Abstract Probe card is a part which is incorporated into probing equipment to test finished IC chips. This card is customarily mounted with a plurality of probes, very fine needle and generally L letter shaped, each of which is disposed so that its front end may project downwardly toward an IC chip. Conventional probes are difficult to align all the probe front ends with electrical ends on the IC chip. Overdrive is normally taken to produce adequate contact pressures with respective probes after all contacts between the probe front ends and the IC ends are formed, but this action often causes conventional probe ends to slip down from the IC ends. The proposed probe card includes a new provision of a resin layer of an elastic, insulative characteristic to fill the central open area of the supporter which is assembled into the probe card. The filling, by such a resin layer, makes the probe front ends resiliently held in position so that a deviation from proper respective dispositions by overdrive becomes avoidable. The disclosure refers to additional devices to enhance the convenience in determining the alignment between the probe front ends and the IC ends, and also in obtaining accurate measurements of an IC chip under test.
A probe card for measuring electrical characteristics of an IC chip by contacting a probe to an electrical end on the IC chip, said probe card comprising: a board provided with printed circuits and an opening at a central portion; a supporter, in a generally ring shape, having a size which engages inside the opening of the board, said ring supporter having an internal open area; a plurality of probes having rear ends connected with the circuits and having front ends projected downwardly into said internal open area of the ring supporter; and an elastic deformable insulative resin layer filling the internal open area of the ring supporter and embedding a portion of the front ends of each probe therein to hold respective positions more accurately.
Claim 2
Dependent Claim
126 words
A probe card for measuring electrical characteristics of an IC chip by contacting a probe to an electrical end on the IC chip, said probe card comprising: a board provided with printed circuits and an opening at a central portion; a supporter, in a generally ring shape, having a size which engages inside the opening of the board, said ring supporter having an internal open area; a plurality of probes having rear ends connected with the circuits and having front ends projected downwardly into said internal open area of the ring supporter; and an elastic deformable insulative resin layer filling the internal open area of the ring supporter and embedding a portion of the front ends of each probe therein to hold respective positions more accurately.