US5162254A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor device having a SOI substrate and fabrication method thereof
Assignee: Fujitsu Ltd
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Filing: 1990-10-31
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Granted: 1992-11-10
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Expires: 2010-10-31
Abstract
Abstract A method for producing a semiconductor device on a semiconductor layer provided on an insulator layer comprises the steps of providing an opening on the semiconductor layer to expose a top surface of the insulator layer, depositing a first material layer that has a hardness exceeding the hardness of the semiconductor layer on the semiconductor layer including the exposed top surface, and patterning the first material layer such that a patterned region of the first inorganic material is left in the opening with a gap separating the patterned region from the side wall of the semiconductor layer. The method also comprises the steps of depositing a second material layer of a second inorganic material having a hardness substantially equal to the hardness of the semiconductor layer such that the second material layer covers the semiconductor layer including the opening wherein the patterned region of the first inorganic material is formed, said second material layer being deposited such that the second material layer covers the side wall of the opening and fills the gap between the side wall of the patterned region and the side wall of the opening, and lapping a top surface of the semiconductor layer that is covered by the second material layer, starting from a top surface of the second material layer and proceeding toward the insulator layer until a top surface of the patterned region of the first inorganic material is exposed.
Inventors
- 👤 Shouji Usui
- 👤 Taketoshi Inagaki
- 👤 Kiyomasa Kamei
- 👤 Takeshi Matsutani
- 👤 Kazunori Imaoka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 21:53
CPC Classifications
H; H10; H10D; H10D86/00; H10D86/201; H10D30/00; H10D30/60; H10D30/67; H10D30/674; H10D30/6741; H10D30/6743; H10D30/6744; H10D86/01; H10P; H10P52/00; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10P90/1914; H10W10/011; H10W10/012; H10W10/13; Y; Y10; Y10S; Y10S148/00; Y10S148/135
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
261 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer; depositing a first material layer of a first inorganic material that has a hardness exceeding a hardness of the semiconductor layer on the semiconductor layer including the exposed top surface of the insulator layer; patterning the first material layer such that a patterned region of the first inorganic material is left in the opening, said patterned region being defined by a side wall such that the side wall of the region is separated from the side wall of the semiconductor layer by a gap; depositing a second material layer of a second inorganic material having a hardness substantially equal to the hardness of the semiconductor layer such that the second material layer covers the semiconductor layer including the opening wherein the patterned region of the first inorganic material is formed, said second material layer being deposited such that the second material layer covers the side wall of the opening and fills the gap between the side wall of the patterned region and the side wall of the opening; and lapping a top surface of the semiconductor layer that is covered by the second material layer, starting from a top surface of the second material layer and proceeding toward the insulator layer until a top surface of the patterned region of the first inorganic material is exposed.
Claim 2
Independent Claim
261 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer; depositing a first material layer of a first inorganic material that has a hardness exceeding a hardness of the semiconductor layer on the semiconductor layer including the exposed top surface of the insulator layer; patterning the first material layer such that a patterned region of the first inorganic material is left in the opening, said patterned region being defined by a side wall such that the side wall of the region is separated from the side wall of the semiconductor layer by a gap; depositing a second material layer of a second inorganic material having a hardness substantially equal to the hardness of the semiconductor layer such that the second material layer covers the semiconductor layer including the opening wherein the patterned region of the first inorganic material is formed, said second material layer being deposited such that the second material layer covers the side wall of the opening and fills the gap between the side wall of the patterned region and the side wall of the opening; and lapping a top surface of the semiconductor layer that is covered by the second material layer, starting from a top surface of the second material layer and proceeding toward the insulator layer until a top surface of the patterned region of the first inorganic material is exposed.
Claim 3
Dependent Claim
31 words
A method as claimed in claim 1, wherein said step of depositing the first material layer comprises a chemical vapor deposition process for depositing silicon oxide as the first inorganic material.
Claim 4
Dependent Claim
30 words
A method as claimed in claim 1, wherein said step of depositing the second material layer comprises a chemical vapor deposition process for depositing polysilicon as the second inorganic material.
