Testing device for both-sided two-stage contacting of equipped printed circuit boards

Claim 2

A testing device for component equipped printed circuit boards, comprising: a lower needle adaptor which carries first and second resilient contact needles arranged test-specimen-associated and differing in length for two-stage contacting of an underside of the printed circuit board, and having a plurality of lower pressure rams arranged test-specimen-associated, said lower pressure rams acting directly on the printed circuit board and being arranged distributed over the surface of the circuit board; an additional upper needle adaptor carrying third and fourth, resilient contact needles arranged test-specimen-associated and differing in length for two-stage contacting of the upper side of the printed circuit boards and having a plurality of upper pressure rams arranged test-specimen-associated, said upper pressure rams acting directly on the printed circuit board and being arranged distributed over the surface of the circuit board; and said upper pressure rams and said lower pressure rams being capable of clamping the circuit board therebetween to provide distributed support of the printed circuit board during testing of the circuit board.

Claim 3

The testing device according to claim 1, wherein said lower needle adaptor is stationarily arranged.

Claim 4

The testing device according to claim 2, wherein the printed circuit board is pressed against said stationarily arranged, lower needle adaptor with resiliently fashioned, upper pressure rams, whereby the forces of said resilient, upper pressure rams are greater in sum than the sum of the spring forces of the first and second contact needles.

Claim 5

The testing device according to claim 1, wherein said upper needle adaptor is arranged adjustable in a vertical direction.

Claim 6

The testing device according to claim 3, wherein said resilient, upper pressure rams are rigidly arranged in said upper needle adaptor.

Claim 7

The testing device according to claim 1, wherein the lower pressure rams are adjustable in two-steps in a vertical direction.

Claim 8

The testing device according to claim 6, wherein said lower pressure rams are guided in said lower needle adaptor and are actuatable via a lower, common pressure plate.

Claim 9

The testing device according to claim 1, wherein at least two centering pins leading said upper pressure rams are arranged in said upper needle adaptor for positioning said printed circuit boards.

Claim 10

A testing device for a two-sided component equipped printed circuit board, comprising: means for holding a two=sided component equipped printed circuit board kin a predetermined centered position; and means for selectively contacting the printed circuit board with a plurality of electrical contacts in at least three contact stages for electrical testing of the circuit board; said means for selectively contacting including, a lower needle adaptor having first and second resiliently mounted contact needles arranged test-specimen-associated, said first contact needles being mounted to extend a different distance than said second contact needles when in a relaxed condition, an upper needle adaptor having third and fourth resiliently mounted contact needles arranged test-specimen-associated, said third contact needles being mounted to extend a different distance than said fourth contact needles when in a relaxed condition, lower pressure rams associated with said lower needle adaptor and arranged test-specimen-associated, said lower pressure rams having at least a first and second position wherein said first position holds the printed circuit board pressed there against in contact with said first contact needles and out of contact with said second contact needles, and said second position holds the printed circuit board pressed there against in contact with both said first and second contact needles, and upper pressure rams associated with said upper needle adaptor and arranged test-specimen-associated, said upper pressure rams having at least two positions.

Claim 11

A testing device for a two-sided component equipped printed circuit board, comprising: means for holding a two=sided component equipped printed circuit board kin a predetermined centered position; and means for selectively contacting the printed circuit board with a plurality of electrical contacts in at least three contact stages for electrical testing of the circuit board; said means for selectively contacting including, a lower needle adaptor having first and second resiliently mounted contact needles arranged test-specimen-associated, said first contact needles being mounted to extend a different distance than said second contact needles when in a relaxed condition, an upper needle adaptor having third and fourth resiliently mounted contact needles arranged test-specimen-associated, said third contact needles being mounted to extend a different distance than said fourth contact needles when in a relaxed condition, lower pressure rams associated with said lower needle adaptor and arranged test-specimen-associated, said lower pressure rams having at least a first and second position wherein said first position holds the printed circuit board pressed there against in contact with said first contact needles and out of contact with said second contact needles, and said second position holds the printed circuit board pressed there against in contact with both said first and second contact needles, and upper pressure rams associated with said upper needle adaptor and arranged test-specimen-associated, said upper pressure rams having at least two positions.

Claim 12

A testing device as claimed in claim 9, wherein said upper pressure rams are resiliently mounted.

Claim 13

A testing device as claimed in claim 9, wherein said upper pressure rams extend closer to a circuit board to be tested when in a fully extended position than either of said third and fourth contact needles, and wherein said means for selectively contacting is operable to selectively contact said printed circuit board in four contact stages.