US5234540A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Process for etching oxide films in a sealed photochemical reactor
Assignee: Primaxx Inc
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Filing: 1992-04-30
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Granted: 1993-08-10
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Expires: 2012-04-30
Abstract
Abstract A process for etching oxide films on the semiconductor, or other substrates, in a sealed photochemical reactor. Anhydrous hydrogen fluoride (AHF) gas, or other halogen containing gases, and alcohol vapor carried by an inert gas, such as nitrogen, are passed over the oxides to be etched. The UV radiation shines through a window, which passes the UV radiation onto the oxides while the gases are flowing, and enhances and controls etching of the oxides. The UV window is impervious to the etch process gases. The etch rates are modified, providing for improved oxide etching characteristics.
Inventors
- 👤 Robert W. Grant
- 👤 Kevin Torek
- 👤 Richard E. Novak
- 👤 Jerzy Ruzyllo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 00:12
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/28; H10P50/282; H10P50/283
Claims Analysis
Total Claims: 2
Claim 1
Independent Claim
64 words
Process for etching at least one oxide film on the semiconductor or other substrates comprising the steps of: a. placing a substrate in a stand-alone chamber or chamber connected to a cluster tool; b. simultaneously or sequentially passing gaseous anhydrous hydrogen fluoride, or other halogen containing gases, and alcohol vapor through said chamber; and, c. illuminating the interior of said chamber with ultraviolet radiation.
Claim 2
Dependent Claim
64 words
Process for etching at least one oxide film on the semiconductor or other substrates comprising the steps of: a. placing a substrate in a stand-alone chamber or chamber connected to a cluster tool; b. simultaneously or sequentially passing gaseous anhydrous hydrogen fluoride, or other halogen containing gases, and alcohol vapor through said chamber; and, c. illuminating the interior of said chamber with ultraviolet radiation.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-08-09 | 1997-02-08 | 1997-08-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-08-09 | 2001-02-08 | 2001-08-10 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-08-09 | 2005-02-08 | 2005-08-10 | $7700.00 | Window Closed / Lapsed |