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US4511429A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for dry etching of aluminum and its alloy

Assignee: Hitachi Ltd
•
Filing: 1982-04-09
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Granted: 1985-04-16
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Expires: 2002-04-09
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Abstract

Abstract This invention relates to a fine processing of aluminum and aluminum alloy layers, and to a method for dry etching by a plasma in a gas containing hydrogen and/or a gaseous hydrogen compound and further containing a gaseous chloride. The fine processing without suffering from the side-etching is feasible even in case using an inorganic material as a mask.

Inventors

  • 👤 Tatsumi Mizutani
  • 👤 Toshihide Ohgata
  • 👤 Hideo Komatsu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 19:33
CPC Classifications
H; H10; H10P; H10P50/00; C; C23; C23F; C23F4/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 60 words
Process for dry etching of copper-containing aluminum alloys comprising adding 0.5-10 vol.% of at least one member selected from hydrogen and gaseous hydrogen compounds in a chloride gas-containing dry etching gas in a method for processing an article of said copper-containing aluminum alloys with a glow discharge plasma of said chloride gas-containing gas, and heating the article at 80°-250° C.
Claim 2
Dependent Claim 60 words
Process for dry etching of copper-containing aluminum alloys comprising adding 0.5-10 vol.% of at least one member selected from hydrogen and gaseous hydrogen compounds in a chloride gas-containing dry etching gas in a method for processing an article of said copper-containing aluminum alloys with a glow discharge plasma of said chloride gas-containing gas, and heating the article at 80°-250° C.
Claim 3
Dependent Claim 32 words
Process for dry etching of copper-containing aluminum alloys as described in claim 1 wherein said etching gas contains 1-4 vol.% of at least one member selected from hydrogen and gaseous hydrogen compounds.
Claim 4
Dependent Claim 20 words
Process for dry etching of copper-containing aluminum alloys as described in claim 1 wherein said etching gas contains hydrogen gas.
Claim 5
Dependent Claim 35 words
Process for dry etching of copper-containing aluminum alloys as described in claim 1 wherein said etching gas contains at least one gaseous hydrogen compound selected from hydrogen chloride, methane, ethylene, methyl chloride and ethyl chloride.
Claim 6
Dependent Claim 48 words
Process for dry etching of copper-containing aluminum alloys as described in one of claims 1 to 4 comprising etching by partially covering the surface of said article with a prescribed pattern mask composed of one material selected from silicon oxide, silicon nitride, polycrystalline silicon, molybdenum, tungsten and gold.
Claim 7
Dependent Claim 42 words
Process for dry etching of copper-containing aluminum alloys as described in claim 5 comprising using an alloy containing a member selected from the group consisting of: (1) 0.5-4 wt.% Cu and (2) 0.5-4 wt.% Cu and 0.8-2.3 wt.% Si as said article.
Claim 8
Dependent Claim 25 words
Process for dry etching of copper-containing aluminum alloys as described in claim 5 comprising using said aluminum alloy containing 0.5-4 wt.% Cu as said article.
Claim 9
Dependent Claim 23 words
Process for dry etching of copper-containing aluminum alloys as described in claim 1 comprising heating the surface of said article at 100°-150° C.
Claim 10
Dependent Claim 34 words
Process for dry etching of copper-containing aluminum alloys as described in claim 1 comprising using at least one member selected from the group consisting of boron trichloride and carbon tetrachloride as said chloride gas.
Claim 11
Dependent Claim 21 words
Process for dry etching of copper-containing aluminum alloys as described in claim 9 comprising using boron trichloride as said chloride gas.
Claim 12
Dependent Claim 34 words
Process for dry etching of copper-containing aluminum alloys as described in claim 7 comprising using at least one member selected from the group consisting of boron trichloride and carbon tetrachloride as said chloride gas.
Claim 13
Dependent Claim 21 words
Process for dry etching of copper-containing aluminum alloys as described in claim 11 comprising using boron trichloride as said chloride gas.

References Cited (Backward Citations)

US3994793A Cited
US4073669A Cited
JPS53124979A Cited
JPS53140240A Cited
US4267013A Cited
JPS55134173A Cited
US4380488A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1988-04-15 1988-10-15 1989-04-16 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1992-04-15 1992-10-15 1993-04-16 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1996-04-15 1996-10-15 1997-04-16 $7700.00 Window Closed / Lapsed

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