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Method for etching chromium film formed on substrate

Assignee: Mitsubishi Electric Corp
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Filing: 1990-10-17
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Granted: 1993-02-02
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Expires: 2010-10-17
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Abstract

Abstract A method for etching a chromium film includes the steps of forming a resist having a phenol novolak resin as a principal chain on the chromium film formed on a substrate, and etching the chromium film using an etchant while stripping off the resist from the chromium film using an etchant containing nitric acid. A second method for etching a chromium film includes the steps of forming an aluminum film or an aluminum alloy film on the chromium film formed on a substrate, forming a resist having a predetermined pattern on the aluminum film or the aluminum alloy film, etching the aluminum film or the aluminum alloy film and the chromium film using phosphoric acid, and removing by etching the aluminum film or the aluminum alloy film using phosphoric acid containing nitric acid after removing the resist.

Inventors

  • 👤 Michinari Tsutsumi
  • 👤 Atsushi Endo
  • 👤 Toshio Yada

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-09 03:47
CPC Classifications
C; C23; C23F; C23F1/00; C23F1/10; C23F1/14; C23F1/16; C23F1/26; C23F1/02; H; H10; H10P; H10P50/00; H10P50/60; H10P50/66; H10P50/663; H10P50/667; H10P50/71

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 107 words
A method for etching a chromium film formed on a substrate, comprising the steps of: (a) providing a chromium film formed on a substrate, (b) forming a coating film having a predetermined pattern on the chromium film, to selectively expose the chromium film, and (c) etching the exposed chromium film with an etchant comprising at least 2 mol/l of nitric acid, the concentration of nitric acid in the etchant and the temperature of the etchant being sufficient to cause a decrease in the contact area of the chromium film with the coating film, whereby sidewall surfaces of a remaining pattern of the etched chromium film are tapered.
Claim 2
Independent Claim 107 words
A method for etching a chromium film formed on a substrate, comprising the steps of: (a) providing a chromium film formed on a substrate, (b) forming a coating film having a predetermined pattern on the chromium film, to selectively expose the chromium film, and (c) etching the exposed chromium film with an etchant comprising at least 2 mol/l of nitric acid, the concentration of nitric acid in the etchant and the temperature of the etchant being sufficient to cause a decrease in the contact area of the chromium film with the coating film, whereby sidewall surfaces of a remaining pattern of the etched chromium film are tapered.
Claim 3
Dependent Claim 46 words
The method according to claim 1, wherein the coating film comprises a resist and the concentation of nitric acid in the etchant and the temperature of the etchant are sufficient to strip a portion of the resist from the chromium film while etching the chromium film.
Claim 4
Dependent Claim 18 words
The method according to claim 2, wherein the resist comprises a phenol novolak resin as a principal chain.

References Cited (Backward Citations)

US4725375A Cited
US5007984A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1996-02-02 1996-08-03 1997-02-02 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2000-02-02 2000-08-03 2001-02-02 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2004-02-02 2004-08-03 2005-02-02 $7700.00 Window Closed / Lapsed

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