High speed TTL buffer circuit and line driver

Claim 2

A TTL non-inverting buffer circuit having an input for receiving input data signals at high and low potential levels and an output for transmitting data signals, an input transistor circuit coupled to the input, pulldown transistor element coupled to the output for sinking current from the output to a low potential power rail, a pullup circuit coupled to the output for sourcing current to the output from a high potential power rail, and a phase splitter transistor element coupled to control in opposite phase the conducting states of the pullup circuit and pulldown transistor element comprising: an input transistor element having a base node coupled to the input; an emitter follower transistor element having a base node coupled to a collector node of the input transistor element and an emitter node coupled to a base node of the phase splitter transistor element for sourcing base drive current to the phase splitter transistor element in response to data signals at the input; a first clamp circuit means comprising a plurality of voltage drop components coupled between the emitter node of the input transistor element and the low potential power rail defining a first clamp circuit path between the base node of the emitter follower transistor element through the input transistor element to the low potential power rail for clamping the base node of the emitter follower transistor element at a low potential level when the emitter follower transistor element is relatively non-conducting following transition from a low to a high potential level data signal at the input and for establishing the input threshold voltage level for switching of the input transistor element; and a second clamp circuit means comprising a plurality of voltage drop components coupled between the base node of the emitter follower transistor element and the collector node of the phase splitter transistor element providing a voltage feedback circuit between the emitter follower and phase splitter transistor elements for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element and thereby limiting saturation of the phase splitter transistor element when the emitter follower transistor element is relatively conducting following transition from a high to a low potential level data signal at the input.

Claim 3

The TTL buffer circuit of claim 1 further comprising a threshold hysteresis circuit means coupled to the first clamp circuit means for lowering the input threshold voltage level upon transition from low to high potential level at the input for increasing the input noise margin, and for restoring the higher input threshold voltage level upon transition from high to low potential level at the input, said threshold hysteresis circuit means comprising a bypass transistor element coupled to the first clamp circuit means for bypassing at least one voltage drop component of the first clamp circuit means when the bypass transistor element is conducting, and a bypass control circuit operatively coupled between the base node of the bypass transistor element and a collector node of the phase splitter transistor element for turning on the bypass transistor element when the phase splitter transistor element is not conducting following transition from a low to a high potential level data signal at the input.

Claim 4

The TTL non-inverting buffer circuit of claim 2 wherein the bypass control circuit further comprises a bypass turn off transistor element coupled between the base node of the bypass transistor element and the low potential power rail for rapid turn off of the bypass transistor element, said bypass turn off transistor element having a base node operatively coupled to the emitter node of the phase splitter transistor element for rapid turn off of the bypass transistor element when the phase splitter transistor element is conducting following transition from a high to a low potential level data signal at the input.

Claim 5

The TTL non-inverting buffer circuit of claim 1 further comprising a current source bias circuit coupled to the voltage drop components of the first clamp circuit means for biasing the voltage drop components and maintaining a current density level through the voltage drop components for reducing the temperature dependence of the voltage drop across said voltage drop components.

Claim 6

The TTL non-inverting buffer circuit of claim 1 wherein the second clamp circuit means comprises a "programmable" clamp circuit including a resistor voltage drop component having selected resistance value and a diode voltage drop component, and further comprising a controlled current source coupled to the base node of the emitter follower transistor element for setting the current through the resistor voltage drop component.

Claim 7

The TTL non-inverting buffer circuit of claim 5 wherein the controlled current source comprises a non-current switching, constant current, current mirror circuit.

Claim 8

The TTL non-inverting buffer circuit of claim 5 wherein the second clamp circuit comprises a V BE multiplier circuit.

