Patent US5023545A successfully refreshed from Google Patents.
US5023545A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Circuit probing system
Assignee: United States Department of the Navy
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Filing: 1990-06-04
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Granted: 1991-06-11
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Expires: 2010-06-04
Abstract
Abstract A probing system for determining a voltage at a node during normal operation of a circuit. An input driver drives the circuit normally. A normal output on an output line associated with the node, is recorded. A probe is brought in contact with the node. Various node voltages are applied to the probe and thus to the node, until the output on the output line matches the recorded output. The probe voltage that creates the match is the voltage at the node, during normal operation of circuit.
Inventors
- 👤 Anthony M. Marques
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 18:58
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06705; G01R31/00; G01R31/28; G01R31/2801; G01R31/2806
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
145 words
A probing system for a circuit, comprising: (a) input means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in contact with the node for applying an initial test probe voltage signal to the node of the operating circuit in a first probe test, the circuit producing a corresponding test output signal on the output line; (c) means for providing a recorded normal line output signal for the input means; (d) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (e) controller means for changing the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value.
Claim 2
Dependent Claim
145 words
A probing system for a circuit, comprising: (a) input means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in contact with the node for applying an initial test probe voltage signal to the node of the operating circuit in a first probe test, the circuit producing a corresponding test output signal on the output line; (c) means for providing a recorded normal line output signal for the input means; (d) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (e) controller means for changing the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value.
Claim 3
Dependent Claim
147 words
A probing system for a circuit, comprising: (a) means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in electrical contact with the node; (c) probe driver means for applying an initial test probe voltage signal to the probe means in a first probe test, the circuit producing a corresponding test line output signal on the output line; (d) means for providing a recorded normal line output signal for the input means; (e) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (f) controller means for changing the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value.
Claim 4
Dependent Claim
147 words
A probing system for a circuit, comprising: (a) means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in electrical contact with the node; (c) probe driver means for applying an initial test probe voltage signal to the probe means in a first probe test, the circuit producing a corresponding test line output signal on the output line; (d) means for providing a recorded normal line output signal for the input means; (e) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (f) controller means for changing the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value.
Claim 5
Dependent Claim
168 words
A probing system for a circuit, comprising: (a) input means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in electrical contact with the node (c) probe driver means for applying an initial test probe voltage signal to the probe means in a first probe test, the circuit producing a corresponding test line output signal on the output line; (d) means for providing a recorded normal line output signal for the input means; (e) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (f) controller means having a computer therein for causing the probe driver means to change the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value, the controller removing the probe means after each probe test.
Claim 6
Dependent Claim
168 words
A probing system for a circuit, comprising: (a) input means for operating a circuit normally, the circuit having an output line and an associated node; (b) probe means in electrical contact with the node (c) probe driver means for applying an initial test probe voltage signal to the probe means in a first probe test, the circuit producing a corresponding test line output signal on the output line; (d) means for providing a recorded normal line output signal for the input means; (e) comparator means for comparing the test line output signal on the output line with the recorded normal line output signal and for providing a comparator output signal based on the comparison; and (f) controller means having a computer therein for causing the probe driver means to change the test probe voltage signal based on the comparator output signal, said probe means for providing probe tests continuing until the comparator output signal reaches a null value, the controller removing the probe means after each probe test.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-06-10 | 1994-12-10 | 1995-06-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-06-10 | 1998-12-10 | 1999-06-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-06-10 | 2002-12-10 | 2003-06-11 | $7700.00 | Window Closed / Lapsed |