System and method for testing analog to digital converter embedded in microcontroller

Claim 3

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 1, wherein said generating step generates analog voltage test signals within a predefined range and said embedded ADC converts analog voltage signals into digital values.

Claim 4

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 1, wherein said generating step generates analog current test signals within a predefined range and said embedded ADC converts analog current signals into digital values.

Claim 5

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 1, wherein said embedded random access memory can store tally values corresponding to a predefined maximum number X of distinct digital output values generated by said embedded ADC; said embedded ADC is capable of generating more distinct digital output values than X; said method including the step of repeating said generating, converting, storing and accumulating, and transmitting steps for plurality of different signal ranges; said plurality of different signal ranges together corresponding to all distinct digital output values which can be generated by said embedded ADC.

Claim 8

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 5, wherein said generating step generates analog voltage test signals within a predefined range and said embedded ADC converts analog voltage signals into digital values.

Claim 9

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 5, wherein said generating step generates analog current test signals within a predefined range and said embedded ADC converts analog current signals into digital values.

Claim 10

The method of testing an analog to digital converter (ADC) embedded in a microprocessor set forth in claim 5, wherein said random access memory can store entries corresponding to a predefined maximum number X of distinct digital output values generated by said embedded ADC; said embedded ADC is capable of generating more distinct digital output values than X; said method including the step of repeating said generating, converting, incrementing, and transmitting steps for plurality of different signal ranges; said plurality of different signal ranges together corresponding to all distinct digital output values which can be generated by said embedded ADC.

Claim 11

Test apparatus for testing an analog to digital converter (ADC) embedded in a microprocessor, said embedded ADC generating a predefined number of distinct, digital output values when converting input analog signals, said microprocessor having a random access memory for storing data values, the test apparatus comprising: a data processing unit coupled to an analog signal generator, said data processing unit and analog signal generator generating a sequence of analog test signals within a predefined range and transmitting said analog test signals to an embedded ADC in a microprocessor; said data processing unit and analog signal generator including means for generating a prompting signal which causes said embedded ADC to convert each said analog test signal into a digital output value; and program means coupled to said microprocessor for directing said microprocessor to store and accumulate in said random access memory in said microprocessor data corresponding to said digital output values output by said embedded ADC; said program means including software for directing said microprocessor to transmit said data stored in said random access memory in said microprocessor to said data processing unit after said sequence of analog test signals has been converted by said embedded ADC; said data processing unit including software for evaluating said data accumulated and stored in said microprocessor and transmitted by said microprocessor to said data processing unit; whereby data resulting from testing of said embedded ADC is accumulated in random access memory in said microprocessor, which enables fast testing of the embedded ADC.

Claim 12

Test apparatus for testing an analog to digital converter (ADC) embedded in a microprocessor, said embedded ADC generating a predefined number of distinct, digital output values when converting input analog signals, said microprocessor having a random access memory for storing data values, the test apparatus comprising: a data processing unit coupled to an analog signal generator, said data processing unit and analog signal generator generating a sequence of analog test signals within a predefined range and transmitting said analog test signals to an embedded ADC in a microprocessor; said data processing unit and analog signal generator including means for generating a prompting signal which causes said embedded ADC to convert each said analog test signal into a digital output value; and program means coupled to said microprocessor for directing said microprocessor to store and accumulate in said random access memory in said microprocessor data corresponding to said digital output values output by said embedded ADC; said program means including software for directing said microprocessor to transmit said data stored in said random access memory in said microprocessor to said data processing unit after said sequence of analog test signals has been converted by said embedded ADC; said data processing unit including software for evaluating said data accumulated and stored in said microprocessor and transmitted by said microprocessor to said data processing unit; whereby data resulting from testing of said embedded ADC is accumulated in random access memory in said microprocessor, which enables fast testing of the embedded ADC.

Claim 13

The test apparatus set forth in claim 9, wherein said analog signal generator generates analog voltage test signals within a predefined range and said embedded ADC converts analog voltage signals into digital values.

Claim 14

The test apparatus set forth in claim 9, wherein said analog signal generator generates analog current test signals within a predefined range and said embedded ADC converts analog current signals into digital values.

