US5172188A
Expired / Lapsed
US
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Pattern shift measuring method
Assignee: Shin-Etsu Handotai Co Ltd
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Filing: 1991-11-26
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Granted: 1992-12-15
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Expires: 2011-11-26
Abstract
Abstract A method of measuring pattern shift of a semiconductor wafer with a high accuracy in a short period of time is disclosed, wherein a pattern composed of a groove or a ridge is formed on the semiconductor wafer, then at least one oxide film layer extending over and across the pattern is formed, subsequently, after an epitaxial growing process is performed to form an epitaxial layer over the semiconductor wafer, the lateral position of the pattern is measured both on the epitaxial layer and on the oxide film layer, and after that the position of the pattern measured at the epitaxial layer is compared with the lateral position of the pattern measured at the oxide film layer, thereby determining a displacement of the pattern.
Inventors
- 👤 Takatoshi Nagoya
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 12:38
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/20; H10P74/203
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
110 words
A method of measuring pattern shift of a semiconductor wafer, comprising the steps of: forming a pattern composed of a groove or a ridge on the semiconductor wafer; forming at least one strip of oxide film layer extending over and across said pattern; thereafter, performing an epitaxial growing process to form an epitaxial layer over said semiconductor wafer; measuring the lateral position of said pattern both on said epitaxial layer and on said oxide film layer; and comparing the lateral position of said pattern measured on said epitaxial layer with the position of said pattern measured on said oxide film layer so as to determine a displacement of said pattern.
Claim 2
Independent Claim
110 words
A method of measuring pattern shift of a semiconductor wafer, comprising the steps of: forming a pattern composed of a groove or a ridge on the semiconductor wafer; forming at least one strip of oxide film layer extending over and across said pattern; thereafter, performing an epitaxial growing process to form an epitaxial layer over said semiconductor wafer; measuring the lateral position of said pattern both on said epitaxial layer and on said oxide film layer; and comparing the lateral position of said pattern measured on said epitaxial layer with the position of said pattern measured on said oxide film layer so as to determine a displacement of said pattern.
Claim 3
Dependent Claim
56 words
A method according to claim 1, wherein pattern shift PS of said pattern is determined according to the following equation: PS={(L+R)/2}/T where L is the displacement of said pattern measured at one edge thereof, R is the displacement of said pattern measured at an opposite edge thereof, and T is the thickness of said epitaxial layer.
Claim 4
Dependent Claim
24 words
A method according to claim 1, wherein said pattern and said at least one oxide film layer cross at right angles to one another.
Claim 5
Dependent Claim
31 words
A method according to claim 3, wherein the number of said oxide film layer is plural, said pattern and plurality of said oxide film layer strips jointly forming a lattice-like pattern.
Claim 6
Dependent Claim
25 words
A method according to claim 1, wherein said oxide film layer has a width in the range of from about 50 to about 200 μm.
References Cited (Backward Citations)
JPS6329943A
Cited
JPH01137348A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-12-15 | 1996-06-15 | 1996-12-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-12-15 | 2000-06-15 | 2000-12-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-12-15 | 2004-06-15 | 2004-12-15 | $7700.00 | Window Closed / Lapsed |