Etching process for films of aluminum or its alloys

Claim 2

A process for etching an aluminum-based film of a composite structure including a substrate with a barrier layer and the aluminum-based film being on the barrier layer, said process comprising the steps of: (a) etching and patterning said aluminum-based film by using a plasma with a gaseous mixture until the barrier layer of said substrate is exposed, said gaseous mixture containing a hydrogen-donating gas in an amount of 10 to 99% by volume; (b) then forming a protective film at two opposite sides walls of the resulting pattern by supplying an oxidation-imparting gas to the plasma; and (c) then over-etching the barrier layer with said hydrogen-donating gas.

Claim 3

A process according to claim 1 wherein said aluminum-based film is formed from aluminum alone or an aluminum-silicon alloy.

Claim 4

A process according to claim 1 wherein said hydrogen-donating gas is selected from a group consisting of hydrogen, hydrogen halide, hydrogen sulfide and a compound of a non-metallic element with hydrogen.

Claim 5

A process according to claim 3 wherein said hydrogen-donating gas is hydrogen chloride, hydrogen bromide or hydrogen fluoride.

Claim 6

A process according to claim 1 wherein said oxidation-imparting gas is selected from a group consisting of oxygen, ozone, nitrogen monoxide and nitrogen dioxide.

Claim 7

A process according to claim 1, wherein the structure includes a refraction inhibition layer on the aluminum-based film.

Claim 8

A process according to claim 6, wherein said inhibiting layer is TiON, said barrier layer is formed by a layer of Ti and a layer of TiON, and said aluminum-based film is Al-1%Si.

Claim 9

A process for etching an aluminum-based film of a composite structure including a substrate with a barrier layer, the aluminum-based film being on the barrier layer and a refraction inhibiting layer being on the aluminum-based film, said process comprising the steps of etching and patterning the refraction inhibiting layer and the underlying aluminum base film by using a plasma with a gaseous mixture until the barrier layer of the substrate is exposed, said gaseous mixture containing a hydrogen-donating gas in the amount of 10 to 99% by volume; then forming a protective film on each of the exposed side walls of the etched aluminum-based film by supplying a gas consisting of oxidation imparting material to the plasma; and then subsequently over-etching the barrier layer with said hydrogen-donating gas.

Claim 10

A process for etching an aluminum-based film of a composite structure including a substrate with a barrier layer, the aluminum-based film being on the barrier layer and a refraction inhibiting layer being on the aluminum-based film, said process comprising the steps of etching and patterning the refraction inhibiting layer and the underlying aluminum base film by using a plasma with a gaseous mixture until the barrier layer of the substrate is exposed, said gaseous mixture containing a hydrogen-donating gas in the amount of 10 to 99% by volume; then forming a protective film on each of the exposed side walls of the etched aluminum-based film by supplying a gas consisting of oxidation imparting material to the plasma; and then subsequently over-etching the barrier layer with said hydrogen-donating gas.

Claim 11

A process according to claim 8, wherein said inhibiting layer is TiON, said barrier layer is formed by a layer of Ti and a layer of TiON and the aluminum-based film is an Al-1%Si alloy, said hydrogen-donating gases being selected from a group consisting of hydrogen, hydrogen halide, hydrogen sulfide and a compound of non-metallic elements with hydrogen, and said oxygen imparting gas being selected from a group consisting of oxygen, ozone, nitrogen monoxide and nitrogen dioxide.

Claim 12

A process according to claim 9, wherein the hydrogen halide is selected from a group consisting of hydrogen chloride, hydrogen bromide and hydrogen fluoride.