Claim 5
Dependent Claim
58 words
A method as claimed in claim 1, wherein said second inorganic material comprises an inorganic material which causes substantially no contamination of the semiconductor layer that is material to characteristics of the semiconductor device when the second material layer is subjected to the lapping and debris from the second material layer are formed in response to the lapping.
Claim 6
Independent Claim
340 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer at a bottom part of the opening; depositing a first material layer of a first inorganic material that has a hardness substantially identical with a hardness of the semiconductor layer, said first material layer being deposited so as to cover at least the exposed top surface of the insulator layer and the side wall of the opening; depositing a second material layer of a second inorganic material that has a hardness exceeding the hardness of the semiconductor layer such that the second material layer at least covers a bottom part of the first material layer that covers the exposed top surface of the insulator layer; patterning the second material layer such that a patterned region of the second inorganic material defined by a side wall is left on the bottom part of the first material layer such that the side wall of the patterned region is separated from a part of the first material layer that covers the side wall of the opening by a gap; depositing a third material layer of a third inorganic material having a hardness that is substantially identical with the hardness of the semiconductor layer, such that the third material layer at least buries the patterned region of the second inorganic material and such that the third material layer covers a part of the first material that covers the side wall of the opening, said step of depositing the third material layer being made such that the gap is filled by the third material layer; and lapping a top surface of the semiconductor layer on which the first and third material layers are deposited, starting from a top surface of the third material layer and proceeding toward the insulator layer until a top surface of the patterned region is exposed.
Claim 7
Independent Claim
340 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer at a bottom part of the opening; depositing a first material layer of a first inorganic material that has a hardness substantially identical with a hardness of the semiconductor layer, said first material layer being deposited so as to cover at least the exposed top surface of the insulator layer and the side wall of the opening; depositing a second material layer of a second inorganic material that has a hardness exceeding the hardness of the semiconductor layer such that the second material layer at least covers a bottom part of the first material layer that covers the exposed top surface of the insulator layer; patterning the second material layer such that a patterned region of the second inorganic material defined by a side wall is left on the bottom part of the first material layer such that the side wall of the patterned region is separated from a part of the first material layer that covers the side wall of the opening by a gap; depositing a third material layer of a third inorganic material having a hardness that is substantially identical with the hardness of the semiconductor layer, such that the third material layer at least buries the patterned region of the second inorganic material and such that the third material layer covers a part of the first material that covers the side wall of the opening, said step of depositing the third material layer being made such that the gap is filled by the third material layer; and lapping a top surface of the semiconductor layer on which the first and third material layers are deposited, starting from a top surface of the third material layer and proceeding toward the insulator layer until a top surface of the patterned region is exposed.
Claim 8
Dependent Claim
28 words
A method as claimed in claim 5, wherein each of said steps of depositing the first and second material layers comprises a chemical vapor deposition process of polysilicon.
Claim 9
Dependent Claim
25 words
A method as claimed in claim 5, wherein said step of depositing the second material layer comprises a chemical vapor deposition process of silicon oxide.
Claim 10
Dependent Claim
41 words
A method as claimed in claim 5, wherein each of said first through third inorganic materials comprises a material, and wherein debris from the material causes no contamination of the semiconductor layer that is material to characteristics of the semiconductor device.
Claim 11
Independent Claim
313 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer; depositing a first material layer of a first inorganic material that has a hardness substantially identical with a hardness of the semiconductor layer, said first material layer being deposited to cover a top surface of the semiconductor layer including the exposed top surface of the insulator layer and the side wall of the opening; depositing a masking layer of a material that resists oxidation upon heat treatment in an oxidizing atmosphere such that the masking layer covers the first material layer at least in correspondence to a part of the first material layer that covers the exposed top surface of the insulator layer; patterning the masking layer such that a part of the top surface of the insulator layer that is covered by the first material layer at a bottom of the opening is exposed; oxidizing the exposed part of the insulator layer exposed by the patterned masking layer at the bottom of the opening, to form an oxide region in correspondence to the exposed part; removing the masking layer; depositing a second material layer of a second inorganic material having a hardness that is substantially identical with the hardness of the semiconductor layer, such that the second material layer at least covers the opening continuously including the oxide region at the bottom of the opening and the side wall of the opening; and lapping a top surface of the semiconductor layer on which the first and second material layers are deposited, starting from a top surface of the second material layer and proceeding toward the insulator layer until a top surface of the oxide region is exposed.
