Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
84 words
A container device having a liquid level detector, and comprising: a container; a low temperature liquid contained in the container; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 2
Dependent Claim
84 words
A container device having a liquid level detector, and comprising: a container; a low temperature liquid contained in the container; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 3
Dependent Claim
24 words
The device according to claim 1, wherein the low temperature liquid is a liquefied gas, and the liquid container substantially defines a hermetic space.
Claim 4
Dependent Claim
25 words
The device according to claim 2, wherein the thermometer is covered by the exposed member to prevent it from directly contacting the low temperature liquid.
Claim 5
Dependent Claim
31 words
The device according to claim 2, further comprising inlet and outlet pipes for the liquefied gas and arranged in the container, wherein the outlet pipe is opened above the reference level.
Claim 6
Dependent Claim
16 words
The device according to claim 4, wherein the inlet pipe is opened above the reference level.
Claim 7
Dependent Claim
23 words
The device according to claim 5, wherein a plurality of reference levels are respectively set at a plurality of positions in the container.
Claim 8
Dependent Claim
14 words
The device according to claim 2, wherein the low temperature liquid is liquefied nitrogen.
Claim 9
Independent Claim
150 words
The apparatus for processing a substrate in a vacuum atmosphere, and comprising: a process chamber defining a process space; a mount arranged in the process space and on which the substrate is mounted; exhaust means for setting the process space in a vacuum; means for working the substrate mounted on the mount; a liquid container arranged in the process chamber and below the mount, and substantially defining a hermetic space; a low temperature liquid contained in the container and for cooling the substrate through the mount; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 10
Independent Claim
150 words
The apparatus for processing a substrate in a vacuum atmosphere, and comprising: a process chamber defining a process space; a mount arranged in the process space and on which the substrate is mounted; exhaust means for setting the process space in a vacuum; means for working the substrate mounted on the mount; a liquid container arranged in the process chamber and below the mount, and substantially defining a hermetic space; a low temperature liquid contained in the container and for cooling the substrate through the mount; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 11
Dependent Claim
50 words
The apparatus according to claim 8, further comprising: wall means arranged in the process chamber and for enclosing the liquid container, the wall means and liquid container forming a clearance space therebetween which is isolated from the process space; and exhaust means for setting the clearance space in a vacuum.
Claim 12
Dependent Claim
14 words
The apparatus according to claim 9, wherein the low temperature liquid is liquefied nitrogen.
Claim 13
Dependent Claim
25 words
The apparatus according to claim 10, wherein the thermometer is covered by the exposed member to prevent it from directly contacting the low temperature liquid.
Claim 14
Dependent Claim
33 words
The apparatus according to claim 10, further comprising inlet and outlet pipes for the liquefied gas and arranged in the container, wherein the inlet and outlet pipes are opened above the reference level.
Claim 15
Independent Claim
175 words
An apparatus for plasma-etching a substrate to be processed, and comprising: a process chamber defining a process space; a mount arranged in the process space and on which the substrate is mounted; supply means for supplying an etching gas into the process space; exhaust means for setting the process space in a vacuum and for exhausting the etching gas from the process space; plasma generating means for converting the etching gas into plasma in the process space; a liquid container arranged in the process chamber and below the mount, and substantially defining a hermetic space; a low temperature liquid contained in the container and for cooling the substrate through the mount; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 16
Independent Claim
175 words
An apparatus for plasma-etching a substrate to be processed, and comprising: a process chamber defining a process space; a mount arranged in the process space and on which the substrate is mounted; supply means for supplying an etching gas into the process space; exhaust means for setting the process space in a vacuum and for exhausting the etching gas from the process space; plasma generating means for converting the etching gas into plasma in the process space; a liquid container arranged in the process chamber and below the mount, and substantially defining a hermetic space; a low temperature liquid contained in the container and for cooling the substrate through the mount; an exposed member arranged in the container and located at a reference level; a heater for heating the exposed member; a thermometer for detecting a temperature of the exposed member; and means for deciding, on the basis of a temperature of the exposed member detected by the thermometer, whether a liquid level of the low temperature liquid is above or below the reference level.
Claim 17
Dependent Claim
50 words
The apparatus according to claim 13, further comprising: wall means arranged in the process chamber and for enclosing the liquid container, the wall means and liquid container forming a clearance space therebetween which is isolated from the process space; and exhaust means for setting the clearance space in a vacuum.
Claim 18
Dependent Claim
14 words
The apparatus according to claim 14, wherein the low temperature liquid is liquefied nitrogen.
Claim 19
Dependent Claim
25 words
The apparats according to claim 15, wherein the thermometer is covered by the exposed member to prevent it from directly contacting the low temperature liquid.
Claim 20
Dependent Claim
33 words
The apparatus according to claim 15, further comprising inlet and outlet pipes for the liquefied gas and arranged in the container, wherein the inlet and outlet pipes are opened above the reference level.
Claim 21
Dependent Claim
23 words
The apparatus according to claim 13, wherein the plasma generating means generates an electrical field and a magnetic field in the process space.