Claim 9

A TTL non-inverting buffer circuit having an input for receiving data signals at high and low potential levels and an output for transmitting data signals, an input transistor circuit coupled to the input, a pulldown transistor element coupled to the output for sinking current from the output to a low potential power rail, a pullup circuit coupled to the output for sourcing current to the output from a high potential power rail, and a phase splitter transistor element coupled to control in opposite phase the conducting states of the pullup circuit and the pulldown transistor element comprising: an input transistor element having a base node coupled to the input; an emitter follower transistor element having a base node coupled to a collector node of the input transistor element and an emitter node coupled to a base node of the phase splitter transistor element for sourcing base drive current to the phase splitter transistor element in response to data signals at the input; a first clamp circuit means comprising voltage drop components coupled between the emitter node of the input transistor element and the low potential power rail defining a first clamp circuit path from the base node of the emitter follower transistor element through the input transistor element to the low potential power rail for clamping the base node of the emitter follower transistor element at a low potential level when the emitter follower transistor element is relatively non-conducting following transition from a low to a high potential level data signal at the input and for establishing the input threshold voltage level for turn on of the input transistor element; a second clamp circuit means comprising voltage drop components coupled between the base node of the emitter follower transistor element and the low potential power rail for clamping the base node of the emitter follower transistor element at a high potential level at said base node when the emitter follower transistor element is relatively conducting following transition from a high to a low potential level data signal at the input; and a base drive limiting resistor coupled between the emitter node of the emitter follower transistor element and the base node of the phase splitter transistor element for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element thereby limiting saturation of the phase splitter transistor element.

Claim 10

A TTL non-inverting buffer circuit having an input for receiving data signals at high and low potential levels and an output for transmitting data signals, an input transistor circuit coupled to the input, a pulldown transistor element coupled to the output for sinking current from the output to a low potential power rail, a pullup circuit coupled to the output for sourcing current to the output from a high potential power rail, and a phase splitter transistor element coupled to control in opposite phase the conducting states of the pullup circuit and the pulldown transistor element comprising: an input transistor element having a base node coupled to the input; an emitter follower transistor element having a base node coupled to a collector node of the input transistor element and an emitter node coupled to a base node of the phase splitter transistor element for sourcing base drive current to the phase splitter transistor element in response to data signals at the input; a first clamp circuit means comprising voltage drop components coupled between the emitter node of the input transistor element and the low potential power rail defining a first clamp circuit path from the base node of the emitter follower transistor element through the input transistor element to the low potential power rail for clamping the base node of the emitter follower transistor element at a low potential level when the emitter follower transistor element is relatively non-conducting following transition from a low to a high potential level data signal at the input and for establishing the input threshold voltage level for turn on of the input transistor element; a second clamp circuit means comprising voltage drop components coupled between the base node of the emitter follower transistor element and the low potential power rail for clamping the base node of the emitter follower transistor element at a high potential level at said base node when the emitter follower transistor element is relatively conducting following transition from a high to a low potential level data signal at the input; and a base drive limiting resistor coupled between the emitter node of the emitter follower transistor element and the base node of the phase splitter transistor element for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element thereby limiting saturation of the phase splitter transistor element.

Claim 11

The TTL non-inverting buffer circuit of claim 8 further comprising a base drive diode element coupled in parallel with the base drive limiting resistor for providing transient enhancement of base drive current to the phase splitter transistor element following transition from a high to low potential level data signal at the input.

Claim 12

The TTL non-inverting buffer circuit of claim 9 further comprising a current source bias circuit coupled to the first clamp circuit means for biasing the voltage drop components and maintaining a current density level through the voltage drop components for reducing the temperature dependence of the voltage drop across said voltage drop components.

Claim 13

The TTL non-inverting buffer circuit of claim 8 further comprising a threshold hysteresis circuit means coupled to the first clamp circuit means for lowering the input threshold voltage level upon transition from a low to a high potential level data signal at the input for increasing the input noise margin, and for restoring the higher input threshold voltage level following transition from a high to a low potential level data signal at the input.

