Abstract A defect correction circuit for a solid-state imaging device, made up of a large number of charge-coupled devices, is disclosed. The correcting circuit includes a storage circuit for storing position data indicating the position of a defective pixel among a number of pixels of the solid-state imaging device, a sampling pulse generator for generating a first sampling pulse timed to the pixels of the imaging device, a second sampling pulse phase-shifted by 180° with respect to the first sampling pulse, a first sample-and-hold circuit for sample-holding an imaging output signal from the imaging device by the first sampling pulse, and a second sample-and-hold circuit for sample-holding an output signal of the first sample-and-hold circuit by the second sampling pulse. The sampling pulse generator withholds the outputting of a first sampling pulse associated with the defective pixel among the pixels of the solid-state imaging device, based on the position data read out from the storage device. The sampling pulse generator also elongates the pulse width of a second sampling pulse associated with the defective pixel as far as at least the trailing edge of a first sampling pulse succeeding the second sampling pulse. The defect correction circuit may additionally include a third sample-and-hold circuit for oversampling the imaging output signal corrected for defect by the second sample-and-hold circuit by a third sampling pulse to eliminate noise contained in the imaging output signal.
A defect correcting circuit for a solid-state imaging device comprising a storage circuit for storing position data indicating the position of a defective pixel among a number of pixels of the solid-state imaging device, a sampling pulse generator for generating a first sampling pulse timed to the pixels of the imaging device, and a second sampling pulse phase-shifted by 180° with respect to said first sampling pulse, a first sample-and-hold circuit for sample-holding an imaging output signal from the imaging device by said first sampling pulse, and a second sample-and-hold circuit for sample-holding an output signal of said first sample-and-hold circuit by said second sampling pulse, characterized in that said sampling pulse generator withholds the outputting of a first sampling pulse associated with the defective pixel among the pixels of the solid-state imaging device, based on said position data read out from said storage means, and in that said sampling pulse generator elongates the pulse width of a second sampling pulse associated with the defective pixel as far as at least the trailing edge of a first sampling pulse succeeding said second sampling pulse.
Claim 2
Dependent Claim
184 words
A defect correcting circuit for a solid-state imaging device comprising a storage circuit for storing position data indicating the position of a defective pixel among a number of pixels of the solid-state imaging device, a sampling pulse generator for generating a first sampling pulse timed to the pixels of the imaging device, and a second sampling pulse phase-shifted by 180° with respect to said first sampling pulse, a first sample-and-hold circuit for sample-holding an imaging output signal from the imaging device by said first sampling pulse, and a second sample-and-hold circuit for sample-holding an output signal of said first sample-and-hold circuit by said second sampling pulse, characterized in that said sampling pulse generator withholds the outputting of a first sampling pulse associated with the defective pixel among the pixels of the solid-state imaging device, based on said position data read out from said storage means, and in that said sampling pulse generator elongates the pulse width of a second sampling pulse associated with the defective pixel as far as at least the trailing edge of a first sampling pulse succeeding said second sampling pulse.
Claim 3
Dependent Claim
64 words
The defect correcting circuit as claimed in claim 1 characterized in that said first sample-and-hold circuit performs defect correction on an imaging output signal from the defective pixel of the imaging device by 0'th order holding interpolation, and in that said second sample-and-hold circuit performs defect correction on the imaging output signal, corrected for defect by said first sample-and-hold circuit, by a mean-value interpolation.
Claim 4
Dependent Claim
41 words
The defect correction circuit as claimed in claim 2 further comprising a third sample-and-hold circuit for oversampling an imaging output signal corrected for defect by said sample-and-hold circuit by a third sampling pulse for eliminating noise in said imaging output signal.
Claim 5
Dependent Claim
63 words
The defect correcting circuit as claimed in claim 1 characterized in that it is used with a color imaging device operating in accordance with a spatial pixel shift system in which a solid-state image sensor for green-color imaging and solid-state image sensors for blue-color and red-color imaging are arrayed with a horizontal shift by one-half the pixel pitch with respect to each other.