Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
154 words
A method of fabricating a pagewidth array which includes a plurality of wafer subunits, each subunit having a circuit surface and an opposite base surface, said method comprising the steps of: inverting said plurality of subunits with each of said circuit surfaces facing toward a support surface to expose the base surfaces of each subunit; butting each of said subunits against an adjacent subunit to form an end-to-end array of butted subunits; applying a conformal adhesive to a bonding substrate, and applying the bonding substrate to the base surfaces of said array of butted subunits to form an adhesive layer across each of said subunits; permitting said adhesive layer to cure to form an assembly; and protecting said circuit surfaces from damage due to contact with said support surface by applying a stand-off layer of substantially uniform thickness to at least a portion of said circuit surfaces prior to inverting said plurality of subunits.
Claim 2
Independent Claim
154 words
A method of fabricating a pagewidth array which includes a plurality of wafer subunits, each subunit having a circuit surface and an opposite base surface, said method comprising the steps of: inverting said plurality of subunits with each of said circuit surfaces facing toward a support surface to expose the base surfaces of each subunit; butting each of said subunits against an adjacent subunit to form an end-to-end array of butted subunits; applying a conformal adhesive to a bonding substrate, and applying the bonding substrate to the base surfaces of said array of butted subunits to form an adhesive layer across each of said subunits; permitting said adhesive layer to cure to form an assembly; and protecting said circuit surfaces from damage due to contact with said support surface by applying a stand-off layer of substantially uniform thickness to at least a portion of said circuit surfaces prior to inverting said plurality of subunits.
Claim 3
Dependent Claim
26 words
The method of claim 1 wherein the circuit surfaces of each subunit are coplanar after application of the stand-off layer and inversion onto said support surface.
Claim 4
Dependent Claim
35 words
The method of claim 1 wherein the step of protecting the circuit surfaces by applying a stand-off layer includes the step of patterning the stand-off layer to expose circuit bonding pads on the circuit surface.
Claim 5
Dependent Claim
11 words
The method of claim 1 wherein the stand-off layer comprises polyimide.
Claim 6
Dependent Claim
20 words
The method of claim 1 wherein the stand-off layer has a thickness in the range of 2 to 100 μm.
Claim 7
Dependent Claim
16 words
The method of claim 5 wherein the stand-off layer has a thickness of about 5 μm.
Claim 8
Dependent Claim
32 words
The method of claim 1 wherein the stand off layer is applied to predetermined portions of the circuit surface of the array to form keys for alignment with a corresponding keyway structure.
Claim 9
Independent Claim
160 words
A method of fabricating an extended array of wafer subunits which includes a plurality of wafer subunits, each subunit having a circuit surface and an opposite base surface, said method comprising the steps of: inverting said plurality of subunits with each of said circuit surfaces facing toward a support surface to expose the base surfaces of each subunit; butting each of said subunits against an adjacent subunit to form an end-to-end array of butted subunits; applying a conformal adhesive to a bonding substrate, and applying ;the bonding substrate to the base surfaces of said array of butted substrates to form an adhesive layer across each of said subunits; permitting said adhesive layer to cure to form an extended array of subunits; and protecting said circuit surfaces from damage due to contact with said support surface by applying a stand-off layer of substantially uniform thickness to at least a portion of said circuit surfaces prior to inverting said plurality of subunits.
Claim 10
Independent Claim
160 words
A method of fabricating an extended array of wafer subunits which includes a plurality of wafer subunits, each subunit having a circuit surface and an opposite base surface, said method comprising the steps of: inverting said plurality of subunits with each of said circuit surfaces facing toward a support surface to expose the base surfaces of each subunit; butting each of said subunits against an adjacent subunit to form an end-to-end array of butted subunits; applying a conformal adhesive to a bonding substrate, and applying ;the bonding substrate to the base surfaces of said array of butted substrates to form an adhesive layer across each of said subunits; permitting said adhesive layer to cure to form an extended array of subunits; and protecting said circuit surfaces from damage due to contact with said support surface by applying a stand-off layer of substantially uniform thickness to at least a portion of said circuit surfaces prior to inverting said plurality of subunits.
Claim 11
Dependent Claim
26 words
The method of claim 8 wherein the circuit surfaces of each subunit are coplanar after application of the stand-off layer and inversion onto said support surface.
Claim 12
Dependent Claim
35 words
The method of claim 8 wherein the step of protecting the circuit surfaces by applying a stand-off layer includes the step of patterning the stand-off layer to expose circuit bonding pads on the circuit surface.
Claim 13
Dependent Claim
11 words
The method of claim 8 wherein the stand-off layer comprises polyimide.
Claim 14
Dependent Claim
20 words
The method of claim 8 wherein the stand-off layer has a thickness in the range of 2 to 100 μm.
Claim 15
Dependent Claim
16 words
The method of claim 12 wherein the stand-off layer has a thickness of about 5 μm.
Claim 16
Dependent Claim
32 words
The method according to claim 8 wherein the stand-off layer is applied to predetermined portions of the circuit surface of the array to form keys for alignment with a corresponding keyway structure.
Claim 17
Dependent Claim
16 words
The method according to claim 1, wherein said plurality of wafer subunits are of differing thicknesses.
Claim 18
Dependent Claim
15 words
The method of claim 8, wherein said plurality of wafer subunits are of differing thicknesses.