Array structure for use in an adaptive inference testing device

Claim 1

An adaptive inference system having a program for providing the system with the ability to predict the cause of a previously unobserved fault from the relationships with other known fault information when testing electric and electronic devices or assemblies, said adaptive inference system comprising: a) testing means for performing positiondependent, time-ordered tests upon electrical or electronic devices or assemblies to provide test failure data; b) conversion means operatively connected to said testing means for converting said test failure data to specific error patterns defining relationships with prior test failure data; c) input means operatively connected to said conversion means for introducing operator analysis information to said specific error patterns; d) storage means operatively connected to said conversion means and said input means for storing operator-defined error patterns; and e) comparison means associated with said program, said storage means, and said testing means for comparing current test failure data with stored operator-defined error patterns to predict a probable cause of current failures based upon stored error failures, said comparison means being operative to provide an adaptive inference to test failure data not experienced or operator-defined in prior tests.