Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
151 words
A process for producing a superconducting semiconductor device comprising: forming a first thin film of a pre-superconductor on a surface of a substrate; said first thin film including a deficiency of a component required to make it superconductive, whereby said first thin film is a non-superconductor; depositing a second thin film, said second thin film covering less than all of said first thin film, in a pattern on a surface of said first thin film; said second thin film containing a proportion of said component; and heat treating said substrate with said first and second thin films thereon at a temperature, and for a time, effective to permit transfer of a sufficient portion of said component from said second thin film to said first thin film, to change portions of said first thin film, corresponding to said pattern, into superconducting areas and leaving a remainder of said first thin film non-superconducting.
Claim 2
Dependent Claim
151 words
A process for producing a superconducting semiconductor device comprising: forming a first thin film of a pre-superconductor on a surface of a substrate; said first thin film including a deficiency of a component required to make it superconductive, whereby said first thin film is a non-superconductor; depositing a second thin film, said second thin film covering less than all of said first thin film, in a pattern on a surface of said first thin film; said second thin film containing a proportion of said component; and heat treating said substrate with said first and second thin films thereon at a temperature, and for a time, effective to permit transfer of a sufficient portion of said component from said second thin film to said first thin film, to change portions of said first thin film, corresponding to said pattern, into superconducting areas and leaving a remainder of said first thin film non-superconducting.
Claim 3
Dependent Claim
42 words
A process according to claim 1, wherein: said pattern includes first and second regions separated by a gap; and said superconducting areas include first and second superconducting areas corresponding in position to said first and second regions, with a semiconducting gap therebetween.
Claim 4
Dependent Claim
114 words
A process according to claim 2 wherein said superconducting device is a transistor, further comprising: removing from said first thin film material of said second thin film which may remain after said heat treating; depositing a source electrode partially covering said first superconducting area and extending over a fist remaining portion of said first thin film; depositing a drain electrode partially covering said second superconducting area and extending over a second remaining portion of said first thin film; depositing an insulating thin film extending over said gap, and contiguous portions of said first and second superconducting areas; and depositing a gate electrode on said insulating thin film, whereby a field effect transistor is produced.
Claim 5
Dependent Claim
207 words
A process according to claim 1 wherein said superconducting device is a transistor, further comprising: depositing a third thin film, said third thin film being an insulating film adapted to function as a tunnelling layer, over the exposed surface of said first thin film and said second thin film; depositing a fourth thin film on said thin insulating film, generally congruent with said second thin film thereby covering a portion of said thin insulating film; depositing a fifth thin film over the exposed surface of said thin insulating film and said fourth thin film; said fifth thin film being a pre-superconductor including a deficiency of a second component required to make it superconductive; said fourth thin film containing a second proportion of said second component; heat treating the assembly thus formed for a time and at a temperature effective to permit transfer of a sufficient portion of said component from said second thin film to said first thin film to make said first thin film superconductive in said pattern; and said heat treating being further effective to permit transfer of a sufficient portion of said second component from said fourth thin film to said fifth thin film to make said fifth thin film conductive in said pattern.
Claim 6
Dependent Claim
21 words
A process according to claim 1, wherein said pattern is of a configuration effective to form a superconducting field effect transistor.
Claim 7
Dependent Claim
20 words
A process according to claim 1, wherein said pattern is of a configuration effective to form a superconducting tunnelling transistor.
Claim 8
Dependent Claim
27 words
A process according to claim 1, wherein said pattern is of a configuration effective to form a SNS transistor, wherein S is superconductive and N is semiconductive.
Claim 9
Dependent Claim
200 words
A process for producing a superconducting transistor, comprising: forming a pre-superconductive first thin film on a surface of an insulating substrate; forming a second thin film in a pattern defining two separate regions on said first thin film; said two regions being separated from each other by a slight gap; said first thin film being deficient in a component required to make it superconductive; said second thin film including a proportion of said component; heat treating the assembly formed in the preceding steps for a time and at a temperature effective to permit a sufficient amount of said component from said second thin film to enter said first thin film to make first and second superconducting areas in said pattern in said first thin film and leaving said gap non-superconducting; forming an insulating film over said slight gap and over contiguous portions of said first and second superconductive areas; forming a gate electrode on said insulating film; forming a source electrode over a portion of said first superconductive area and a contiguous portion of said first thin film; and forming a drain electrode over a portion of said second superconductive area and a contiguous portion of said first thin film.
