US5046034A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Array structure for use in an adaptive inference testing device
Assignee: Array Analysis Inc
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Filing: 1989-11-07
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Granted: 1991-09-03
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Expires: 2009-11-07
Abstract
Abstract An adaptive inference system for testing electrical or electronic devices or assemblies. A mechanism is provided for performing position-dependent, time-ordered tests upon electrical or electronic devices in order to obtain a test data array. A mechanism is also provided to define a reference array containing acceptable data for comparison with test data. A comparator is connected to the test data array and to the reference array for providing an error array. An error array library is also provided, which contains accumulated error data. Finally, an error array comparator is connected between the error array library and the error array providing a diagnostic analysis of the electrical or electronic devices or assemblies.
Inventors
- 👤 William D. Stark
- 👤 Gregory C. Prestas
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 13:46
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2832; G01R31/2836; G01R31/2846; Y; Y10; Y10S; Y10S706/00; Y10S706/902; Y10S706/911; Y10S706/916
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
187 words
An adaptive inference system having a program for providing the system with the ability to predict the cause of a previously unobserved fault from the relationships with other known fault information when testing electric and electronic devices or assemblies, said adaptive inference system comprising: a) testing means for performing positiondependent, time-ordered tests upon electrical or electronic devices or assemblies to provide test failure data; b) conversion means operatively connected to said testing means for converting said test failure data to specific error patterns defining relationships with prior test failure data; c) input means operatively connected to said conversion means for introducing operator analysis information to said specific error patterns; d) storage means operatively connected to said conversion means and said input means for storing operator-defined error patterns; and e) comparison means associated with said program, said storage means, and said testing means for comparing current test failure data with stored operator-defined error patterns to predict a probable cause of current failures based upon stored error failures, said comparison means being operative to provide an adaptive inference to test failure data not experienced or operator-defined in prior tests.
Claim 2
Dependent Claim
187 words
An adaptive inference system having a program for providing the system with the ability to predict the cause of a previously unobserved fault from the relationships with other known fault information when testing electric and electronic devices or assemblies, said adaptive inference system comprising: a) testing means for performing positiondependent, time-ordered tests upon electrical or electronic devices or assemblies to provide test failure data; b) conversion means operatively connected to said testing means for converting said test failure data to specific error patterns defining relationships with prior test failure data; c) input means operatively connected to said conversion means for introducing operator analysis information to said specific error patterns; d) storage means operatively connected to said conversion means and said input means for storing operator-defined error patterns; and e) comparison means associated with said program, said storage means, and said testing means for comparing current test failure data with stored operator-defined error patterns to predict a probable cause of current failures based upon stored error failures, said comparison means being operative to provide an adaptive inference to test failure data not experienced or operator-defined in prior tests.
Claim 3
Dependent Claim
15 words
The adaptive inference system of claim 1, wherein said storage means further includes tolerance data.
Claim 4
Dependent Claim
23 words
The adaptive inference system of claim 1, further comprising display means operatively connected to said comparison means for displaying said operator-defined error patterns.
Claim 5
Dependent Claim
23 words
The adaptive inference means of claim 1, wherein said comparison means include means for calculating a figure of merit for operator-defined error patterns.
Claim 6
Dependent Claim
30 words
The adaptive inference system of claim 1, further comprising means for applying a stimulus to said electrical or electronic device or assembly to provide test vectors for said testing means.
Claim 7
Dependent Claim
19 words
The adaptive inference system of claim 1, wherein said electric or electronic device or assembly includes a PC board.
Claim 8
Dependent Claim
19 words
The adaptive inference system of claim 1, wherein said electrical or electronic device or assembly includes a logical component.
Claim 9
Dependent Claim
16 words
The adaptive inference system of claim 1, wherein said comparison means further comprises error array library.
Claim 10
Dependent Claim
19 words
The adaptive inference system of claim 8, wherein said input means is operatively connected to said error array library.
Claim 11
Dependent Claim
126 words
An adaptive inference method for testing electric or electronic devices or assemblies, and predicting a cause of a previously unobserved fault in said electric or electronic device or assembly from relationships with other known fault information, said adaptive inference method comprising the steps of: a) performing position-dependent, time-ordered tests upon electrical or electronic devices or assemblies to provide test failure data; b) organizing said test failure data into specific error patterns defining relationships with prior test failure data and specifying said test failure data with operator-definitions; c) comparing current test failure data with operator-defined error patterns to predict a probable cause of current failures based upon stored error failures; and d) predicting a cause of current test failures not previously experienced or stored by adaptive inference.
Claim 12
Dependent Claim
126 words
An adaptive inference method for testing electric or electronic devices or assemblies, and predicting a cause of a previously unobserved fault in said electric or electronic device or assembly from relationships with other known fault information, said adaptive inference method comprising the steps of: a) performing position-dependent, time-ordered tests upon electrical or electronic devices or assemblies to provide test failure data; b) organizing said test failure data into specific error patterns defining relationships with prior test failure data and specifying said test failure data with operator-definitions; c) comparing current test failure data with operator-defined error patterns to predict a probable cause of current failures based upon stored error failures; and d) predicting a cause of current test failures not previously experienced or stored by adaptive inference.
Claim 13
Dependent Claim
16 words
The adaptive inference method of claim 10, wherein said prior test failure data includes tolerance data.
Claim 14
Dependent Claim
15 words
The adaptive inference method of claim 10, wherein said test failure data includes digital data.
Claim 15
Dependent Claim
15 words
The adaptive inference method of claim 10, wherein said test failure data includes analog data.
Claim 16
Dependent Claim
16 words
The adaptive inference method of claim 13, wherein said test failure data further includes digital data.
Claim 17
Dependent Claim
14 words
The adaptive inference method of claim 14, wherein said digital data includes J-Tag data.
Claim 18
Dependent Claim
14 words
The adaptive inference method of claim 13, wherein said digital data includes J-Tag data.
Claim 19
Dependent Claim
21 words
The adaptive inference method of claim 10, wherein said predicting step (d) further comprises displaying said cause of current test failure.
Claim 20
Dependent Claim
25 words
The adaptive inference method of claim 10, wherein said performing step (a) further comprises generating test vectors for said electric or electronic device or assembly.
Claim 21
Dependent Claim
19 words
The adaptive inference method of claim 10, wherein said electrical or electronic device or assembly comprises a PC board.
Claim 22
Dependent Claim
19 words
The adaptive inference method of claim 10, wherein said electric or electronic device or assembly comprises a logical component.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-09-02 | 1995-03-04 | 1995-09-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-09-02 | 1999-03-04 | 1999-09-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-09-02 | 2003-03-04 | 2003-09-03 | $7700.00 | Window Closed / Lapsed |