Claim 14

A TTL buffer circuit having an input for receiving data signals at high and low potential levels and an output for transmitting data signals, an input transistor circuit having a base node, collector node, and emitter node, said base node being coupled to the input, a pulldown transistor element coupled to the output for sinking current from the output to a low potential power rail, pullup means coupled to the output for sourcing current to the output from a high potential power rail, and a phase splitter transistor element coupled to control in opposite phase the conducting states of the pullup means and pulldown transistor element comprising: an emitter follower transistor element having a base node coupled to a collector node of the input transistor circuit and an emitter node coupled to a base node of the phase splitter transistor element for sourcing base drive current to the phase splitter transistor element in response to data signals at the input; first clamp circuit means defining a first clamp circuit path between the base node of the emitter follower transistor element and the low potential power rail for clamping said base node at a low potential level when the emitter follower transistor element is relatively non-conducting and for establishing the input threshold voltage level for switching of the input transistor circuit; and second clamp circuit means coupled to the base node of the emitter follower transistor element defining a second clamp circuit path clamping said base node at a high potential level for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element when the emitter follower transistor element is relatively conducting, for limiting saturation of the phase splitter transistor element, and for improving switching speed of the TTL buffer circuit.

Claim 15

A TTL buffer circuit having an input for receiving data signals at high and low potential levels and an output for transmitting data signals, an input transistor circuit having a base node, collector node, and emitter node, said base node being coupled to the input, a pulldown transistor element coupled to the output for sinking current from the output to a low potential power rail, pullup means coupled to the output for sourcing current to the output from a high potential power rail, and a phase splitter transistor element coupled to control in opposite phase the conducting states of the pullup means and pulldown transistor element comprising: an emitter follower transistor element having a base node coupled to a collector node of the input transistor circuit and an emitter node coupled to a base node of the phase splitter transistor element for sourcing base drive current to the phase splitter transistor element in response to data signals at the input; first clamp circuit means defining a first clamp circuit path between the base node of the emitter follower transistor element and the low potential power rail for clamping said base node at a low potential level when the emitter follower transistor element is relatively non-conducting and for establishing the input threshold voltage level for switching of the input transistor circuit; and second clamp circuit means coupled to the base node of the emitter follower transistor element defining a second clamp circuit path clamping said base node at a high potential level for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element when the emitter follower transistor element is relatively conducting, for limiting saturation of the phase splitter transistor element, and for improving switching speed of the TTL buffer circuit.

Claim 16

The TTL buffer circuit of claim 12 wherein the first clamp circuit means is coupled between an emitter node of the input transistor circuit and the low potential power rail, said first clamp circuit means being coupled to the base node of the emitter follower transistor element through said input transistor circuit.

Claim 17

The TTL buffer circuit of claim 12 wherein the first clamp circuit means comprises first and second diode elements coupled in series between the emitter node of the input transistor circuit and said low potential power rail.

Claim 18

The TTL buffer circuit of claim 14 further comprising a current source bias circuit coupled to the first clamp circuit means for biasing the diode elements and maintaining a current density level through the diode elements for reducing the temperature dependence of the voltage drop across said diode elements.

Claim 19

The TTL buffer circuit of claim 14 wherein the first and second diode elements of the first clamp circuit means comprise respectively a BCS transistor element diode and a Schottky diode for reducing the composite temperature coefficient of the first clamp circuit means.

Claim 20

The TTL buffer circuit of claim 14 further comprising a threshold hysteresis circuit means coupled to the first clamp circuit means for lowering the input threshold voltage level upon a first transition of data signal potential levels at the input for increasing the input noise margin, and for restoring the higher input threshold voltage level upon a second transition of data signal potential levels at the input.

Claim 21

The TTL buffer circuit of claim 17 wherein the threshold hysteresis circuit means comprises a bypass transistor element operatively coupled between the first clamp circuit means and the low potential power rail for bypassing at least one diode element of the first clamp circuit means when the bypass transistor element is conducting, and a bypass control circuit coupled between the base node of the bypass transistor element and a collector node of the phase splitter transistor element for turning on the bypass transistor element and bypassing a diode element of the first clamp circuit means when the phase splitter transistor element is not conducting.

