Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
201 words
A charge coupled device comprising: a first layer made of a first conductivity type semiconductor; a second layer made of a second conductivity type semiconductor and provided on the first layer, said first and second conductivity types being mutually opposite types selected from n-type and p-type conductivity types; a third layer made of the first conductivity type semiconductor and provided on the second layer; impurity diffusion regions provided in spaced relationship in at least a surface part of the third layer, every two mutually adjacent, spaced impurity diffusion regions defining a corresponding portion of the third layer therebetween, the impurity diffusion regions having an impurity density higher than that of the third layer; a first gate electrode corresponding to and provided, in insulated relationship, on each portion of the third layer between two mutually adjacent, spaced impurity diffusion regions; a second gate electrode corresponding to and provided on each impurity diffusion region of the third layer; each said impurity diffusion region forming a corresponding charge storage region of the charge coupled device; and each portion of said third layer, between the two mutually adjacent and corresponding impurity diffusion regions, forming a respectively corresponding potential barrier region of the charge coupled device.
Claim 2
Dependent Claim
201 words
A charge coupled device comprising: a first layer made of a first conductivity type semiconductor; a second layer made of a second conductivity type semiconductor and provided on the first layer, said first and second conductivity types being mutually opposite types selected from n-type and p-type conductivity types; a third layer made of the first conductivity type semiconductor and provided on the second layer; impurity diffusion regions provided in spaced relationship in at least a surface part of the third layer, every two mutually adjacent, spaced impurity diffusion regions defining a corresponding portion of the third layer therebetween, the impurity diffusion regions having an impurity density higher than that of the third layer; a first gate electrode corresponding to and provided, in insulated relationship, on each portion of the third layer between two mutually adjacent, spaced impurity diffusion regions; a second gate electrode corresponding to and provided on each impurity diffusion region of the third layer; each said impurity diffusion region forming a corresponding charge storage region of the charge coupled device; and each portion of said third layer, between the two mutually adjacent and corresponding impurity diffusion regions, forming a respectively corresponding potential barrier region of the charge coupled device.
Claim 3
Dependent Claim
21 words
The charge coupled device as claimed in claim 1, wherein said impurity diffusion regions extend only partially within the third layer.
Claim 4
Dependent Claim
24 words
The charge coupled device as claimed in claim 1, wherein said impurity diffusion regions extend to an interface between the second and third layers.
Claim 5
Dependent Claim
26 words
The charge coupled device as claimed in claim 1, wherein said impurity diffusion regions penetrate through the third layer and extend partially into the second layer.
Claim 6
Dependent Claim
35 words
The charge coupled device as claimed in claim 1, wherein each said potential barrier region, between the two mutually adjacent and corresponding impurity diffusion regions, has a thickness identical to that of the third layer.
Claim 7
Dependent Claim
57 words
The charge coupled device as claimed in claim 1, wherein said first gate electrode is provided, in insulated relationship, on the corresponding portion of the third layer, and thus over the respectively corresponding potential barrier region, and covers a part of at least one of the corresponding and mutually adjacent impurity diffusion regions of the third layer.