Semiconductor package having wraparound metallization

Claim 2

In a package for a semiconductor chip: a cavity adapted to have a chip mounted therein, a bonding shelf extending peripherally of the cavity and having an inner peripheral edge facing the cavity, and a layer of metallization which extends along the under side of the shelf, wraps around the inner peripheral edge of the shelf and extends continuously along the inner margin of the upper surface of the shelf to form a conductive ring to which leads from the chip are bonded.

Claim 3

The package of claim 1 including a plurality of bonding pads on the upper surface of the bonding shelf to which additional leads from the chip are attached.

Claim 4

The package of claim 1 including at least one additional layer of metallization within the shelf, with at least a portion of said additional layer being insulated electrically from the metallization which wraps around the inner peripheral edge of the shelf.

Claim 5

The package of claim 1 including at least one additional layer of metallization within the shelf, with at least a portion of the additional layer being connected to the metallization which wraps around the inner peripheral edge of the shelf.

Claim 6

The package of claim 1 including means for aligning the chip in a predetermined position as it is mounted in the cavity.

Claim 7

In a semiconductor package: a chip, a lower bonding shelf surrounding the chip and having an electrically conductive bonding pad on the upper surface thereof, a bonding wire extending between the chip and the bonding pad, an upper bonding shelf positioned above and generally concentric to the lower shelf and having an inner peripheral edge facing the chip, a metallization layer which extends along the under side of the upper shelf, wraps around the inner peripheral edge of the upper shelf and extends continuously along the inner margin of the upper surface of the upper shelf to form a conductive ring, a plurality of bonding pads on the upper shelf, and a plurality of bonding wires interconnecting the chip with the conductive ring and the bonding pads on the upper shelf.

Claim 8

In a semiconductor package: a chip, a lower bonding shelf surrounding the chip and having an electrically conductive bonding pad on the upper surface thereof, a bonding wire extending between the chip and the bonding pad, an upper bonding shelf positioned above and generally concentric to the lower shelf and having an inner peripheral edge facing the chip, a metallization layer which extends along the under side of the upper shelf, wraps around the inner peripheral edge of the upper shelf and extends continuously along the inner margin of the upper surface of the upper shelf to form a conductive ring, a plurality of bonding pads on the upper shelf, and a plurality of bonding wires interconnecting the chip with the conductive ring and the bonding pads on the upper shelf.

Claim 9

The semiconductor package of claim 6 including a heatsink bonded to the under side of the lower bonding shelf in heat transferring relationship with the chip.

Claim 10

The package of claim 6 including at least one additional layer of metallization within the upper shelf and insulated electrically from the metallization which wraps around the inner peripheral edge of the shelf.

Claim 11

The package of claim 6 including at least one additional layer of metallization within the upper shelf and connected electrically to the metallization which wraps around the inner peripheral edge of the shelf.

Claim 12

The package of claim 6 including means for aligning the chip in a predetermined position within the bonding shelves.

Claim 13

In a semiconductor package: a first generally planar body of dielectric material having a central opening with electrically conductive metallization on the upper and lower surfaces thereof, a heatsink positioned beneath the first body and extending across the opening to form the floor of a cavity within the opening, a semiconductor chip mounted in the cavity in heat transferring relationship with the heatsink, a bonding wire connecting the chip with the metallization on the upper surface of the first layer, a second generally planar body of dielectric material positioned above the first body and having an inner peripheral edge defining a central opening of greater lateral extent than the opening in the first body, a metallization layer which extends along the under side of the second body, wraps around the inner peripheral edge of the opening in the second body and extends continuously along the inner margin of the upper surface of the second body to form a conductive ring, a plurality of bonding pads on the upper surface of the second body spaced outwardly of the conductive ring, and a plurality of bonding wires interconnecting the chip with the conductive ring and the bonding pads on the upper surface of the second body.

Claim 14

In a semiconductor package: a first generally planar body of dielectric material having a central opening with electrically conductive metallization on the upper and lower surfaces thereof, a heatsink positioned beneath the first body and extending across the opening to form the floor of a cavity within the opening, a semiconductor chip mounted in the cavity in heat transferring relationship with the heatsink, a bonding wire connecting the chip with the metallization on the upper surface of the first layer, a second generally planar body of dielectric material positioned above the first body and having an inner peripheral edge defining a central opening of greater lateral extent than the opening in the first body, a metallization layer which extends along the under side of the second body, wraps around the inner peripheral edge of the opening in the second body and extends continuously along the inner margin of the upper surface of the second body to form a conductive ring, a plurality of bonding pads on the upper surface of the second body spaced outwardly of the conductive ring, and a plurality of bonding wires interconnecting the chip with the conductive ring and the bonding pads on the upper surface of the second body.

Claim 15

The package of claim 11 including at least one additional layer of metallization within the second body of dielectric material and insulated electrically from the metallization which wraps around the inner peripheral edge of the second body.

Claim 16

The package of claim 11 including at least one additional layer of metallization within the second body of dielectric material and connected electrically to the metallization which wraps around the inner peripheral edge of the second body.

Claim 17

The package of claim 11 wherein the body of dielectric material has a plurality of fingers which extend laterally into the central opening and locate the chip in a predetermined position in the cavity.

Claim 18

The package of claim 14 including recessed areas on the under sides of the fingers for accommodating excess adhesive from between the die and the heatsink.

Claim 19

In a semiconductor package: a first generally planar body of dielectric material having a central opening with electrically conductive metallization on the upper and lower surfaces thereof, a heatsink positioned beneath the first body and extending across the opening to form the floor of a cavity for receiving a semiconductor chip in heat transferring relationship with the heatsink, a second generally planar body of dielectric material positioned above the first body and having an inner peripheral edge defining a central opening of greater lateral extent than the opening the first body, a metallization layer which extends along the under side of the second body, wraps around the inner peripheral edge of the opening in the second body and extends continuously along the inner margin of the upper surface of the second body to form a conductive ring for connection to the chip, and a plurality of bonding pads on the upper surface of the second body spaced outwardly of the conductive ring for receiving bonding wires connected to the chip.

Claim 20

In a semiconductor package: a first generally planar body of dielectric material having a central opening with electrically conductive metallization on the upper and lower surfaces thereof, a heatsink positioned beneath the first body and extending across the opening to form the floor of a cavity for receiving a semiconductor chip in heat transferring relationship with the heatsink, a second generally planar body of dielectric material positioned above the first body and having an inner peripheral edge defining a central opening of greater lateral extent than the opening the first body, a metallization layer which extends along the under side of the second body, wraps around the inner peripheral edge of the opening in the second body and extends continuously along the inner margin of the upper surface of the second body to form a conductive ring for connection to the chip, and a plurality of bonding pads on the upper surface of the second body spaced outwardly of the conductive ring for receiving bonding wires connected to the chip.

Claim 21

The package of claim 16 including at least one additional layer of metallization within the second body of dielectric material and insulated electrically from the metallization which wraps around the inner peripheral edge of the second body.

Claim 22

The package of claim 16 including at least one additional layer of metallization within the second body of dielectric material and connected electrically to the metallization which wraps around the inner peripheral edge of the second body.

Claim 23

The package of claim 16 wherein the body of dielectric material has a plurality of fingers which extend laterally into the central opening to locate the chip in a predetermined position in the cavity.

Claim 24

The package of claim 19 including recessed areas on the under sides of the fingers for accommodating excess adhesive from between the die and the heatsink.