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US5217756A Expired / Lapsed US ⏱️ 0.0 years remaining

Selective chemical vapor deposition of aluminum, aluminum CVD materials and process for preparing the same

Assignee: NEC Corp
•
Filing: 1992-04-29
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Granted: 1993-06-08
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Expires: 2012-04-29
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Abstract

Abstract This invention provides a process for forming with high selectivity an Al film having good electrical conductivity at the uncoated portions of a substrate coated with a masking material by means of chamical vapor deposition, using an Al selective deposition material having good electrical conductivity without subjecting it preliminarily to cracking, characterized in that the process employs a molecular compound of trimethyl aluminum and dimethyl aluminum hydride as a starting material gas. This invention also provides an Al selective CVD material characterized in that it is an organic Al compound represented by the following formula: (CH.sub.3).sub.3 Al--(CH.sub.3).sub.2 AlH obtained through intermolecular binding between trimethyl aluminum and dimethyl aluminum hydride. This invention further provides a process for forming the Al selective CVD material, which comprises mixing a liquid trimethyl aluminum with a liquid dimethyl aluminum hydride in an inert gas atmosphere, followed by vacuum distillation of the mixture to give the desired compound represented by the above formula.

Inventors

  • 👤 Tsutomu Shinzawa

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 16:42
CPC Classifications
C; C07; C07F; C07F5/00; C07F5/06; C07F5/061; C07F5/065; C23; C23C; C23C16/00; C23C16/06; C23C16/18; C23C16/20

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 64 words
A process for selectively forming an aluminum film by means of chemical vapor deposition, comprising coating a substrate with a masking material such that uncoated portions remain on the substrate, and conducting chemical vapor deposition at the uncoated portions of the substrate by using a molecular compound of trimethyl aluminum and dimethyl aluminum hydride as a starting material gas to form the aluminum film.
Claim 2
Dependent Claim 64 words
A process for selectively forming an aluminum film by means of chemical vapor deposition, comprising coating a substrate with a masking material such that uncoated portions remain on the substrate, and conducting chemical vapor deposition at the uncoated portions of the substrate by using a molecular compound of trimethyl aluminum and dimethyl aluminum hydride as a starting material gas to form the aluminum film.

References Cited (Backward Citations)

GB882214A Cited
US3453093A Cited
US3445493A Cited
US4328261A Cited
US5091210A Cited
US5130459A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-06-07 1996-12-07 1997-06-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-06-07 2000-12-07 2001-06-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-06-07 2004-12-07 2005-06-08 $7700.00 Window Closed / Lapsed

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