Claim 22

The TTL buffer circuit of claim 18 wherein the bypass control circuit comprises a bypass control emitter follower transistor element having a base node coupled to the collector node of the phase splitter transistor element and an emitter node coupled through a bypass control resistor to the base node of the bypass transistor element.

Claim 23

The TTL buffer circuit of claim 19 wherein the bypass control circuit further comprises a bypass control diode element coupled in parallel with the bypass control resistor for providing transient increase in base drive current for turning on the bypass transistor element during said first transition of data signal potential levels at the input, wherein the phase splitter transistor element is coupled to the high potential power rail through a collector resistor, and wherein the phase splitter transistor element collector resistor and the bypass control resistor form a resistor divider for controlling the bypass transistor element.

Claim 24

The TTL buffer circuit of claim 19 wherein the bypass control circuit further comprises a bypass turn off transistor element coupled between the base node of the bypass transistor element and the low potential power rail for rapid turn off of the bypass transistor element, said bypass turn off transistor element having a base node operatively coupled to the emitter node of the phase splitter transistor element for rapid turn off of the bypass transistor element when the phase splitter transistor element is conducting following a selected data signal potential level transition at the input.

Claim 25

The TTL buffer circuit of claim 12 wherein the second clamp circuit means defines a second clamp circuit path coupled between the base node of the emitter follower transistor element and a collector node of the phase splitter transistor element providing a voltage feedback circuit between the emitter follower and phase splitter transistor elements for limiting base drive current to the phase splitter transistor element from the emitter follower transistor element.

Claim 26

The TTL buffer circuit of claim 22 wherein the second clamp circuit means comprises first and second diode elements coupled in series between the emitter follower transistor element base node and the phase splitter transistor element collector node.

Claim 27

The TTL buffer circuit of claim 23 wherein the first and second diode elements of the second clamp circuit means comprise respectively first and second Schottky diodes.

Claim 28

The TTL buffer circuit of claim 23 wherein the first and second diode elements of the second clamp circuit means comprise respectively a Schottky diode and a PN junction diode.

Claim 29

The TTL non-inverting buffer circuit of claim 22 wherein the second clamp circuit means comprises a "programmable" clamp circuit including a resistor voltage drop component having selected resistance value and a diode voltage drop component, and further comprising a controlled current source coupled to the base node of the emitter follower transistor element for setting the current through the resistor voltage drop component.

Claim 30

The TTL non-inverting buffer circuit of claim 26 wherein the controlled current source comprises a non-current switching, constant current, current mirror circuit.

Claim 31

The TTL non-inverting buffer circuit of claim 26 wherein the second clamp circuit comprises a V BE multiplier circuit.

Claim 32

The TTL buffer circuit of claim 12 wherein the second clamp circuit means defines a second clamp circuit path between the base node of the emitter follower transistor element and the low potential power rail for clamping the base node of the emitter follower transistor element at a high potential level when the emitter follower transistor element relatively conducting, and further comprising a base drive limiting resistor coupled between the emitter node of the emitter follower transistor element and the base node of the phase splitter transistor element.

Claim 33

The TTL buffer circuit of claim 29 wherein the second clamp circuit means comprises a plurality of series coupled voltage drop components establishing a high potential level clamp voltage at the base node of the emitter follower transistor element slightly greater than the sum of the voltage drops across the respective base to emitter nodes of the emitter follower transistor element, phase splitter transistor element, and pulldown transistor element.

Claim 34

The TTL buffer circuit of claim 29 further comprising a base drive diode element coupled in parallel with the base drive limiting resistor at the base node of the phase splitter transistor element for providing transient base drive enhancement for turn on of the phase splitter transistor element during said second transition of data signal potential levels at the input.