Reaction barrier for a multilayer structure in an integrated circuit

Claim 2

An integrated circuit structure including: a substrate doped with a first dopant, a metallic silicide layer located over said doped substrate, said metallic silicide layer including an interface region located adjacent to said doped substrate and formed within said metallic silicide layer, and a reaction barrier located within said interface region, said barrier having been formed by said interface region having been implanted with at least one ionic species effective to form said reaction barrier between the substrate and said metallic silicide layer substantially at said interface region, said reaction barrier being effective to impede migration of said first dopant through said reaction barrier.

Claim 3

The integrated circuit structure of claim 1 wherein said at least one ionic species comprises two ionic species.

Claim 4

The integrated circuit structure of claim 1 wherein said at least one ionic species is selected from the group consisting of boron ions and nitrogen ions.

Claim 5

The integrated circuit structure of claim 1 wherein said first dopant is selected from the group consisting of boron, phosphorus and arsenic.

Claim 6

The integrated circuit structure of claim 1 wherein said metallic silicide layer comprises tungsten silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron ions and nitrogen ions.

Claim 7

The integrated circuit structure of claim 1 wherein said metallic silicide layer comprises tantalum silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron ions and nitrogen ions.

Claim 8

The integrated circuit structure of claim 1 wherein said metallic silicide layer comprises cobalt silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 9

The integrated circuit structure of claim 1 wherein said metallic silicide layer comprises nickel silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 10

The integrated circuit structure of claim 1 wherein said metallic silicide layer comprises molybdenum silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 11

An integrated circuit structure including: a semiconductor substrate doped with a first dopant, a metallic silicide layer located over said substrate, said metallic silicide layer including a first interface region adjacent to said doped substrate, a reaction barrier located substantially within said first interface region, said first reaction barrier having been formed by implanting said first interface region with at least one ionic species, said first reaction barrier being effective to impede migration of said first dopant through said first interface region, and a metal layer located over said metallic silicide layer, said metal layer being adjacent to a second interface region within said metallic silicide layer, a second reaction barrier located substantially within said second interface region, said second reaction barrier having been formed by implanting said second interface region with at least one ionic species, so that reactions between constituents of said metallic silicide layer and constituents of said metal layer are impeded.

Claim 12

An integrated circuit structure including: a semiconductor substrate doped with a first dopant, a metallic silicide layer located over said substrate, said metallic silicide layer including a first interface region adjacent to said doped substrate, a reaction barrier located substantially within said first interface region, said first reaction barrier having been formed by implanting said first interface region with at least one ionic species, said first reaction barrier being effective to impede migration of said first dopant through said first interface region, and a metal layer located over said metallic silicide layer, said metal layer being adjacent to a second interface region within said metallic silicide layer, a second reaction barrier located substantially within said second interface region, said second reaction barrier having been formed by implanting said second interface region with at least one ionic species, so that reactions between constituents of said metallic silicide layer and constituents of said metal layer are impeded.

Claim 13

The integrated circuit structure of claim 10 wherein said at least one ionic species is selected from the group comprising boron ions and nitrogen ions.

Claim 14

The integrated circuit structure of claim 10 wherein said metal layer comprises aluminum and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 15

The integrated circuit structure of claim 10 wherein said metallic silicide is titanium silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 16

The integrated circuit structure of claim 10 wherein said metallic silicide comprises tungsten silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 17

The integrated circuit structure of claim 10 wherein said metallic silicide comprises molybdenum silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 18

The integrated circuit structure of claim 10 wherein said metallic silicide comprises tantalum silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 19

The integrated circuit structure of claim 10 wherein said metallic silicide comprises cobalt silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 20

The integrated circuit structure of claim 10 wherein said metallic silicide comprises nickel silicide and said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 21

The integrated circuit structure of claim 10 wherein said second interface region is implanted with at least one ionic species prior to deposition of said metal layer.

Claim 22

The integrated circuit structure of claim 19 wherein said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 23

The integrated circuit structure of claim 10 wherein said second interface region is implanted with at least one ionic species after deposition of said metal layer.

Claim 24

The integrated circuit structure of claim 21 wherein said at least one ionic species is selected from the group comprising boron ions, nitrogen ions, or boron and nitrogen ions.

Claim 25

The integrated circuit structure of claim 1 wherein said reaction barrier includes the metallic ions of said metallic silicide, silicon ions, and said at least one other ionic species.

Claim 26

The structure of claim 1 wherein said reaction barrier comprises a compound of said metal of said metallic silicide, silicon, and said at least one other ionic species.

Claim 27

The structure of claim 1 wherein said reaction barrier comprises a compound of the metal of said metallic silicide, silicon and at least one of the group comprising boron and nitrogen.

Claim 28

An integrated circuit structure including: a substrate doped with a p-type dopant, a titanium silicide layer located over said doped substrate, said titanium silicide layer including an interface region located adjacent to said doped substrate and formed within said titanium silicide layer, and a reaction barrier comprising a compound of titanium, silicon, boron and nitrogen located within said interface region of said titanium silicide layer, so that said p-type dopant is impeded from migration through said reaction barrier.

Claim 29

An integrated circuit structure including: a substrate doped with a p-type dopant, a titanium silicide layer located over said doped substrate, said titanium silicide layer including an interface region located adjacent to said doped substrate and formed within said titanium silicide layer, and a reaction barrier comprising a compound of titanium, silicon, boron and nitrogen located within said interface region of said titanium silicide layer, so that said p-type dopant is impeded from migration through said reaction barrier.

Claim 30

The structure of claim 26 wherein said reaction barrier comprises a compound that has been formed by implantation of ion species of boron an nitrogen into said titanium silicide layer.

Claim 31

The structure of claim 1 wherein said metallic silicide interface region lies directly upon said doped substrate.