Claim 12
Independent Claim
313 words
A method for producing a semiconductor device on a semiconductor layer provided on a top surface of an insulator layer, comprising the steps of: providing an opening defined by a side wall on the semiconductor layer to expose a top surface of the insulator layer; depositing a first material layer of a first inorganic material that has a hardness substantially identical with a hardness of the semiconductor layer, said first material layer being deposited to cover a top surface of the semiconductor layer including the exposed top surface of the insulator layer and the side wall of the opening; depositing a masking layer of a material that resists oxidation upon heat treatment in an oxidizing atmosphere such that the masking layer covers the first material layer at least in correspondence to a part of the first material layer that covers the exposed top surface of the insulator layer; patterning the masking layer such that a part of the top surface of the insulator layer that is covered by the first material layer at a bottom of the opening is exposed; oxidizing the exposed part of the insulator layer exposed by the patterned masking layer at the bottom of the opening, to form an oxide region in correspondence to the exposed part; removing the masking layer; depositing a second material layer of a second inorganic material having a hardness that is substantially identical with the hardness of the semiconductor layer, such that the second material layer at least covers the opening continuously including the oxide region at the bottom of the opening and the side wall of the opening; and lapping a top surface of the semiconductor layer on which the first and second material layers are deposited, starting from a top surface of the second material layer and proceeding toward the insulator layer until a top surface of the oxide region is exposed.
Claim 13
Dependent Claim
24 words
A method as claimed in claim 9, wherein said step of depositing the masking layer comprises a chemical vapor deposition process of silicon nitride.
Claim 14
Dependent Claim
25 words
A method as claimed in claim 9, wherein said step of removing the masking layer comprises an etching process which uses a wet etching process.
Claim 15
Independent Claim
150 words
A method for producing a semiconductor layer provided on a top surface of an insulator layer, the semiconductor layer having a first surface, comprising the steps of: forming a second surface which is comparatively lower than the first surface; forming a region of a first material layer over the second surface, said first material layer being of a first inorganic material which has a hardness exceeding a hardness of the semiconductor layer; filling a gap between a side wall of the region and a side wall between the first and second surfaces with a second material layer of a second inorganic material having a hardness less than the hardness of the first material layer; and lapping the first surface of the semiconductor layer until said lapping is impeded by the region so that the first surface of the semiconductor layer is substantially flush with a top surface of the region.
Claim 16
Independent Claim
150 words
A method for producing a semiconductor layer provided on a top surface of an insulator layer, the semiconductor layer having a first surface, comprising the steps of: forming a second surface which is comparatively lower than the first surface; forming a region of a first material layer over the second surface, said first material layer being of a first inorganic material which has a hardness exceeding a hardness of the semiconductor layer; filling a gap between a side wall of the region and a side wall between the first and second surfaces with a second material layer of a second inorganic material having a hardness less than the hardness of the first material layer; and lapping the first surface of the semiconductor layer until said lapping is impeded by the region so that the first surface of the semiconductor layer is substantially flush with a top surface of the region.
Claim 17
Dependent Claim
59 words
A method as claimed in claim 12, wherein the second material layer includes a first filling layer and a second filling layer, and wherein said step of filling the gap includes the sub-steps of: filling a first portion of the gap with the first filling layer, and filling a second portion of the gap with the second filling layer.
References Cited (Backward Citations)
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| 3.5 Years (Year 4) | 1995-11-10 | 1996-05-11 | 1996-11-10 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-11-10 | 2000-05-11 | 2000-11-10 | $3760.00 | Window Closed / Lapsed |
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