Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of nickel and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 2
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of nickel and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 3
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of cobalt and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 4
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of cobalt and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 5
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of rhodium and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 6
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of rhodium and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 7
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of iridium and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.
Claim 8
Dependent Claim
199 words
A thin film transistor matrix, comprising: a plurality of thin-film transistors formed on a transparent dielectric substrate and arranged in rows and columns to form a matrix array, each of said transistors comprising: (a) a control electrode formed as a film on said transparent dielectric substrate; (b) a first insulator film formed on said control electrode; (c) a second insulator film formed on said first insulator film; (d) an amorphous silicon semiconductor layer formed on said second insulator film; (e) a first electrode formed on said amorphous silicon semiconductor layer; and (f) a second electrode formed on said amorphous silicon semiconductor layer; said matrix array further comprising: (a) a plurality of transparent electrodes formed on said transparent dielectric substrate, contacting said respective second electrodes; (b) row interconnection layers interconnecting said control electrodes of said transistors of said respective rows; and (c) column interconnection layers interconnecting said first electrodes of said transistors of said respective columns; wherein said control electrodes and said row interconnection layers are formed of an alloy of iridium and tantalum; and, wherein said first insulator film of each of said transistors is composed of an anodized surface of said control electrode and said row interconnection layers.