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Manufacturing process for high-frequency bipolar transistors

Assignee: STMicroelectronics SRL
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Filing: 1988-10-18
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Granted: 1991-05-07
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Expires: 2008-10-18
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Abstract

Abstract The process calls for determination of the contact areas occupied by the collector, emitter and base implantations by selective removal of a layer of oxidation resistant material only from said contact areas and not from the separating zones between said areas.

Inventors

  • 👤 Raffaele Zambrano

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 07:08
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/40; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0121; H10W10/0125; H10W10/0126; H10W10/10; H10W10/13; Y; Y10; Y10S; Y10S148/00; Y10S148/103

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 133 words
A process for manufacturing high-frequency transistors which comprises a succession of steps including: diffusing a buried layer into an appropriate substrate; growing an epitaxial layer on said buried layer and said substrate; growing a thin layer of thermal oxide on said epitaxial layer; depositing an oxidation resistant material on said thin oxide; determining and oxidizing insulating regions; determining a base region in the epitaxial layer and implanting therein a doping agent passing through said oxidation resistant material and thin oxide layers; removing the oxidation resistant material except portions in separating zones between contact areas on the substrate; implanting collector and emitter regions in the epitaxial layer under contact areas; annealing and penetrating said implanted base, collector and emitter regions; removing the thin oxide from the contact areas; and metallization of the contact areas.
Claim 2
Dependent Claim 133 words
A process for manufacturing high-frequency transistors which comprises a succession of steps including: diffusing a buried layer into an appropriate substrate; growing an epitaxial layer on said buried layer and said substrate; growing a thin layer of thermal oxide on said epitaxial layer; depositing an oxidation resistant material on said thin oxide; determining and oxidizing insulating regions; determining a base region in the epitaxial layer and implanting therein a doping agent passing through said oxidation resistant material and thin oxide layers; removing the oxidation resistant material except portions in separating zones between contact areas on the substrate; implanting collector and emitter regions in the epitaxial layer under contact areas; annealing and penetrating said implanted base, collector and emitter regions; removing the thin oxide from the contact areas; and metallization of the contact areas.
Claim 3
Dependent Claim 15 words
Process in accordance with claim 1, wherein the base implantation is performed at uniform depth.
Claim 4
Dependent Claim 22 words
Process in accordance with claim 1, wherein the phase of growth of the insulating regions is preceded by a field implantation phase.

References Cited (Backward Citations)

US3963524A Cited
US4082571A Cited
US4110779A Cited
US4143455A Cited
US4199380A Cited
US4498227A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-05-06 1994-11-05 1995-05-07 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-05-06 1998-11-05 1999-05-07 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-05-06 2002-11-05 2003-05-07 $7700.00 Window Closed / Lapsed

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