Parametric measurement unit/device power supply for semiconductor test system

Claim 3

The device power supply according to claim 1, including a compensation capacitor, the value of which is programmed to optimize frequency response at the output circuit based on the capacitive load at the output.

Claim 4

The device power supply according to claim 1, where the device power supply circuit operates in an auto-crossover servo loop, allowing the power supply to be programmed as a voltage source and a current source at the same time.

Claim 5

The device power supply according to claim 3, wherein the device power supply functions as a voltage source as long as a programmed current limit is not exceeded.

Claim 6

The device power supply according to claim 4, wherein the device power supply sources or sinks the programmed current limit when the current limit is exceeded.

Claim 7

The device power supply according to claim 3, wherein the output voltage of the device power supply changes to maintain the programmed current limit.

Claim 8

The device power supply according to claim 1, wherein the device power supply includes a voltage controlled positive current source and a voltage controlled negative current source.

Claim 9

The device power supply according to claim 7, wherein a diode bridge supplies positive and negative current limits.

Claim 10

The device power supply according to claim 1, wherein the current range switches have high current ranges and low current ranges.

Claim 11

The device power supply according to claim 9, wherein the current range switches are implemented with make before break switches for switching from high to low current ranges and implemented with analog switches for the low current range.

Claim 14

The device power supply circuit according to claim 11, wherein the closed loop voltage feedback circuit is Kelvin connected to the power supply load.

Claim 15

In a device power supply in a semiconductor test system for supplying programmed voltages to a semiconductor device under test and for current range switching without effecting the output voltage of the device power supply, a method of switching current ranges without affecting the voltage applied to the device under test, including the steps of: sensing the programmed voltage applied to a pin of the device under test; applying the sensed voltage to a feedback loop; comparing the sensed voltage with a desired value; sensing current across a range resistor with a current feedback loop; and switching current range switches to adjust a current range based on a maximum current to the device under test.

Claim 16

In a device power supply in a semiconductor test system for supplying programmed voltages to a semiconductor device under test and for current range switching without effecting the output voltage of the device power supply, a method of switching current ranges without affecting the voltage applied to the device under test, including the steps of: sensing the programmed voltage applied to a pin of the device under test; applying the sensed voltage to a feedback loop; comparing the sensed voltage with a desired value; sensing current across a range resistor with a current feedback loop; and switching current range switches to adjust a current range based on a maximum current to the device under test.

Claim 17

The method according to claim 13, wherein the sensed voltage is connected to the feedback loop by a Kelvin connection.

Claim 18

The method according to claim 13, wherein a signal generated by a functional test pattern generator switches the current range switches synchronous with a test pattern generated by a functional test pattern generator.

Claim 19

The method according to claim 15, wherein the signal generated by the functional test pattern triggers an analog to digital conversion synchronous with test pattern timing.

Claim 20

The method according to claim 15, including the step of generating a timing window during which the current range switches are switched.

Claim 21

The method according to claim 15, wherein the current range switches are switched in order to measure current between functional test pattern changes.

Claim 22

The method according to claim 13, wherein the switching current range impedance define a differential voltage which is converted by an analog to digital converter to a fail bit.

Claim 23

The device power supply circuit according to claim 1, wherein the device power supply circuit is used as a parametric measuring unit for measuring voltage at the inputs and outputs of a device under test.