The method of claim 1, wherein said plasma process and in-situ plasma-assisted chamber cleaning steps are performed in a time-division-multiplex format.
Claim 5
Dependent Claim
44 words
The method of claim 1, further comprising the step of variably controlling said plasma electrode activation step during said plasma-enhanced process for controlling said process plasma density proximate the semiconductor wafer, said process plasma density control being flexible for adjustment of plasma process parameters.
Claim 6
Dependent Claim
50 words
The method of claim 1, further comprising the step of variably controlling said plasma electrode activation during said in-situ plasma assisted chamber cleaning process step for controlling said cleaning plasma density proximate the exposed process chamber walls, said cleaning plasma density control being flexible for cleaning of process chamber walls.
Claim 7
Dependent Claim
38 words
The method of claim 1, further comprising the step of suitable arrangement of multiple plasma electrodes for controlling process plasma density and uniformity proximate the semiconductor wafer, said control being flexible to allow optimization of plasma process parameters.
Claim 8
Dependent Claim
40 words
The method of claim 1, further comprising the step of predetermined configuration of multiple plasma electrodes for controlling cleaning plasma density and distribution proximate the process chamber walls, said control being flexible to allow in-situ cleaning of process chamber walls.
Claim 9
Dependent Claim
31 words
The method of claim 1, further comprising the step of flowing a plurality of non-plasma process gases into the process chamber to mix with said plasma gas or said cleaning gas.
Claim 10
Dependent Claim
18 words
The method of claim 1, further comprising the step of using a chuck as a first plasma electrode.
Claim 11
Dependent Claim
19 words
The method of claim 1, further comprising the step of using a gas showerhead as a second plasma electrode.
Claim 12
Dependent Claim
18 words
The method of claim 1, further comprising the step of using a peripheral screen as third plasma electrode.
Claim 13
Dependent Claim
16 words
The method of claim 11, wherein said peripheral screen third electrode in a cylindrical perforated electrode.
Claim 14
Independent Claim
129 words
A system for uniform plasma processing and in-situ fabrication reactor process chamber walls cleaning during a plasma fabrication process, comprising: a first plasma electrode for generating a deposition process plasma from a plasma process gas; a second plasma electrode for generating a cleaning process plasma from an in-situ cleaning gas; a controllable gas flow device for selectably flowing said plasma process gas and said in-situ cleaning gas into the process chamber in a chopped mode; a first circuit for activating said first plasma electrode upon initiation of said plasma process deposition gas flow to generate plasma from said plasma process gas; a second circuit for activating said second plasma electrode upon initiation of said in-situ cleaning gas flow to perform in-situ plasma-assisted chamber cleaning using said plasma cleaning gas.
Claim 15
Independent Claim
129 words
A system for uniform plasma processing and in-situ fabrication reactor process chamber walls cleaning during a plasma fabrication process, comprising: a first plasma electrode for generating a deposition process plasma from a plasma process gas; a second plasma electrode for generating a cleaning process plasma from an in-situ cleaning gas; a controllable gas flow device for selectably flowing said plasma process gas and said in-situ cleaning gas into the process chamber in a chopped mode; a first circuit for activating said first plasma electrode upon initiation of said plasma process deposition gas flow to generate plasma from said plasma process gas; a second circuit for activating said second plasma electrode upon initiation of said in-situ cleaning gas flow to perform in-situ plasma-assisted chamber cleaning using said plasma cleaning gas.
Claim 16
Dependent Claim
21 words
The system of claim 13, wherein said first circuit associates to perform continuous and sequential activation of said first plasma electrode.
Claim 17
Dependent Claim
21 words
The system of claim 13, wherein said second circuit associates to perform continuous and sequential activation of said second plasma electrode.
Claim 18
Dependent Claim
54 words
The system of claim 13, further comprising circuitry for variably controlling said first plasma electrode and, thereby, variably, controlling said process plasma density proximate the semiconductor wafer, said process plasma density control circuitry in association with said first plasma electrode providing flexible plasma density control being sufficiently flexible for adjustment of plasma process parameters.
Claim 19
Dependent Claim
67 words
The system of claim 13, further comprising circuitry for variably controlling said second plasma electrode activating circuitry during an in-situ plasma-assisted chamber cleaning process to thereby, control said in-situ cleaning plasma density proximate said reactor process chamber walls, said cleaning plasma density controlling circuitry in association with said second plasma electrode for providing in-situ cleaning plasma density control independent of variations in in-situ cleaning gas flow rate.
Claim 20
Dependent Claim
22 words
The system of claim 13, further comprising a third plasma electrode for controlling plasma process density proximate said reactor process chamber walls.
Claim 21
Dependent Claim
31 words
The system of claim 13, further comprising circuitry for intermittently activating a predetermined configuration of multiple plasma electrodes for controlling cleaning plasma density and distribution proximate said reactor process chamber walls.
Claim 22
Dependent Claim
59 words
The system of claim 19, further comprising circuitry for variably controlling said multiple plasma electrodes activating circuitry and, thereby, controlling said cleaning plasma density proximate said reactor process chamber walls, said cleaning plasma density controlling circuitry in association with said second plasma electrode for providing plasma density control independent of variations in flow rate of said in-situ cleaning gas.
Claim 23
Dependent Claim
34 words
The system of claim 13, wherein said controllable gas flow device flows a plurality of non-plasma process gases into the process chamber to mix with said plasma process gas and said in-situ cleaning gas.
Claim 24
Dependent Claim
14 words
The system of claim 13, wherein said first plasma electrode is a chuck electrode.
Claim 25
Dependent Claim
14 words
The system of claim 13, wherein said second plasma electrode is a chuck electrode.
Claim 26
Dependent Claim
15 words
The system of claim 13, wherein said first plasma electrode is a showerhead electrode assembly.
Claim 27
Dependent Claim
15 words
The system of claim 13, wherein said second plasma electrode is a showerhead electrode assembly.
Claim 28
Dependent Claim
22 words
The system of claim 25, wherein said multiple plasma electrodes comprise a peripheral third screen plasma electrode within a cylindrical perforated electrode.
References Cited (Backward Citations)
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