Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
157 words
A circuit for inverting the latter half of an expected pattern for a device to be tested with regard to operation thereof, comprising: a first flip-flop having a first input terminal supplied with an inverting signal for controlling inversion of an expected pattern, a second input terminal supplied with a reference clock signal for determining the period of said expected pattern and a third input terminal supplied with a clock signal synchronized with transitions in an output pattern of a device to be tested as to whether it operates as desired or not; an exclusive-OR circuit having inputs supplied with the output of said first flip-flop and said expected pattern, respectively; an OR circuit having inputs supplied with said reference clock signal and said clock signal, respectively; and a second flip-flop having a first input terminal supplied with the output of said exclusive-OR circuit and a third input terminal supplied with the output of said OR circuit.
Claim 2
Dependent Claim
157 words
A circuit for inverting the latter half of an expected pattern for a device to be tested with regard to operation thereof, comprising: a first flip-flop having a first input terminal supplied with an inverting signal for controlling inversion of an expected pattern, a second input terminal supplied with a reference clock signal for determining the period of said expected pattern and a third input terminal supplied with a clock signal synchronized with transitions in an output pattern of a device to be tested as to whether it operates as desired or not; an exclusive-OR circuit having inputs supplied with the output of said first flip-flop and said expected pattern, respectively; an OR circuit having inputs supplied with said reference clock signal and said clock signal, respectively; and a second flip-flop having a first input terminal supplied with the output of said exclusive-OR circuit and a third input terminal supplied with the output of said OR circuit.
Claim 3
Independent Claim
179 words
An apparatus for testing an electric/electronic device, comprising: a first flip-flop having a first input terminal supplied with an inverting signal for controlling inversion of an expected pattern, a second input terminal supplied with a reference clock signal for determining the period of said expected pattern and a third input terminal supplied with a clock signal synchronized with transitions in an output pattern of a device to be tested as to whether it operates as desired or not; a first exclusive-OR circuit having inputs supplied with the output of said first flip-flop and said expected pattern, respectively; an OR circuit having inputs supplied with said reference clock signal and said clock signal, respectively; a second exclusive-OR circuit having an inputs supplied with the output of said second flip-flop and an output pattern produced by said device under test, respectively; and a third flip-flop having inputs (first, third) supplied with the output of said second exclusive-OR circuit and a strobe signal, respectively, and an output terminal for producing a signal indicating whether said device under test operates satisfactorily or not.
Claim 4
Independent Claim
179 words
An apparatus for testing an electric/electronic device, comprising: a first flip-flop having a first input terminal supplied with an inverting signal for controlling inversion of an expected pattern, a second input terminal supplied with a reference clock signal for determining the period of said expected pattern and a third input terminal supplied with a clock signal synchronized with transitions in an output pattern of a device to be tested as to whether it operates as desired or not; a first exclusive-OR circuit having inputs supplied with the output of said first flip-flop and said expected pattern, respectively; an OR circuit having inputs supplied with said reference clock signal and said clock signal, respectively; a second exclusive-OR circuit having an inputs supplied with the output of said second flip-flop and an output pattern produced by said device under test, respectively; and a third flip-flop having inputs (first, third) supplied with the output of said second exclusive-OR circuit and a strobe signal, respectively, and an output terminal for producing a signal indicating whether said device under test operates satisfactorily or not.