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US5099310A Expired / Lapsed US ⏱️ 0.0 years remaining

Substrate for semiconductor apparatus

Assignee: Sumitomo Electric Industries Ltd
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Filing: 1989-01-17
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Granted: 1992-03-24
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Expires: 2009-01-17
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Abstract

Abstract This invention relates to a substrate for semiconductor apparatus loading a semiconductor chip in integrated circuit apparatus and is characterized in that a sintered compact containing copper of 2 to 30 wt. % in tungsten and/or molybdenum is used as the substrate having the heat radiation capable of efficiently radiating heat developed from the loaded semiconductor chip and thermal expansion coefficient similar to those of semiconductor chip and other enclosure material except for the substrate.

Inventors

  • 👤 Mituo Osada
  • 👤 Yoshinari Amano
  • 👤 Nobuo Ogasa
  • 👤 Akira Ohtusuka

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 17:10
CPC Classifications
B; B22; B22F; B22F3/00; B22F3/24; H; H10; H10W; H10W40/00; H10W40/20; H10W40/25; H10W40/257; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/6875; H10W72/00; H10W72/071; H10W72/073; H10W72/07331; H10W72/07337; H10W72/30; H10W72/321; H10W72/325; H10W72/351; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T428/00; Y10T428/12; Y10T428/12014; Y10T428/12028; Y10T428/12049; Y10T428/12056; Y10T428/12493

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 100 words
An IC package for housing a semiconductor comprising a substrate and an enclosure base material made of Al 2 O 3 , said substrate consisting essentially of a material containing copper and at least one of tungsten and molybdenum, said material being produced by pressing and sintering at least one of tungsten and molybdenum powders to form a sintered compact, said sintered compact being infiltrated with molten copper at 10-30 weight percent, the thermal expansion coefficient of said substrate being in the range of 5.2 to 9.7×10 -6 /°C. and the thermal conductivity being at least 0.35 cal/cm. sec. °C.
Claim 2
Dependent Claim 100 words
An IC package for housing a semiconductor comprising a substrate and an enclosure base material made of Al 2 O 3 , said substrate consisting essentially of a material containing copper and at least one of tungsten and molybdenum, said material being produced by pressing and sintering at least one of tungsten and molybdenum powders to form a sintered compact, said sintered compact being infiltrated with molten copper at 10-30 weight percent, the thermal expansion coefficient of said substrate being in the range of 5.2 to 9.7×10 -6 /°C. and the thermal conductivity being at least 0.35 cal/cm. sec. °C.
Claim 3
Dependent Claim 18 words
The IC package according to claim 1 wherein said sintering and infiltration are performed in a hydrogen atmosphere.
Claim 4
Dependent Claim 115 words
An IC package for housing a semiconductor comprising a substrate and an enclosure base material made of Al 2 O 3 , said substrate consisting essentially of a material containing copper and at least one of tungsten and molybdenum, said material being produced by pressing and sintering a uniform mixture of at least one of tungsten and molybdenum powders with not more than 20 weight percent of iron group metal powders to form a sintered compact, said sintered compact being infiltrated with molten copper at 10-30 weight percent, the thermal expansion coefficient of said substrate being in the range of 5.2 to 9.7×10 -6 /°C. and thermal conductivity being at least 0.35 cal/cm. sec. °C.
Claim 5
Dependent Claim 115 words
An IC package for housing a semiconductor comprising a substrate and an enclosure base material made of Al 2 O 3 , said substrate consisting essentially of a material containing copper and at least one of tungsten and molybdenum, said material being produced by pressing and sintering a uniform mixture of at least one of tungsten and molybdenum powders with not more than 20 weight percent of iron group metal powders to form a sintered compact, said sintered compact being infiltrated with molten copper at 10-30 weight percent, the thermal expansion coefficient of said substrate being in the range of 5.2 to 9.7×10 -6 /°C. and thermal conductivity being at least 0.35 cal/cm. sec. °C.
Claim 6
Dependent Claim 18 words
The IC package according to claim 3 wherein said sintering and infiltration are performed in a hydrogen atmosphere.

References Cited (Backward Citations)

US3097329A Cited
US3204158A Cited
US3969754A Cited
US4196442A Cited
US4500904A Cited
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US4672417A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-03-24 1995-09-23 1996-03-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-03-24 1999-09-23 2000-03-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-03-24 2003-09-23 2004-03-24 $7700.00 Window Closed / Lapsed

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