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US5227196A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming a carbon film on a substrate made of an oxide material

Assignee: Semiconductor Energy Laboratory Co Ltd
•
Filing: 1991-09-26
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Granted: 1993-07-13
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Expires: 2011-09-26
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Abstract

Abstract A lamination of films is comprised of at least two film layers wherein a first film with the smallest internal stress is provided for the first layer directly on the substrate, and a second film is provided with the second smallest amount of internal stress for the second layer on the first layer, and when more than two layers are provided, additional layers of films are provided with increasing magnitude of internal stress, in sequence, in the direction of lamination from the side of the substrate. In accordance with one aspect, the hydrogen concentration of a silicon nitride layer is controlled to obtain optimum properties of the silicon nitride layer as a buffer layer between a carbon layer and an oxide substrate.

Inventors

  • 👤 Kenji Itoh

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 23:22
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/34; C23C16/345; C23C16/26; Y; Y10; Y10S; Y10S427/00; Y10S427/103

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 46 words
A method for forming a carbon film on a substrate made of an oxide material comprising the steps of: forming a silicon nitride layer containing hydrogen at 2-28 atomic % on a surface of said substrate; and forming a carbon layer on said silicon nitride layer.
Claim 2
Independent Claim 46 words
A method for forming a carbon film on a substrate made of an oxide material comprising the steps of: forming a silicon nitride layer containing hydrogen at 2-28 atomic % on a surface of said substrate; and forming a carbon layer on said silicon nitride layer.
Claim 3
Dependent Claim 23 words
The method of claim 1 wherein said silicon nitride is formed by vapor phase deposition method utilizing SiH 4 and N 2 gases.
Claim 4
Dependent Claim 26 words
The method of claim 2 wherein the volume ratio of said SiH 4 and N 2 gases (SiH 4 /N 2 ) is 1/100 to 25/100.
Claim 5
Dependent Claim 23 words
The method of claim 1 wherein said silicon nitride is formed by vapor phase deposition method utilizing SiH 4 and NH 3 gases.
Claim 6
Dependent Claim 29 words
The method of claim 1 wherein said silicon nitride layer is formed by vapor phase deposition utilizing SiH 2 Cl 2 and either NH 3 or N 2 gases.
Claim 7
Dependent Claim 24 words
The method of claim 1 wherein said oxide material is selected from the group consisting of a magnetic material, a ceramic material and glass.
Claim 8
Dependent Claim 21 words
The method of claim 6 wherein the substrate made of said magnetic material is a magnetic disc or optical magnetic disc.
Claim 9
Dependent Claim 22 words
The method of claim 1 wherein the thickness of said silicon nitride layer is 15-25% of the thickness of said carbon layer.
Claim 10
Dependent Claim 16 words
The method of claim 1 wherein the thickness of said silicon nitride layer is 30-3000 angstroms.
Claim 11
Dependent Claim 16 words
The method of claim 1 wherein said carbon layer comprises a diamond-like carbon or crystalline carbon.

References Cited (Backward Citations)

US4132818A Cited
US4737379A Cited
US4707384A Cited
US4699801A Cited
US4755426A Cited
US4988421A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-07-12 1997-01-11 1997-07-13 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-07-12 2001-01-11 2001-07-13 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-07-12 2005-01-11 2005-07-13 $7700.00 Window Closed / Lapsed

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