Claim 10
Dependent Claim
200 words
A process for producing a superconducting transistor, comprising: forming a pre-superconductive first thin film on a surface of an insulating substrate; forming a second thin film in a pattern defining two separate regions on said first thin film; said two regions being separated from each other by a slight gap; said first thin film being deficient in a component required to make it superconductive; said second thin film including a proportion of said component; heat treating the assembly formed in the preceding steps for a time and at a temperature effective to permit a sufficient amount of said component from said second thin film to enter said first thin film to make first and second superconducting areas in said pattern in said first thin film and leaving said gap non-superconducting; forming an insulating film over said slight gap and over contiguous portions of said first and second superconductive areas; forming a gate electrode on said insulating film; forming a source electrode over a portion of said first superconductive area and a contiguous portion of said first thin film; and forming a drain electrode over a portion of said second superconductive area and a contiguous portion of said first thin film.
Claim 11
Dependent Claim
43 words
A process according to claim 8, wherein: said first thin film is a Bi Sr Ca Cu O composition; a ratio of Bi in said first thin film being less than required to permit superconduction; and said second thin film is Bi oxide.
Claim 12
Dependent Claim
33 words
A process according to claim 9, wherein if a thickness of said first thin film is d, and a thickness of said second thin film is x, a relationship of 0.02d≦x≦0.17d is followed.
Claim 13
Dependent Claim
25 words
A process according to claim 8, wherein: said first thin film is a Sr Ca Cu composition; and said second thin film is Bi oxide.
Claim 14
Dependent Claim
33 words
A process according to claim 11, wherein if a thickness of said first thin film is d, and a thickness of said second thin film is x, a relationship of 0.3d≦x≦0.8d is followed.
Claim 15
Dependent Claim
25 words
A process according to claim 8, wherein: said first thin film is a Bi Sr Cu composition; and said second thin film is Ca fluoride.
Claim 16
Dependent Claim
32 words
A process according to claim 13, wherein if a thickness of said first film is d, and a thickness of said second thin film is x, a relationship of 0.3d≦x≦1.0d is followed.
Claim 17
Dependent Claim
269 words
A process for producing a superconducting transistor, comprising: forming a pre-superconducting first thin film on a surface of a substrate; said first thin film being deficient in a component required for said first thin film to be superconductive; forming a second thin film in a pattern on said first thin film thereby covering a portion of said first thin film; said second thin film containing a proportion of said component; forming an insulating thin film on said second thin film and the exposed surface of said first thin film; forming a third thin film on said insulating thin film thereby covering a portion of said insulating thin film; forming a pre-superconducting fourth thin film on said third thin film and the exposed surface of said insulating thin film; said fourth thin film being deficient in said component required for said fourth thin film to be superconductive; said third thin film containing a proportion of said component; heat treating the assembly formed in the preceding steps for a time and at a temperature to permit said component from said second thin film to enter said first thin film in a quantity effective to make a congruent portion of said first thin film a first superconductive region; the step of heat treating being further effective to permit said component from said third thin film to enter said fourth thin film in a quantity effective to make a congruent portion of said fourth thin film a second superconductive region; and said first thin film being a collector, said first superconductive region being a base, and said second superconductive region being an emitter.
Claim 18
Dependent Claim
269 words
A process for producing a superconducting transistor, comprising: forming a pre-superconducting first thin film on a surface of a substrate; said first thin film being deficient in a component required for said first thin film to be superconductive; forming a second thin film in a pattern on said first thin film thereby covering a portion of said first thin film; said second thin film containing a proportion of said component; forming an insulating thin film on said second thin film and the exposed surface of said first thin film; forming a third thin film on said insulating thin film thereby covering a portion of said insulating thin film; forming a pre-superconducting fourth thin film on said third thin film and the exposed surface of said insulating thin film; said fourth thin film being deficient in said component required for said fourth thin film to be superconductive; said third thin film containing a proportion of said component; heat treating the assembly formed in the preceding steps for a time and at a temperature to permit said component from said second thin film to enter said first thin film in a quantity effective to make a congruent portion of said first thin film a first superconductive region; the step of heat treating being further effective to permit said component from said third thin film to enter said fourth thin film in a quantity effective to make a congruent portion of said fourth thin film a second superconductive region; and said first thin film being a collector, said first superconductive region being a base, and said second superconductive region being an emitter.
Claim 19
Dependent Claim
46 words
A process according to claim 15, wherein: said first and fourth thin films are Bi Sr Ca Cu compositions; a proportion of Bi in said first and fourth thin films being insufficient to permit superconductivity therein; and said second and third thin film being Bi oxide.
Claim 20
Dependent Claim
37 words
A process according to claim 16, wherein, if a thickness of said first and fourth thin films is d, and a thickness of said second and third thin films is x, a relationship of 0.02d≦x≦0.17d is followed.