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US5045165A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for sputtering a hydrogen-doped carbon protective film on a magnetic disk

Assignee: WD Media LLC
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Filing: 1990-02-01
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Granted: 1991-09-03
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Expires: 2010-02-01
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Abstract

Abstract A carbon film for protecting a magnetic disk is sputtered in the presence of hydrogen. If a sufficient amount of hydrogen is present in the sputtering chamber, the resulting carbon film will exhibit superior mechanical characteristics, i.e. an enhanced wear resistance during a contact-start-stop or drag test in a disk drive. Sputtering in the presence of hydrogen can be accomplished by either DC or RF magnetron sputtering, or DC or RF diode sputtering.

Inventors

  • 👤 Tsutomu T. Yamashita

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-29 15:36
CPC Classifications
G; G11; G11B; G11B5/00; G11B5/84; G11B5/8408; Y; Y10; Y10S; Y10S428/00; Y10S428/90; Y10T; Y10T428/00; Y10T428/30

Claims Analysis

Total Claims: 12
Claim 1
Independent Claim 145 words
A method for forming a carbon film on a magnetic memory, said magnetic memory comprising a magnetic film formed on a non-magnetic substrate, said method comprising the steps of: introducing a process gas into a sputtering apparatus; and sputtering carbon from a sputtering target within said apparatus onto said memory in the presence of said process gas to thereby form said carbon film, said process gas comprising a sufficient amount of gaseous molecules containing hydrogen to substantially enhance wear resistance of the carbon film, said process gas being substantially free of hydrocarbon gases, said carbon film having predominantly SP2 bonding, wherein the process gas introduced into the apparatus in the vicinity of said sputtering target has a concentration of said gaseous molecules containing hydrogen such that said concentration would be greater than or equal to about 15% by volume if sputtering were not taking place.
Claim 2
Independent Claim 145 words
A method for forming a carbon film on a magnetic memory, said magnetic memory comprising a magnetic film formed on a non-magnetic substrate, said method comprising the steps of: introducing a process gas into a sputtering apparatus; and sputtering carbon from a sputtering target within said apparatus onto said memory in the presence of said process gas to thereby form said carbon film, said process gas comprising a sufficient amount of gaseous molecules containing hydrogen to substantially enhance wear resistance of the carbon film, said process gas being substantially free of hydrocarbon gases, said carbon film having predominantly SP2 bonding, wherein the process gas introduced into the apparatus in the vicinity of said sputtering target has a concentration of said gaseous molecules containing hydrogen such that said concentration would be greater than or equal to about 15% by volume if sputtering were not taking place.
Claim 3
Dependent Claim 14 words
Method of claim 1 wherein said gaseous molecules containing hydrogen are H 2 .
Claim 4
Dependent Claim 23 words
Method of claim 1 wherein over 40 SCCM of a gas mixture containing at least 20% hydrogen is introduced into the sputtering chamber.
Claim 5
Dependent Claim 38 words
Method of claim 1 wherein the input gas flow is such that the gas at the sputtering target would have a hydrogen concentration greater than or equal to about 20% by volume if sputtering were not taking place.
Claim 6
Dependent Claim 25 words
Method of claim 4 wherein 60 SCCM of a 20% H 2 gas mixture is introduced into the sputtering chamber adjacent the carbon sputtering target.
Claim 7
Dependent Claim 22 words
Method of claim 1 wherein the hydrogen concentration at the sputtering target is greater than about 7.5% when sputtering is taking place.
Claim 8
Dependent Claim 22 words
Method of claim 6 wherein the hydrogen concentration at the sputtering target is greater than about 10% when sputtering is taking place.
Claim 9
Dependent Claim 17 words
Method of claim 1 wherein said hydrogen substantially increases the electrical resistance exhibited by said carbon film.
Claim 10
Dependent Claim 19 words
Method of claim 8 wherein the electrical resistance exhibited by said carbon film is greater than about 20 MΩ/square.
Claim 11
Dependent Claim 17 words
Method of claim 8 wherein said electrical resistence is greater than or equal to about 60 ohm-cm.
Claim 12
Dependent Claim 23 words
Method of claim 1 wherein said gas is selected from the group of gases consisting of H 2 O and NH 3 .

References Cited (Backward Citations)

JPS60155668A Cited
JPS61117727A Cited
EP0231894A1 Cited
US4778582A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-09-02 1995-03-04 1995-09-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-09-02 1999-03-04 1999-09-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-09-02 2003-03-04 2003-09-03 $7700.00 Window Closed / Lapsed

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