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US5032879A
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Integrated semiconductor diode laser and photodiode structure
Assignee: International Business Machines Corp
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Filing: 1990-06-11
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Granted: 1991-07-16
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Expires: 2010-06-11
Abstract
Abstract An integrated semiconductor structure with optically coupled laser diode (11) and photodiode 12A, both devices having etched, vertical facets (16A, 21). The photodiode has a spatially non-uniform sensitivity profile with respect to the incident light beam (18A) emitted by the laser. This is due to the varying distance from the laser facet and/or to variations in the angle of incidence and results in photocurrents produced by the photodiode that depend on the intensity distribution of the light beam. The spatially non-uniform sensitivity profile allows the measurement of the far-field intensity distribution of the laser and thus on-wafer screening of lasers with respect to their mode stability.
Inventors
- 👤 Peter L. Buchmann
- 👤 Christoph S. Harder
- 👤 Otto Vogeli
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 09:57
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/02; H01S5/026; H01S5/0262; H01S5/0264; H01S5/0014; H01S5/0042; H01S5/10; H01S5/1082; H01S5/14
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
94 words
An integrated semiconductor device, comprising: a semiconductor substrate; laser diode means with at least one mirror facet on said semiconductor substrate for emitting an impinging light beam; at least one photodiode means on said semiconductor substrate optically coupled to said laser diode means and provided with an etched mirror photodiode facet, said at least one photodiode means producing a photocurrent in response to said impinging light beam emitted by said laser diode means; and whereby said at least one photodiode means has a spacially non-uniform sensitivity profile with respect to said impinging light beam.
Claim 2
Dependent Claim
94 words
An integrated semiconductor device, comprising: a semiconductor substrate; laser diode means with at least one mirror facet on said semiconductor substrate for emitting an impinging light beam; at least one photodiode means on said semiconductor substrate optically coupled to said laser diode means and provided with an etched mirror photodiode facet, said at least one photodiode means producing a photocurrent in response to said impinging light beam emitted by said laser diode means; and whereby said at least one photodiode means has a spacially non-uniform sensitivity profile with respect to said impinging light beam.
Claim 3
Dependent Claim
43 words
The integrated semiconductor device as in claim 1, whereby said laser diode means emits a light beam of constant total power that generates photocurrent at a level related to the intensity distribution of the light impinging onto said at least one photodiode means.
Claim 4
Dependent Claim
37 words
An integrated structure as in claim 1, wherein two of said etched mirror photodiode facets are arranged at a distance from each other so as to allow measuring the far-field intensity distribution of said impinging light beam.
Claim 5
Dependent Claim
37 words
An integrated structure as in claim 3, wherein said photodiode has a p-n junction and wherein said laser diode is provided with an active waveguide which is coplanar with respect to said p-n junction of said photodiode.
Claim 6
Dependent Claim
73 words
An integrated structure as in claim 4, wherein said etched mirror photodiode facet has a non-linear profile, whereby said laser active wave-guide terminates at said at least one mirror facet and whereby said p-n junction of said photodiode terminates at said etched mirror photodiode facet, such that the distance between said terminating laser active waveguide and said terminating p-n junction of said photodiode varies with the angle at which the light is emitted.
Claim 7
Dependent Claim
44 words
An integrated structure as in claim 1, wherein said laser diode means has a front end and an adjacent back end, said laser diode means being coupled with two of said photodiodes means facing the front-end and back-end of said laser diode means, respectively.
Claim 8
Dependent Claim
51 words
An integrated structure as in claim 6, wherein the etched mirror facet of each of two of said photodiodes have a non-linear profile, said non-linear profiles being mutually inverse with respect to the distance between said terminating laser active waveguide and a p-n junction of each of two of said photodiodes.
Claim 9
Dependent Claim
31 words
An integrated structure as in claim 5, wherein opposite facets of two of said photodiodes have a non-linear profile, and where said non-linear profiles of said opposite facets are mutually inverse.
Claim 10
Dependent Claim
31 words
An integrated structure as in claim 1, wherein said photodiode facet has a linear profile which is tilted at an angle with respect to the propogation direction of the laser beam.
Claim 11
Dependent Claim
38 words
An integrated structure as in claim 9, wherein said tilt angle is equal to a Brewster angle (εp) and such that the portion of the incident transverse-mode polarized light that is transmitted to said photodiode, reaches its maximum.
Claim 12
Dependent Claim
47 words
An integrated structure as in claim 10, wherein the photodiode is provided with a waveguiding ridge running above and parallel to the path taken by the polarized light that is transmitted into said photodiode when the angle of incidence of the laser light equals the Brewster angle.
Claim 13
Independent Claim
134 words
A method of on-line wafer testing of the far-field beam characteristics of a plurality of laser diodes, comprising the steps of: a) providing on a semiconductor wafer a plurality of laser diodes, each of said laser diodes integrated with at least one photodiode, having a spacially non-uniform facet, optically coupled with one of said laser diodes such that, said photodiode, when activated, produces a photocurrent in response to an impinging light beam emitted by said laser diode; b) successively applying operating voltage to said laser diodes, resulting in the emission of an impinging light beam; and c) activating said optically coupled photodiode in order to convert said impinging light into a photocurrent, thus providing a test signal with an amplitude that is a function of the far-field intensity distribution of the impinging light beam.
Claim 14
Independent Claim
134 words
A method of on-line wafer testing of the far-field beam characteristics of a plurality of laser diodes, comprising the steps of: a) providing on a semiconductor wafer a plurality of laser diodes, each of said laser diodes integrated with at least one photodiode, having a spacially non-uniform facet, optically coupled with one of said laser diodes such that, said photodiode, when activated, produces a photocurrent in response to an impinging light beam emitted by said laser diode; b) successively applying operating voltage to said laser diodes, resulting in the emission of an impinging light beam; and c) activating said optically coupled photodiode in order to convert said impinging light into a photocurrent, thus providing a test signal with an amplitude that is a function of the far-field intensity distribution of the impinging light beam.
Claim 15
Dependent Claim
63 words
A method as in claim 12 wherein the laser diodes are integrated and optically coupled with two of said at least one photodiode wherein, prior to step b, said photodiodes are positioned so as to receive the impinging light beam such that the difference in photocurrent of said photodiodes provides a signal that is independent of the total power of said impinging light.
Claim 16
Dependent Claim
40 words
An integrated structure as in claim 6, wherein each facet of two of said photodiodes facing a front-end and a back-end, respectively, of said laser diode have a polygonal profile wherein said polygonal profiles are mutually inverse to each other.
Claim 17
Dependent Claim
20 words
An integrated structure as in claim 14, wherein a vertex of said polygonal profile faces said terminating laser active waveguide.
Claim 18
Dependent Claim
20 words
An integrated structure as in claim 8, wherein said non-linear profiles of said opposite facets are convex and concave, respectively.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 1994-07-15 | 1995-01-14 | 1995-07-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-07-15 | 1999-01-14 | 1999-07-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-07-15 | 2003-01-14 | 2003-07-16 | $7700.00 | Window Closed / Lapsed |