US5198756A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Test fixture wiring integrity verification device
Assignee: ATG ELECTRONIC Inc
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Filing: 1991-07-29
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Granted: 1993-03-30
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Expires: 2011-07-29
Abstract
Abstract A wiring test system in which test probes are to be oriented to engage contact points on a production circuit board, a wiring integrity verification plate comprising, in combination: a thin insulative base plate, multiple contact pads and leads attached to the plate; each of the leads extending between and interconnecting two of the contact pads, whereby multiple circuit sections are formed on the board, each circuit section including two pads interconnected by a lead; the two pads of each circuit section respectively located to be contacted by the probes of the wiring test system for providing an electrical continuity test via that circuit section, when those two probes are correctly located relative to contact points on production circuit board for testing the production circuit board.
Inventors
- 👤 Jack E. Jenkins
- 👤 William R. Maillet
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 04:20
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
181 words
In the method of orienting test probes in a wiring test system to engage contact points on a circuit board, the steps that include a) providing a wiring integrity verification plate means the plate means being a thin insulative base plate, and providing multiple contact pads to have upwardly domed surfaces and the pads and leads attached to the plate, b) orienting each lead to extend between and interconnect two of the contact pads, whereby multiple circuit sections are formed on the plate, each circuit section including two pads interconnected by a lead, c) and locating the two pads of each circuit section to be contacted by two probes of the wiring test system for providing an electrical continuity test via that circuit section, when those two probes are correctly located relative to contact points on a production circuit board for testing the production circuit board, d) and, for the majority of pads, providing the spacing between an interconnected pair of pads to be greater than the spacing between either pad of the pair and another nearby pad on the plate.
Claim 2
Dependent Claim
181 words
In the method of orienting test probes in a wiring test system to engage contact points on a circuit board, the steps that include a) providing a wiring integrity verification plate means the plate means being a thin insulative base plate, and providing multiple contact pads to have upwardly domed surfaces and the pads and leads attached to the plate, b) orienting each lead to extend between and interconnect two of the contact pads, whereby multiple circuit sections are formed on the plate, each circuit section including two pads interconnected by a lead, c) and locating the two pads of each circuit section to be contacted by two probes of the wiring test system for providing an electrical continuity test via that circuit section, when those two probes are correctly located relative to contact points on a production circuit board for testing the production circuit board, d) and, for the majority of pads, providing the spacing between an interconnected pair of pads to be greater than the spacing between either pad of the pair and another nearby pad on the plate.
Claim 3
Dependent Claim
60 words
The method of claim 1 including effecting interengagement of two probes with the respective contact pads of each pair, and passing electrical current through the two probes, the two pads of each pair, and said lead interconnecting the two pads, to thereby verify the positioning of the probes to be subsequently engaged with contact points of a production circuit board.
Claim 4
Dependent Claim
70 words
The method of claim 2 wherein multiple pairs of said pads and probes are employed, and wherein the wiring test system includes a continuity tester and multiple wires of specified series inter-connection configuration between the probes and the continuity tester, to establish multiple closed circuits, and including the step of passing electrical current through said closed circuits to thereby verify the integrity of said connection configuration of said multiple wires.
Claim 5
Dependent Claim
19 words
The method of claim 1 including locating said contact pads to be presented at one side of the plate.
Claim 6
Dependent Claim
15 words
The method of claim 1 including connecting only two contact pads with any one lead.
Claim 7
Dependent Claim
28 words
The method of claim 1 including locating said interconnected pads of each pair to be out of circuit interconnection correspondence to test points of the production circuit board.
Claim 8
Dependent Claim
28 words
The method of claim 1 including providing said pads to have the same substantially circular size, and providing said leads to have less width than the pad diameters.
Claim 9
Dependent Claim
46 words
The method of claim 7 including locating said pads to be outstanding from the plate at one side thereof to be domed outwardly from the side, and locating said leads to be outstanding from the plate at said side and to lesser extent than the pads.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1996-03-29 | 1996-09-28 | 1997-03-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2000-03-29 | 2000-09-28 | 2001-03-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2004-03-29 | 2004-09-28 | 2005-03-30 | $7700.00 | Window Closed / Lapsed |