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Patent US5166537A successfully refreshed from Google Patents.
US5166537A
Expired / Lapsed
US
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Particle analyzing method and device for realizing same
Assignee: Hitachi Ltd
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Filing: 1990-12-17
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Granted: 1992-11-24
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Expires: 2010-12-17
Abstract
Abstract According to the present invention, the accuracy of particle size histograms produced from data relating to an impedance variation (Coutler Counter Method) caused by particles passing between electrodes disposed on either side of an orifice through which the particles pass is improved by excluding false data from the data used in producing the histograms, the false data resulting from more than one particle being resident in the orifice at a given data collection time. The preferred embodiment employs a light detecting method and apparatus to detect false readings and to provide correction information used to correct data obtained by the Coulter Counter Method and apparatus.
Inventors
- 👤 Hideyuki Horiuchi
- 👤 Hiroshi Ohki
- 👤 Toshio Kaneko
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 06:20
CPC Classifications
G; G01; G01N; G01N15/00; G01N15/10; G01N15/1031; G01N15/12; G01N15/131; G01N15/132; G01N15/01; G01N2015/012; G01N2015/1024; G01N2015/1029
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
206 words
A particle analyzing method comprising: providing an orifice having an inlet side and an outlet side; providing a pair of electrodes between which an impedance can be measured, one of said electrodes adjacent to said inlet side and the other of said electrodes adjacent to said outlet side of said orifice; providing optical means associated with said orifice including a light source and a light detector capable of sensing variations in the light from said light source passing near said orifice to said detector; passing particles in solution through said orifice; detecting impedance variations between said electrodes cause by the passage of said particles through said orifice; measuring light variations caused by the passage of said particles between said light source and said light detector; determining whether substantially one particle or a plurality of particles is present in said orifice during said detecting by using information obtained during said measuring; and forming a first particle volume histogram using data obtained from said detecting step, said data modified by information obtained from said measuring and said determining so that said histogram is produced by data obtained from said detecting but excluding data collected during said detecting when more than one particle was present in the said orifice.
Claim 2
Dependent Claim
206 words
A particle analyzing method comprising: providing an orifice having an inlet side and an outlet side; providing a pair of electrodes between which an impedance can be measured, one of said electrodes adjacent to said inlet side and the other of said electrodes adjacent to said outlet side of said orifice; providing optical means associated with said orifice including a light source and a light detector capable of sensing variations in the light from said light source passing near said orifice to said detector; passing particles in solution through said orifice; detecting impedance variations between said electrodes cause by the passage of said particles through said orifice; measuring light variations caused by the passage of said particles between said light source and said light detector; determining whether substantially one particle or a plurality of particles is present in said orifice during said detecting by using information obtained during said measuring; and forming a first particle volume histogram using data obtained from said detecting step, said data modified by information obtained from said measuring and said determining so that said histogram is produced by data obtained from said detecting but excluding data collected during said detecting when more than one particle was present in the said orifice.
Claim 3
Dependent Claim
87 words
The particle analyzing method according to claim 1, wherein said measuring step further comprises counting the total number of particles passing through said orifice (N sca ); wherein said determining includes the step of providing the number of particles passing through said orifice individually (N 1 ); and wherein said step of forming a particle volume histogram includes the step of calculating a correction factor K where K=N sca /N 1 , said histogram formed by correcting the result of said detecting step using correction factor K.
Claim 4
Dependent Claim
47 words
The particle analyzing method according to claim 1, further comprising the step of forming a second particle volume histogram using only the result of said light measuring step; and classifying and identifying said particle by comparing said first particle volume histogram and said second particle volume histogram.
Claim 5
Dependent Claim
26 words
A particle analyzing method according to claim 1, wherein said particles to be analyzed are blood components comprising red blood cells, white blood cells, and platelets.
Claim 6
Dependent Claim
35 words
A particle analyzing method according to claim 1, wherein said light measuring step is conducted using light focused on said orifice, the flow of said particles acting to disturb said light to provide an output.
Claim 7
Dependent Claim
59 words
The particle analyzing method according to claim 1, wherein the cross-section of said orifice in the direction perpendicular to the passage of said particles in solution is substantially circular; and said light focused on said particles in solution is focused near said inlet or said outlet of said orifice but not in said orifice during said light measuring step.
Claim 8
Dependent Claim
16 words
The particle analyzing method according to claim 1, wherein said light measuring step employs laser light.
Claim 9
Dependent Claim
38 words
The particle analyzing method according to claim 1, wherein said step of light measuring is conducted using a light detector capable of detecting forward scattered light, sideward scattered light, backward scattered light, fluorescent scattered light, or absorbed light.
Claim 10
Dependent Claim
197 words
A particle analyzing device comprising: an orifice having an inlet side and an outlet side through which particles in solution can flow; a pair of electrodes between which an impedance can be measured, one of said electrodes adjacent to said inlet side, the other of said electrodes adjacent to said outlet side of said orifice, passage of said particles between said electrodes providing an impedance variation depending on the size and volume of the particle; optical means associated with said orifice including a light source and a light detector capable of sensing variations in the light disturbed by said particle flow, said variations caused by the presence of particles in said flow, said optical means capable of determining whether substantially one particle or a plurality of particles is present in said orifice during the time in which said electrodes sense the size and volume of said particles; and means for forming a particle volume histogram by using information provided by said impedance measuring electrode, said information modified by data collected from said optical means so that the information used for forming said particle volume histogram includes information obtained by the passage of single particles through said orifice.
Claim 11
Dependent Claim
197 words
A particle analyzing device comprising: an orifice having an inlet side and an outlet side through which particles in solution can flow; a pair of electrodes between which an impedance can be measured, one of said electrodes adjacent to said inlet side, the other of said electrodes adjacent to said outlet side of said orifice, passage of said particles between said electrodes providing an impedance variation depending on the size and volume of the particle; optical means associated with said orifice including a light source and a light detector capable of sensing variations in the light disturbed by said particle flow, said variations caused by the presence of particles in said flow, said optical means capable of determining whether substantially one particle or a plurality of particles is present in said orifice during the time in which said electrodes sense the size and volume of said particles; and means for forming a particle volume histogram by using information provided by said impedance measuring electrode, said information modified by data collected from said optical means so that the information used for forming said particle volume histogram includes information obtained by the passage of single particles through said orifice.
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1995-11-24 | 1996-05-25 | 1996-11-24 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-11-24 | 2000-05-25 | 2000-11-24 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-11-24 | 2004-05-25 | 2004-11-24 | $7700.00 | Window Closed / Lapsed |