US5029249A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electron microscope
Assignee: Hitachi Ltd
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Filing: 1989-07-18
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Granted: 1991-07-02
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Expires: 2009-07-18
Abstract
Abstract An electron microscope eliminates external ducting for evacuation by interlinking the interiors of a sample chamber for a sample, a casing for electron lenses and a chamber for an electron gun. Those interiors form a closed space with an evacuation path extending therethrough and are evacuated by evacuation means a vacuum pump connected to the sample chamber. The electron lenses are contained within sealed modules and the evacuation path passes between the sides of those modules and the internal walls of the casing. The resulting structure may be enclosed in substantially unbroken magnetic shielding.
Inventors
- 👤 Tadashi Ohtaka
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 20:02
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/18; H01J37/16
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
134 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casing mounted on said sample chamber; an electron lens system provided within the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein the electron gun chamber, the casing, and the sample chamber define a closed space and communicate with each other so as to define an evacuation path within said closed space for enabling evacuation of said electron gun chamber by said evacuation means, said evacuation path being independent of said electron beam path.
Claim 2
Dependent Claim
134 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casing mounted on said sample chamber; an electron lens system provided within the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein the electron gun chamber, the casing, and the sample chamber define a closed space and communicate with each other so as to define an evacuation path within said closed space for enabling evacuation of said electron gun chamber by said evacuation means, said evacuation path being independent of said electron beam path.
Claim 3
Dependent Claim
39 words
An electron microscope according to claim 1, wherein the electron lens system comprises a plurality of sealed modules, each of said modules containing an electron lens and having a bore therethrough for defining part of said electron beam path.
Claim 4
Dependent Claim
27 words
An electron microscope according to claim 2, having a spacer between said modules, said spacer having an opening therein, said opening forming part of said evacuation path.
Claim 5
Dependent Claim
37 words
An electron microscope according to claim 2, wherein at least part of an outer wall of each of said modules is spaced from an inner wall of the casing, that spacing forming part of said evacuation path.
Claim 6
Dependent Claim
36 words
An electron microscope according to claim 1, further comprising a spacer between said electron gun chamber and said casing, said spacer having a plurality of through-bores provided therein, said through-bores defining part of said evacuation path.
Claim 7
Dependent Claim
37 words
An electron microscope according to claim 1, further comprising a tie member between said casing and said sample chamber, said tie member having a plurality of bores provided therein, said bores defining part of said evacuation path.
Claim 8
Dependent Claim
17 words
An electron microscope according to claim 1, further comprising magnetic shielding enclosure surrounding at least the casing.
Claim 9
Dependent Claim
17 words
An electron microscope according to claim 7, wherein said shielding enclosure is sealed to said sample chamber.
Claim 10
Dependent Claim
17 words
An electron microscope according to claim 7, wherein said shielding enclosure also surrounds said electron gun chamber.
Claim 11
Dependent Claim
126 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casting mounted on said sample chamber; an electron lens system provided within the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein an evacuation path is defined within the casing so as to extend between the sample chamber and the electron gun chamber for enabling evacuation of the electron gun chamber by said evacuation means, said evacuation path being offset relative to the electron beam path.
Claim 12
Dependent Claim
126 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casting mounted on said sample chamber; an electron lens system provided within the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein an evacuation path is defined within the casing so as to extend between the sample chamber and the electron gun chamber for enabling evacuation of the electron gun chamber by said evacuation means, said evacuation path being offset relative to the electron beam path.
Claim 13
Dependent Claim
111 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casing mounted on said sample chamber; an electron lens system provided in the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein an evacuation path is defined within the casing for enabling evacuation of the casing via the sample chamber, said evacuation path being offset relative to the electron beam path.
Claim 14
Dependent Claim
111 words
An electron microscope comprising: a hollow sample chamber; evacuation means communicating with the interior of the sample chamber for evacuating the sample chamber; a casing mounted on said sample chamber; an electron lens system provided in the casing; an electron gun chamber mounted on the casing; and an electron beam generating means provided in the electron gun chamber for generating an electron beam; wherein an electron beam path is defined from the electron beam generating means to the sample chamber, and wherein an evacuation path is defined within the casing for enabling evacuation of the casing via the sample chamber, said evacuation path being offset relative to the electron beam path.
