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Field effect type josephson transistor

Assignee: Seiko Epson Corp
•
Filing: 1989-10-19
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Granted: 1991-12-10
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Expires: 2009-10-19
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Abstract

Abstract A field effect type Josephson transistor in which a source electrode and a drain electrode are provided with a gap therebetween, a tunnel film is provided in the gap between the source electrode and drain electrode, and a gate electrode for field-controlling the tunnel current through the tunnel film is provided. The transistor of such structure is suitable for mass-production and is utilized in manufacture of integrated circuits.

Inventors

  • 👤 Seiichi Iwamatsu

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 15:34
CPC Classifications
H; H10; H10N; H10N60/00; H10N60/10; H10N60/128; Y; Y10; Y10S; Y10S505/00; Y10S505/70; Y10S505/701; Y10S505/702; Y10S505/825; Y10S505/873; Y10S505/874

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 99 words
A field effect type Josephson transistor comprising: a source electrode and a drain electrode, wherein each of said electrodes is composed of superconducting material, said electrodes being separated from one another by a gap and each having a side wall bounding said gap; two tunnel films each disposed in said gap on a respective side wall, a substrate electrode disposed in said gap and interposed between said tunnel films; a gate electrode disposed for controlling a current flowing through said gap between said source and drain electrodes; and a dielectric film disposed between said gap and said gate electrode.
Claim 2
Dependent Claim 99 words
A field effect type Josephson transistor comprising: a source electrode and a drain electrode, wherein each of said electrodes is composed of superconducting material, said electrodes being separated from one another by a gap and each having a side wall bounding said gap; two tunnel films each disposed in said gap on a respective side wall, a substrate electrode disposed in said gap and interposed between said tunnel films; a gate electrode disposed for controlling a current flowing through said gap between said source and drain electrodes; and a dielectric film disposed between said gap and said gate electrode.
Claim 3
Dependent Claim 40 words
A transistor as defined in claim 1 wherein each of said electrodes is composed of superconductor material and each said tunnel film is composed of a dielectric material and has a thickness of the order of several times 10 Å.
Claim 4
Dependent Claim 61 words
A field effect type Josephson transistor comprising: an insulating substrate; a gate electrode formed on said substrate; a gate insulating film covering said gate electrode; source and drain electrodes formed of superconducting material disposed on said gate insulating film and separated from one another by a tunnel gap located above said gate electrode; and a tunnel film disposed within said gap.
Claim 5
Dependent Claim 61 words
A field effect type Josephson transistor comprising: an insulating substrate; a gate electrode formed on said substrate; a gate insulating film covering said gate electrode; source and drain electrodes formed of superconducting material disposed on said gate insulating film and separated from one another by a tunnel gap located above said gate electrode; and a tunnel film disposed within said gap.
Claim 6
Dependent Claim 38 words
A transistor as defined in claim 3 wherein each of said electrodes is composed of a superconductor material and said tunnel film is composed of a dielectric material and has a thickness of the order of 2 nm.
Claim 7
Dependent Claim 89 words
A field effect type Josephson transistor comprising: an insulating substrate; two electrodes of a ceramic high-temperature superconductor disposed on said substrate, said electrodes being separated from one another by a tunnel gap; a tunnel insulating film disposed in said gap; a dielectric film covering said gap; and a gate electrode formed on said dielectric film at a location above said gap, wherein said dielectric film is a gate insulating film interposed between said gate electrode and said tunnel gap and having a thickness of about 0.01 to 0.1μ .
Claim 8
Dependent Claim 89 words
A field effect type Josephson transistor comprising: an insulating substrate; two electrodes of a ceramic high-temperature superconductor disposed on said substrate, said electrodes being separated from one another by a tunnel gap; a tunnel insulating film disposed in said gap; a dielectric film covering said gap; and a gate electrode formed on said dielectric film at a location above said gap, wherein said dielectric film is a gate insulating film interposed between said gate electrode and said tunnel gap and having a thickness of about 0.01 to 0.1μ .
Claim 9
Dependent Claim 30 words
A transistor as defined in claim 5, wherein said tunnel insulating film is composed of a dielectric material and has a thickness of the order of 0.002 to 0.1μ .
Claim 10
Dependent Claim 65 words
A field effect type Josephson transistor comprising: an insulating substrate; a superconductor film disposed on said substrate and separated into two parts lying in a common plane and constituting source and drain electrodes separated by a tunnel gap; and a gate electrode disposed in the common plane and spaced from said gap in a direction transverse to the direction of separation between said two parts.
Claim 11
Dependent Claim 65 words
A field effect type Josephson transistor comprising: an insulating substrate; a superconductor film disposed on said substrate and separated into two parts lying in a common plane and constituting source and drain electrodes separated by a tunnel gap; and a gate electrode disposed in the common plane and spaced from said gap in a direction transverse to the direction of separation between said two parts.
Claim 12
Dependent Claim 34 words
A transistor as defined in claim 7 wherein said film is separated into at least three parts separated by at least two tunnel gaps, and said gate electrode is disposed adjacent each said gap.

References Cited (Backward Citations)

JPS6068681A Cited
US4888629A Cited
US4884111A Cited
US4675711A Cited
JPS61206278A Cited
US4843446A Cited
JPS63302582A Cited
JPH01133381A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-12-09 1995-06-10 1995-12-10 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-12-09 1999-06-10 1999-12-10 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-12-09 2003-06-10 2003-12-10 $7700.00 Window Closed / Lapsed

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