Method of detecting and indicating errors in a memory device

Claim 1

A method of detecting and indicating errors in a memory device comprising: a plurality of word lines; a plurality of sense lines; a plurality of MOS memory cells connected separately to said word lines and said sense lines; a plurality of bit lines connected separately to said MOS memory cells and a plurality of read circuits connected separately to said plurality of bit lines for reading and outputting data stored in said MOS memory cells; said method comprising the steps of: measuring the potential at each of said bit lines so as to detect an intermediate state of any of said MOS memory cells other than writing and erasing states of MOS said memory cells, said intermediate state corresponding to an error; outputting an error bit indicating signal upon detecting an intermediate state of one of said MOS memory cells.

Claim 2

A method of detecting and indicating errors in a memory device comprising: a plurality of word lines; a plurality of sense lines; a plurality of MOS memory cells connected separately to said word lines and said sense lines; a plurality of bit lines connected separately to said MOS memory cells and a plurality of read circuits connected separately to said plurality of bit lines for reading and outputting data stored in said MOS memory cells; said method comprising the steps of: measuring the potential at each of said bit lines so as to detect an intermediate state of any of said MOS memory cells other than writing and erasing states of MOS said memory cells, said intermediate state corresponding to an error; outputting an error bit indicating signal upon detecting an intermediate state of one of said MOS memory cells.

Claim 4

A method of detecting and indicating errors in a memory device comprising: a plurality of word lines; a plurality of sense lines; a plurality of MOS memory cells connected to said plurality of word lines and to said plurality of sense lines each of selecting one of said word liens and for storing data inputted therein through a selected one of said word lines; a parity check MOS memory cell for adding a 1 parity bit to the associated data; a plurality of bit lines connected separately to said MOS memory cells and to said parity check MOS memory cell and a plurality of reads circuits separately connected to said bit lines for reading and outputting said data storage and said MOS memory cells; said method comprising the steps of: measuring the potential at each of said bit lines so as to detect an intermediate state of any of said MOS memory cells other than write and erase states of said MOS memory cells, said intermediate state corresponding to an error and being a threshold voltage between a threshold voltage of said MOS memory cells in a writing state and a threshold voltage of said MOS memory cells in an erasing state; outputting an error bit indicating signal upon detecting an intermediate state of one of said MOS memory cells; measuring the potential at a point of said parity check MOS memory cell so as to detect said intermediate state other than the writing and erasing states of said parity check MOS memory cell; outputting a parity check error bit indicating signal upon detecting an intermediate state of said parity check MOS memory cell.

Claim 5

A method of detecting and indicating errors in a memory device comprising: a plurality of word lines; a plurality of sense lines; a plurality of MOS memory cells connected to said plurality of word lines and to said plurality of sense lines each of selecting one of said word liens and for storing data inputted therein through a selected one of said word lines; a parity check MOS memory cell for adding a 1 parity bit to the associated data; a plurality of bit lines connected separately to said MOS memory cells and to said parity check MOS memory cell and a plurality of reads circuits separately connected to said bit lines for reading and outputting said data storage and said MOS memory cells; said method comprising the steps of: measuring the potential at each of said bit lines so as to detect an intermediate state of any of said MOS memory cells other than write and erase states of said MOS memory cells, said intermediate state corresponding to an error and being a threshold voltage between a threshold voltage of said MOS memory cells in a writing state and a threshold voltage of said MOS memory cells in an erasing state; outputting an error bit indicating signal upon detecting an intermediate state of one of said MOS memory cells; measuring the potential at a point of said parity check MOS memory cell so as to detect said intermediate state other than the writing and erasing states of said parity check MOS memory cell; outputting a parity check error bit indicating signal upon detecting an intermediate state of said parity check MOS memory cell.

Claim 6

A method of detecting and indicating errors in a memory device comprising a memory cell group including a plurality of memory cells, said memory cells each storing data therein, and having an output node and causing an electrical potential to be produced at said output node thereof according to the data stored therein and a plurality of discriminating circuits each receiving an electrical potential from an output node of a corresponding memory cell and said memory group, for a respectively discriminating between first and second logic levels of data stored in said memory cells with respect to a first threshold potential, said discriminating circuits respectively generating discriminations signals each indicating one of said first and second logic levels; said method comprising the steps of: separately measuring electrical potentials from output nodes of each memory cell in a memory cell group for detecting an error when the electrical potential is between said second and third threshold potentials, said second threshold potential being above said first threshold potential and said third potential being-below said first threshold potential; generating an error detection signal when the measured electrical potential of an output node is between said second and third threshold potentials.

Claim 7

A method of detecting and indicating errors in a memory device comprising a memory cell group including a plurality of memory cells, said memory cells each storing data therein, and having an output node and causing an electrical potential to be produced at said output node thereof according to the data stored therein and a plurality of discriminating circuits each receiving an electrical potential from an output node of a corresponding memory cell and said memory group, for a respectively discriminating between first and second logic levels of data stored in said memory cells with respect to a first threshold potential, said discriminating circuits respectively generating discriminations signals each indicating one of said first and second logic levels; said method comprising the steps of: separately measuring electrical potentials from output nodes of each memory cell in a memory cell group for detecting an error when the electrical potential is between said second and third threshold potentials, said second threshold potential being above said first threshold potential and said third potential being-below said first threshold potential; generating an error detection signal when the measured electrical potential of an output node is between said second and third threshold potentials.

Claim 13

A method of detecting and indicating errors in a memory device comprising a memory cell for storing data therein, said memory cell having an output node and causing an electrical potential to be produced at said output node thereof according to data stored therein and a discriminating circuit for receiving said electrical potential from said output node of said memory cell and for discriminating between first and second logic levels of data stored in said memory cell with respect to a first threshold potential, said discriminating circuit generating a discrimination signal indicating one of said first and second logic levels; said method comprising the steps of measuring the electrical potential from an output node of said memory cell for detecting an error when the electrical potential is between said second and third threshold potentials, said second threshold potential being above said first threshold potential and said third threshold potential being below said first threshold potential; generating an error detection signal when the measured electrical potential of the output node is between said second and third threshold potentials.

Claim 14

A method of detecting and indicating errors in a memory device comprising a memory cell for storing data therein, said memory cell having an output node and causing an electrical potential to be produced at said output node thereof according to data stored therein and a discriminating circuit for receiving said electrical potential from said output node of said memory cell and for discriminating between first and second logic levels of data stored in said memory cell with respect to a first threshold potential, said discriminating circuit generating a discrimination signal indicating one of said first and second logic levels; said method comprising the steps of measuring the electrical potential from an output node of said memory cell for detecting an error when the electrical potential is between said second and third threshold potentials, said second threshold potential being above said first threshold potential and said third threshold potential being below said first threshold potential; generating an error detection signal when the measured electrical potential of the output node is between said second and third threshold potentials.