Claim 15
Dependent Claim
98 words
An electron microscope comprising a hollow electron gun chamber in which an electron beam generating means for generating an electron beam is provided, a hollow casing for containing an electron lens system, a hollow sample chamber, and evacuating means for evacuating the sample chamber; said electron microscope being characterised by the electron gun chamber, the casing, and the sample chamber defining a closed space communicating with the evacuating means, and an evacuation path being defined between the electron gun chamber, the casing, and the sample chamber, said evacuation path being different from a path of said electron beam.
Claim 16
Dependent Claim
98 words
An electron microscope comprising a hollow electron gun chamber in which an electron beam generating means for generating an electron beam is provided, a hollow casing for containing an electron lens system, a hollow sample chamber, and evacuating means for evacuating the sample chamber; said electron microscope being characterised by the electron gun chamber, the casing, and the sample chamber defining a closed space communicating with the evacuating means, and an evacuation path being defined between the electron gun chamber, the casing, and the sample chamber, said evacuation path being different from a path of said electron beam.
Claim 17
Dependent Claim
92 words
An electron microscope comprising: a hollow sample chamber; a casing; a hollow electron gun chamber; and a plurality of sealed modules provided within the casing, each of said sealed modules containing an electron lens and having a bore therethrough for defining an electron beam path; wherein a communication path is defined in the casing from the sample chamber to the electron gun chamber around said sealed modules, at least part of that path being defined between an outer wall of each of said sealed modules and an inner wall of said casing.
Claim 18
Dependent Claim
92 words
An electron microscope comprising: a hollow sample chamber; a casing; a hollow electron gun chamber; and a plurality of sealed modules provided within the casing, each of said sealed modules containing an electron lens and having a bore therethrough for defining an electron beam path; wherein a communication path is defined in the casing from the sample chamber to the electron gun chamber around said sealed modules, at least part of that path being defined between an outer wall of each of said sealed modules and an inner wall of said casing.
Claim 19
Dependent Claim
132 words
An electron beam column for an electron microscope, comprising; a hollow casing; a plurality of modules provided within said casing, each of said modules having at least one electron lens sealed therein; a hollow electron gun chamber secured to one end of said casing; and means for delimiting at least one evacuation bore extending to the interior of the electron gun chamber; wherein at least part of an outer wall of each of said modules is spaced from an inner wall of the casing so as to define part of an evacuation path around each of said modules, and wherein the evacuation path extends from said electron gun chamber, through said at least one evacuation bore, and around said modules, to an end of said casing remote from said electron gun chamber.
Claim 20
Dependent Claim
132 words
An electron beam column for an electron microscope, comprising; a hollow casing; a plurality of modules provided within said casing, each of said modules having at least one electron lens sealed therein; a hollow electron gun chamber secured to one end of said casing; and means for delimiting at least one evacuation bore extending to the interior of the electron gun chamber; wherein at least part of an outer wall of each of said modules is spaced from an inner wall of the casing so as to define part of an evacuation path around each of said modules, and wherein the evacuation path extends from said electron gun chamber, through said at least one evacuation bore, and around said modules, to an end of said casing remote from said electron gun chamber.
Claim 21
Dependent Claim
79 words
An electron microscope comprising: a hollow sample chamber; a hollow casing; a tie member interconnecting the sample chamber and the casing, the tie member having plurality of bores provided therein; an electron lens system provided within the casing, at least one gas flow path being provided within said casing around said electron lens system; a hollow electron gun chamber; and a spaced interconnecting the casing and the electron gun chamber, the spacer having a plurality of through-bores provided therein.
Claim 22
Dependent Claim
79 words
An electron microscope comprising: a hollow sample chamber; a hollow casing; a tie member interconnecting the sample chamber and the casing, the tie member having plurality of bores provided therein; an electron lens system provided within the casing, at least one gas flow path being provided within said casing around said electron lens system; a hollow electron gun chamber; and a spaced interconnecting the casing and the electron gun chamber, the spacer having a plurality of through-bores provided therein.
Claim 23
Dependent Claim
23 words
An electron microscope according to claim 15, wherein said electron lens system defines an electron beam path separate from said gas flow path.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-07-01 | 1994-12-31 | 1995-07-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-07-01 | 1998-12-31 | 1999-07-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-07-01 | 2002-12-31 | 2003-07-02 | $7700.00 | Window Closed / Lapsed |