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US5108513A Expired / Lapsed US ⏱️ 0.0 years remaining

Device for transporting and positioning semiconductor wafer-type workpieces

Assignee: Siltronic AG
•
Filing: 1990-05-03
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Granted: 1992-04-28
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Expires: 2010-05-03
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Abstract

Abstract A device in which the wafers are moved with the aid of aqueous media, is posed for the transportation of semiconductor wafers and also for use in processes for the cleaning thereof, the device including a guideplate having a bottom plate with nozzle systems which are differently inclined in each case and independent of one another and through which the transportation fluid is, if necessary, forced into the transportation space, as a result of which the wafer can be loaded, retarded, caused to rotate and unloaded again. The devices can be combined to form treatment lines, different fluids being used in each case in the individual sections thereof, so that no mechanically moving parts act on the wafers during retardation and rotation and that no change of reagents has to be carried out inside a treatment station.

Inventors

  • 👤 Alois Muller
  • 👤 Helmut Seidl
  • 👤 Erich Wimmer
  • 👤 Laszlo Eigner

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 14:07
CPC Classifications
B; B65; B65G; B65G51/00; B65G51/02; B65G51/03; H; H10; H10P; H10P72/00; H10P72/30; H10P72/36; H10P72/3602

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 170 words
A process for the wet-chemical surface treatment and/or cleaning of wafer-type workpieces, comprising the steps of: causing at least one liquid to act on a wafer surface for said wet-chemical surface treatment and/or cleaning; subjecting the wafers to at least one transportation operation by means of said at least one liquid media; and passing the wafers through at least one device including a guideplate having lateral walls and a plate bottom defining a transportation space including a retardation region and a rotation region; feed nozzle means arranged in said plate bottom and inclined in the direction of transportation, for forcing said at least one liquid into the transportation space; and retardation nozzle means arranged in the guideplate at an angle inclined in opposition to the direction of transportation, for supplying said at least one liquid to said retardation region; and rotation nozzle means arranged radially from a common center in the guideplate at an angle inclined in the direction of rotation, for supplying said fluid media to said rotation region.
Claim 2
Dependent Claim 170 words
A process for the wet-chemical surface treatment and/or cleaning of wafer-type workpieces, comprising the steps of: causing at least one liquid to act on a wafer surface for said wet-chemical surface treatment and/or cleaning; subjecting the wafers to at least one transportation operation by means of said at least one liquid media; and passing the wafers through at least one device including a guideplate having lateral walls and a plate bottom defining a transportation space including a retardation region and a rotation region; feed nozzle means arranged in said plate bottom and inclined in the direction of transportation, for forcing said at least one liquid into the transportation space; and retardation nozzle means arranged in the guideplate at an angle inclined in opposition to the direction of transportation, for supplying said at least one liquid to said retardation region; and rotation nozzle means arranged radially from a common center in the guideplate at an angle inclined in the direction of rotation, for supplying said fluid media to said rotation region.
Claim 3
Dependent Claim 59 words
The process as claimed in claim 1, further including the step of passing the wafers through at least two said devices arranged in sequence, different liquids being used from device to device, and freeing the wafers at least partially from the liquid used in the preceding device in a retaining and drying zone on passing into the next device.

References Cited (Backward Citations)

US3215238A Cited
US3976329A Cited
US4618292A Cited
US4242038A Cited
US4348139A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-04-28 1995-10-28 1996-04-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-04-28 1999-10-28 2000-04-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-04-28 2003-10-28 2004-04-28 $7700.00 Window Closed / Lapsed

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