Claim 15

The test apparatus set forth in claim 9, wherein said random access memory can store data corresponding to a predefined maximum number X of distinct digital output values generated by said embedded ADC; said embedded ADC is capable of generating more distinct digital output values than X; said data processing unit and analog signal generator generating a plurality of analog test signals sequences within a plurality of predefined signal ranges; program means including means for directing said microprocessor to store and accumulate in said random access memory in said microprocessor data corresponding to digital output values output by said embedded ADC in response to each said sequence of analog test signals and to transmit at least a portion of said data corresponding to each said sequence of analog test signals to said data processing unit after each said sequence of analog test signals has been converted by said embedded ADC; said plurality of different signal ranges together corresponding to all distinct digital output values which can be generated by said embedded ADC.

Claim 16

Test apparatus for testing an analog to digital converter (ADC) embedded in a microprocessor, said embedded ADC generating a predefined number of distinct, digital output values when converting input analog signals, said microprocessor having a random access memory for storing data values, the test apparatus comprising: a data processing unit coupled to an analog signal generator, said data processing unit and analog signal generator generating a sequence of analog test signals within a predefined range and transmitting said analog test signals to an embedded ADC in a microprocessor; said data processing unit and analog signal generator including means for generating a prompting signal which causes said embedded ADC to convert each said analog test signal into a digital output value; and program means coupled to said microprocessor for defining in said random access memory in said microprocessor a table having entries for storing a multiplicity of tally values, each said entry in said table corresponding to a distinct, digital output value generated by said embedded ADC; said program means directing said microprocessor to increment said tally value stored in said table entry corresponding to each said digital output value generated by said embedded ADC; said program means further including software for directing said microprocessor to transmit said tally values stored in said random access memory in said microprocessor to said data processing unit after said sequence of analog test signals has been converted by said embedded ADC; said data processing unit including software for evaluating said data accumulated and stored in said microprocessor and transmitted by said microprocessor to said data processing unit; whereby said tally values are accumulated in random access memory in said microprocessor, which enables fast testing of the embedded ADC.

Claim 17

Test apparatus for testing an analog to digital converter (ADC) embedded in a microprocessor, said embedded ADC generating a predefined number of distinct, digital output values when converting input analog signals, said microprocessor having a random access memory for storing data values, the test apparatus comprising: a data processing unit coupled to an analog signal generator, said data processing unit and analog signal generator generating a sequence of analog test signals within a predefined range and transmitting said analog test signals to an embedded ADC in a microprocessor; said data processing unit and analog signal generator including means for generating a prompting signal which causes said embedded ADC to convert each said analog test signal into a digital output value; and program means coupled to said microprocessor for defining in said random access memory in said microprocessor a table having entries for storing a multiplicity of tally values, each said entry in said table corresponding to a distinct, digital output value generated by said embedded ADC; said program means directing said microprocessor to increment said tally value stored in said table entry corresponding to each said digital output value generated by said embedded ADC; said program means further including software for directing said microprocessor to transmit said tally values stored in said random access memory in said microprocessor to said data processing unit after said sequence of analog test signals has been converted by said embedded ADC; said data processing unit including software for evaluating said data accumulated and stored in said microprocessor and transmitted by said microprocessor to said data processing unit; whereby said tally values are accumulated in random access memory in said microprocessor, which enables fast testing of the embedded ADC.

Claim 18

The test apparatus set forth in claim 13, wherein said analog signal generator generates analog voltage test signals within a predefined range and said embedded ADC converts analog voltage signals into digital values.

Claim 19

The test apparatus set forth in claim 13, wherein said analog signal generator generates analog current test signals within a predefined range and said embedded ADC converts analog current signals into digital values.

Claim 20

The test apparatus set forth in claim 13, wherein said random access memory can store entries corresponding to a predefined maximum number X of distinct digital output values generated by said embedded ADC; said embedded ADC is capable of generating more distinct digital output values than X; said data processing unit and analog signal generator generating a plurality of analog test signals sequences within a plurality of predefined signal ranges; said program means including means for directing said microprocessor to increment in said random access memory tally values stored in said table entries in response to each said sequence of analog test signals and to transmit at least a portion of said table entries corresponding to each said sequence of analog test signals to said data processing unit after each said sequence of analog test signals has been converted by said embedded ADC; said plurality of different signal ranges together corresponding to all distinct digital output values which can be generated by said embedded ADC.