Narrow width EEPROM with single diffusion electrode formation

Claim 1

An MOS EEPROM transistor cell comprising, field oxide having spaced apart, opposed barrier walls defining the width limits of the active transistor memory cell and at least partially disposed into a wafer substrate of a first conductivity type, a first electrode stripe diffused into said substrate and extending across the cell in the widthwise direction from one field oxide barrier wall to an opposed field oxide barrier wall, said first stripe having opposed ends in abutment with said opposed field oxide barrier walls, a second electrode stripe diffused into said substrate parallel to and spaced apart from the first electrode stripe and defining a channel stripe with opposed edges therebetween, said second stripe having opposed ends in abutment with said opposed field oxide barrier walls, the first and second electrodes being of a second conductivity type opposite to the first conductivity type, said first and second electrode stripes having the same depth, a thin oxide stripe, surrounded by thicker oxide layers on two opposite sides and said field walls on two other opposite sides and overlying and within the first electrode stripe, the thin oxide serving as a tunneling region for electrical charge, the thin oxide having the same width as the first and second electrode stripes, a floating gate electrode stripe disposed over the channel stripe and insulated from said electrode stripes by said thicker oxide and covering said thin oxide region and overlapping said opposed barrier walls, thin oxide, and channel, whereby electrical charge can be communicated through the thin oxide to the floating gate, and a control electrode stripe disposed over the floating gate electrode stripe in insulated relation therewith.