Patent US5020010A successfully refreshed from Google Patents.
US5020010A
Expired / Lapsed
US
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Method for preparing and evaluating measurement specificatons for an electronic circuit
Assignee: Mitsubishi Electric Corp
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Filing: 1989-03-22
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Granted: 1991-05-28
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Expires: 2009-03-22
Abstract
Abstract A method of preparing measurement specifications is used in measuring the properties of an electronic circuit by means of a test facility which includes a measurement apparatus which operates in accordance with a measurement program including measurement specifications. The method includes the steps of preparing an overall testing peripheral circuit, an interface between the overall testing peripheral circuit and the measurement apparatus, and a measurement specification for each measurement item based on input signals, switch settings, and input/output signal paths of the overall testing peripheral circuit, activating the measurement apparatus in accordance with the measurement program to produce results for each measurement item, and correcting measurement specifications based on the result of the measurement and the measurement program.
Inventors
- 👤 Teruaki Ogata
- 👤 Yuko Sudou
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 22:10
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/319; G01R31/31903; G01R31/31908; G01R31/2832; G01R31/2836; G01R31/2846
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
236 words
A method for preparing measurement specifications for an electronic circuit on a test facility which includes a measurement apparatus and operates according to a language form in accordance with a measurement standard including at least one measurement item for testing the circuit by means of the measurement apparatus, said method comprising the steps of: preparing an overall testing peripheral circuit including the circuit for which measurement specifications are to be prepared and at least one standardized testing peripheral circuit module corresponding to the at least one measurement item; designing a measurement jig including the overall testing peripheral circuit and an interface for interfacing the overall testing peripheral circuit with the measurement apparatus; preparing a measurement specification for each measurement item based on input signals, switch settings, and input/output signal paths of the overall testing peripheral circuit; preparing a measurement program in the language form of the measurement apparatus on the basis of the measurement specification; operating the measurement apparatus according to the measurement program to produce results of operation of the measurement apparatus with respect to each measurement item; evaluating the results to determine whether correction of the measurement program or the jig is needed; correcting the measurement program and the design of the measurement jig in accordance with needed corrections, if any, found by said step of evaluating; and preparing new measurement specifications based on the corrections, if any, made in said step of correcting.
Claim 2
Independent Claim
236 words
A method for preparing measurement specifications for an electronic circuit on a test facility which includes a measurement apparatus and operates according to a language form in accordance with a measurement standard including at least one measurement item for testing the circuit by means of the measurement apparatus, said method comprising the steps of: preparing an overall testing peripheral circuit including the circuit for which measurement specifications are to be prepared and at least one standardized testing peripheral circuit module corresponding to the at least one measurement item; designing a measurement jig including the overall testing peripheral circuit and an interface for interfacing the overall testing peripheral circuit with the measurement apparatus; preparing a measurement specification for each measurement item based on input signals, switch settings, and input/output signal paths of the overall testing peripheral circuit; preparing a measurement program in the language form of the measurement apparatus on the basis of the measurement specification; operating the measurement apparatus according to the measurement program to produce results of operation of the measurement apparatus with respect to each measurement item; evaluating the results to determine whether correction of the measurement program or the jig is needed; correcting the measurement program and the design of the measurement jig in accordance with needed corrections, if any, found by said step of evaluating; and preparing new measurement specifications based on the corrections, if any, made in said step of correcting.
Claim 3
Dependent Claim
20 words
A method according to claim 1 wherein said step of operating the measurement apparatus includes displaying the results of operation.
Claim 4
Dependent Claim
27 words
A method according to claim 1 wherein said step of operating the measurement apparatus includes displaying the results of operation in a general language and a figure.
Claim 5
Dependent Claim
20 words
A method according to claim 1 wherein said step of preparing new measurement specifications includes displaying the new measurement specifications.
Claim 6
Dependent Claim
27 words
A method according to claim 1 wherein said step of preparing new measurement specifications includes displaying the new measurement specifications in a general language and a figure.
Claim 7
Dependent Claim
25 words
A method according to claim 1 wherein said step of preparing a measurement specification includes preparing the measurement specifications in the form of a figure.
Claim 8
Dependent Claim
25 words
A method according to claim 1 wherein said step of preparing a measurement specification includes preparing the measurement specifications in the form of a table.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-05-27 | 1994-11-26 | 1995-05-28 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-05-27 | 1998-11-26 | 1999-05-28 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-05-27 | 2002-11-26 | 2003-05-28 | $7700.00 | Window Closed / Lapsed |