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US5205770A Expired / Lapsed US ⏱️ 0.0 years remaining

Method to form high aspect ratio supports (spacers) for field emission display using micro-saw technology

Assignee: Micron Technology Inc
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Filing: 1992-03-12
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Granted: 1993-04-27
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Expires: 2012-03-12
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Abstract

Abstract Fabrication of spacer supports for use in field emitter displays through a process which involves 1) forming a mold for the spacers in a substrate through the use of micro-saw technology, 2) filling the mold with a material that is selectively etchable with respect to the mold, 3) optionally, planarizing the excess material to the level of the mold using chemical mechanical planarization, 4) attaching the filled mold to one of the electrode plates of the field emitter display, and 5) etching away (removing) the mold, after which 6) the plate can be aligned with its complementary electrode plate, and 7) a vacuum formed.

Inventors

  • 👤 Tyler A. Lowrey
  • 👤 Trung T. Doan
  • 👤 David A. Cathey
  • 👤 J. Brett Rolfson

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 09:31
CPC Classifications
H; H01; H01J; H01J9/00; H01J9/24; H01J9/241; H01J9/242; H01J31/00; H01J31/08; H01J31/10; H01J31/12; H01J31/123; H01J2329/00; H01J2329/86; H01J2329/8625

Claims Analysis

Total Claims: 24
Claim 1
Independent Claim 96 words
A process for the formation of interelectrode support structures, said process comprising the following steps: creating a mold in a substrate, said mold being created using a drilling means; filling said mold with support forming material; attaching said filled mold to a first electode plate, said support forming material being in contact with said first electrode plate; removing said mold from said support forming material to expose the support structures; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 2
Dependent Claim 96 words
A process for the formation of interelectrode support structures, said process comprising the following steps: creating a mold in a substrate, said mold being created using a drilling means; filling said mold with support forming material; attaching said filled mold to a first electode plate, said support forming material being in contact with said first electrode plate; removing said mold from said support forming material to expose the support structures; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 3
Dependent Claim 19 words
The process according to claim 1, wherein said mold is selectively etchable with respect to said support forming material.
Claim 4
Dependent Claim 125 words
A process for the formation of interelectrode support structures, said process comprising the following steps: creating a mold in a substrate, said substrate has a first surface; said mold being created using a cutting means for cutting grooves in said substrate substantially perpendicular to said first surface; filling said mold with support forming material, said mold being selectively etchable with respect to said support forming material; attaching said mold to a first electrode plate, said support forming material being in contact with said first electrode plate; removing said mold from said support forming material to expose the support structures; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 5
Dependent Claim 125 words
A process for the formation of interelectrode support structures, said process comprising the following steps: creating a mold in a substrate, said substrate has a first surface; said mold being created using a cutting means for cutting grooves in said substrate substantially perpendicular to said first surface; filling said mold with support forming material, said mold being selectively etchable with respect to said support forming material; attaching said mold to a first electrode plate, said support forming material being in contact with said first electrode plate; removing said mold from said support forming material to expose the support structures; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 6
Dependent Claim 13 words
The process according to claim 3, wherein said substrate is a silicon wafer.
Claim 7
Dependent Claim 14 words
The process according to claim 4, wherein said support forming material is silicon nitride.
Claim 8
Dependent Claim 23 words
The process according to claim 5, wherein said first electrode plate is at least one of a cathode conductor and an anode screen.
Claim 9
Dependent Claim 21 words
The process according to claim 6, wherein said filled mold is attached to said second electrode plate by a frit seal.
Claim 10
Dependent Claim 36 words
The process according to claim 7, further comprising the step of planarizing said support forming material in said mold using chemical mechanical planarization (CMP) prior to attaching said first electrode plate to said second electrode plate.
Claim 11
Dependent Claim 31 words
The process according to claim 8, wherein both sides of said mold are planarized using chemical mechanical planarization (CMP) prior to attaching said first electrode plate to said second electrode plate.
Claim 12
Dependent Claim 17 words
The process according to claim 9, wherein the support structures are arranged in an intersecting parallel matrix.
Claim 13
Dependent Claim 79 words
A process for the formation of interelectrode support structures, said process comprising the following steps: sawing grooves in a selectively-etchable substrate with a micro-saw; depositing a support forming material into said grooves of said substrate; sealing said substrate to a first electrode plate; etching away said selectively-etchable substrate from said support forming material; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 14
Dependent Claim 79 words
A process for the formation of interelectrode support structures, said process comprising the following steps: sawing grooves in a selectively-etchable substrate with a micro-saw; depositing a support forming material into said grooves of said substrate; sealing said substrate to a first electrode plate; etching away said selectively-etchable substrate from said support forming material; attaching and sealing said first electrode plate to a second electrode plate; and creating a vacuum between said first electrode plate and said second electrode plate.
Claim 15
Dependent Claim 16 words
The process according to claim 11, wherein said grooves have a width of approximately 25 microns.
Claim 16
Dependent Claim 16 words
The process according to claim 12, wherein said grooves have a height of approximately 200 microns.
Claim 17
Dependent Claim 18 words
The process according to claim 13, wherein said selectively-etchable substrate is at least one of silicon or glass.
Claim 18
Dependent Claim 17 words
The process according to claim 14, wherein said support forming material comprises Si 3 N 4 .
Claim 19
Dependent Claim 29 words
The process according to claim 15, further comprising the step of planarizing said support forming material in said substrate prior to attaching said first electrode to said second electrode.
Claim 20
Dependent Claim 19 words
The process according to claim 16, wherein said selectively-etchable substrate is planarized to a height of approximately 200 microns.
Claim 21
Dependent Claim 13 words
The process according to claim 17, said first electrode is an anode screen.
Claim 22
Dependent Claim 20 words
The process according to claim 18, wherein said selectively-etchable substrate is etched away in a wet etch comprising hydrogen fluoride.
Claim 23
Dependent Claim 114 words
A process for the formation of interelectrode support structures, said process comprising the following steps: depositing a laminating layer on a selectively-etchable substrate; sawing grooves in said selectively-etchable substrate with a micro-saw, said grooves having a tip and an opening; injecting support forming material in said opening of said grooves; planarizing said support forming material to expose said opening of said grooves; removing said laminating layer; planarizing said substrate to remove said tip of said grooves; frit sealing said substrate to a first electrode; etching away said substrate from said support forming material; attaching and sealing said first electrode to a second electrode; creating a vacuum between said first electrode and said second electrode.
Claim 24
Dependent Claim 114 words
A process for the formation of interelectrode support structures, said process comprising the following steps: depositing a laminating layer on a selectively-etchable substrate; sawing grooves in said selectively-etchable substrate with a micro-saw, said grooves having a tip and an opening; injecting support forming material in said opening of said grooves; planarizing said support forming material to expose said opening of said grooves; removing said laminating layer; planarizing said substrate to remove said tip of said grooves; frit sealing said substrate to a first electrode; etching away said substrate from said support forming material; attaching and sealing said first electrode to a second electrode; creating a vacuum between said first electrode and said second electrode.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-04-26 1996-10-26 1997-04-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-04-26 2000-10-26 2001-04-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-04-26 2004-10-26 2005-04-27 $7700.00 Window Closed / Lapsed

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