Abstract A silicon thin film transistor array includes a plurality of silicon thin film transistors in an array-like form, each silicon thin film transistor including an insulating substrate, a gate electrode formed on the insulating substrate, a gate insulating layer formed on the insulating substrate containing the gate electrode, a pair of first impurity contained silicon layers formed on the gate insulating layer in such a manner as to transversely cross a terminal part of the gate electrode, an intrinsic silicon layer formed on the pair of first impurity contained silicon layers and on the gate insulating layer between the pair of first impurity contained silicon layers in such a manner as to connect the pair of first impurity contained silicon layers, a protective insulation layer formed on the intrinsic silicon layer, and a source electrode and a drain electrode formed at contact parts of the pair of first impurity contained silicon layers; gate wiring for connecting the gate electrodes of the silicon thin film transistors to each other; and source wiring for connecting the source electrodes of the silicon thin film transistors to each other.
A silicon thin film transistor comprising: an insulating substrate; a gate electrode formed on the insulating substrate, said gate electrode having a pair of opposed edges; a gate insulating layer formed on said insulating substrate containing said gate electrode; a pair of first impurity containing silicon layers formed on said gate insulating layer, each of which transversely crosses a separate one of said opposed edges of said gate electrode, said first impurity containing silicon layers each having an edge that does not overlie said gate electrode whereby said edges of said first impurity containing silicon layers are spaced outwardly of separate ones of said opposed edges of said gate electrode; an intrinsic silicon layer formed on said pair of first impurity containing silicon layers and on said gate insulating layer between said pair of first impurity containing silicon layers in such a manner as to connect said pair of first impurity containing silicon layers; a protective insulating layer formed on said intrinsic silicon layer and having the same shape as that of said intrinsic silicon layer; and a source electrode and a drain electrode formed at contact parts of said pair of first impurity containing silicon layers, wherein said intrinsic silicon layer and said protective insulating layer cross said opposed edges of said gate electrode and have opposed edges substantially aligned with said edges of said first impurity containing silicon layers.
Claim 2
Dependent Claim
231 words
A silicon thin film transistor comprising: an insulating substrate; a gate electrode formed on the insulating substrate, said gate electrode having a pair of opposed edges; a gate insulating layer formed on said insulating substrate containing said gate electrode; a pair of first impurity containing silicon layers formed on said gate insulating layer, each of which transversely crosses a separate one of said opposed edges of said gate electrode, said first impurity containing silicon layers each having an edge that does not overlie said gate electrode whereby said edges of said first impurity containing silicon layers are spaced outwardly of separate ones of said opposed edges of said gate electrode; an intrinsic silicon layer formed on said pair of first impurity containing silicon layers and on said gate insulating layer between said pair of first impurity containing silicon layers in such a manner as to connect said pair of first impurity containing silicon layers; a protective insulating layer formed on said intrinsic silicon layer and having the same shape as that of said intrinsic silicon layer; and a source electrode and a drain electrode formed at contact parts of said pair of first impurity containing silicon layers, wherein said intrinsic silicon layer and said protective insulating layer cross said opposed edges of said gate electrode and have opposed edges substantially aligned with said edges of said first impurity containing silicon layers.