Patent US5147740A successfully refreshed from Google Patents.
US5147740A
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US
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Structure and process for fabricating conductive patterns having sub-half micron dimensions
Assignee: Conexant Systems LLC
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Filing: 1990-08-09
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Granted: 1992-09-15
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Expires: 2010-08-09
Abstract
Abstract A mask and lithographic process is disclosed for the formation of conductive patterns on substrates, particularly in connection with the formation of high electron mobility transistors (HEMT) and metal-semiconductor field effect transistors (MESFET). The technique allows the formation of sub-half micron conductive patterns on semiconductor substrates using optical lithography and a multilayer portable conformable mask. The method includes the application of optical contact lithography to a conventional photoresist followed by a deep UV flood exposure of an underlying multilayer PMGI portion. Metal is deposited on a semiconductor substrate through the mask formed by the photoresist and PMGI layers to produce sub-half micron conductive patterns.
Inventors
- 👤 Gerald D. Robinson
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 17:40
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/061; H10D30/0612; G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/094; H10D30/015; H10D64/00; H10D64/01; H10D64/012; H10D64/0124; H10D64/0125; H10P; H10P76/00; H10P76/20; H10P76/202
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
151 words
A method of masking a semiconductor substrate comprising: selecting a semiconductor substrate; depositing a first portion over said semiconductor substrate, said first portion being formed by depositing a plurality of successive layers over one another with each of said layers having a successively increasing concentration of the deposited material; depositing a second portion over said first portion; exposing said second portion to radiation to define a pattern in said second portion; developing said second portion to define openings through said second portion corrresponding to said pattern; exposing said first portion to radiation through said openings to define a tapered pattern of exposure of sub-half-micron dimensions adjacent said substrate; and developing said first portion to form openings tapering from the dimensions of the openings in said second portion to sub-half-micron openings at the interface between said first portion and said substrate in a pattern corresponding to the openings in said second portion.
Claim 2
Independent Claim
151 words
A method of masking a semiconductor substrate comprising: selecting a semiconductor substrate; depositing a first portion over said semiconductor substrate, said first portion being formed by depositing a plurality of successive layers over one another with each of said layers having a successively increasing concentration of the deposited material; depositing a second portion over said first portion; exposing said second portion to radiation to define a pattern in said second portion; developing said second portion to define openings through said second portion corrresponding to said pattern; exposing said first portion to radiation through said openings to define a tapered pattern of exposure of sub-half-micron dimensions adjacent said substrate; and developing said first portion to form openings tapering from the dimensions of the openings in said second portion to sub-half-micron openings at the interface between said first portion and said substrate in a pattern corresponding to the openings in said second portion.
Claim 3
Dependent Claim
37 words
The method of claim 1 wherein said step of depositing said first portion includes depositing a plurality of layers of PMGI of different concentrations and wherein said step of depositing a second portion comprises depositing a photoresist.
Claim 4
Dependent Claim
83 words
The method of claim 2 wherein said semiconductor material is gallium arsenide and said plurality of layers in said PMGI comprise a first layer deposited using a concentration of three parts of PMGI to one part solvent, a second layer deposited on said first layer, having a concentration of four parts PMGI to one part solvent and a third layer deposited on said second layer, having a concentration of five parts PMGI to one part solvent; and said photoresist, comprising a positive photoresist.
Claim 5
Dependent Claim
50 words
The method of claim 3 wherein said step of exposing said second portion comprises exposing said second portion to a UV radiation in the range of 320 nm, and said step of exposing said first portion comprises exposing said first portion with UV radiation having a wavelength of 245 nm.
Claim 6
Dependent Claim
44 words
The method of claim 4 wherein said openings in said second portion are formed in the range of one micron and wherein the UV and developing of said first portion openings create tapered openings from one micron tapering to 0.25 microns adjacent said substrate.
Claim 7
Independent Claim
173 words
A method of masking a semiconductor substrate comprising: selecting a semiconductor substrate; depositing a first portion over said semiconductor substrate, said first portion being formed by depositing a plurality of successive layers over one another with each of said layers having a successively increasing concentration of the deposited material; depositing a second portion over said first portion; exposing said second portion to radiation to define a pattern in said second portion; developing said second portion to define openings through said second portion corresponding to said pattern; exposing said first level portion to radiation through said openings to define a tapered pattern of exposure of sub-half-micron dimensions adjacent said substrate; and developing said first portion to form openings tapering from the dimensions of the openings in said second portion to sub-half-micron openings at the interface between said first portion and said substrate in a pattern corresponding to the openings in said second portion; depositing a metal in the openings formed through said first and second portions to define a metal contact on said substrate.
Claim 8
Independent Claim
173 words
A method of masking a semiconductor substrate comprising: selecting a semiconductor substrate; depositing a first portion over said semiconductor substrate, said first portion being formed by depositing a plurality of successive layers over one another with each of said layers having a successively increasing concentration of the deposited material; depositing a second portion over said first portion; exposing said second portion to radiation to define a pattern in said second portion; developing said second portion to define openings through said second portion corresponding to said pattern; exposing said first level portion to radiation through said openings to define a tapered pattern of exposure of sub-half-micron dimensions adjacent said substrate; and developing said first portion to form openings tapering from the dimensions of the openings in said second portion to sub-half-micron openings at the interface between said first portion and said substrate in a pattern corresponding to the openings in said second portion; depositing a metal in the openings formed through said first and second portions to define a metal contact on said substrate.
Claim 9
Dependent Claim
31 words
The method of claim 6 further comprising the step of dissolving the second portion and lifting the metal to produce conductive portions on said substrate in the pattern of the openings.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-09-15 | 1996-03-16 | 1996-09-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-09-15 | 2000-03-16 | 2000-09-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-09-15 | 2004-03-16 | 2004-09-15 | $7700.00 | Window Closed / Lapsed |