US5013672A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Manufacturing process for high-frequency bipolar transistors
Assignee: STMicroelectronics SRL
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Filing: 1988-10-18
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Granted: 1991-05-07
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Expires: 2008-10-18
Abstract
Abstract The process calls for determination of the contact areas occupied by the collector, emitter and base implantations by selective removal of a layer of oxidation resistant material only from said contact areas and not from the separating zones between said areas.
Inventors
- 👤 Raffaele Zambrano
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 03:31
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/40; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/012; H10W10/0121; H10W10/0125; H10W10/0126; H10W10/10; H10W10/13; Y; Y10; Y10S; Y10S148/00; Y10S148/103
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
133 words
A process for manufacturing high-frequency transistors which comprises a succession of steps including: diffusing a buried layer into an appropriate substrate; growing an epitaxial layer on said buried layer and said substrate; growing a thin layer of thermal oxide on said epitaxial layer; depositing an oxidation resistant material on said thin oxide; determining and oxidizing insulating regions; determining a base region in the epitaxial layer and implanting therein a doping agent passing through said oxidation resistant material and thin oxide layers; removing the oxidation resistant material except portions in separating zones between contact areas on the substrate; implanting collector and emitter regions in the epitaxial layer under contact areas; annealing and penetrating said implanted base, collector and emitter regions; removing the thin oxide from the contact areas; and metallization of the contact areas.
Claim 2
Dependent Claim
133 words
A process for manufacturing high-frequency transistors which comprises a succession of steps including: diffusing a buried layer into an appropriate substrate; growing an epitaxial layer on said buried layer and said substrate; growing a thin layer of thermal oxide on said epitaxial layer; depositing an oxidation resistant material on said thin oxide; determining and oxidizing insulating regions; determining a base region in the epitaxial layer and implanting therein a doping agent passing through said oxidation resistant material and thin oxide layers; removing the oxidation resistant material except portions in separating zones between contact areas on the substrate; implanting collector and emitter regions in the epitaxial layer under contact areas; annealing and penetrating said implanted base, collector and emitter regions; removing the thin oxide from the contact areas; and metallization of the contact areas.
Claim 3
Dependent Claim
15 words
Process in accordance with claim 1, wherein the base implantation is performed at uniform depth.
Claim 4
Dependent Claim
22 words
Process in accordance with claim 1, wherein the phase of growth of the insulating regions is preceded by a field implantation phase.
References Cited (Backward Citations)
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Cited
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US4110779A
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US4143455A
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-05-06 | 1994-11-05 | 1995-05-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-05-06 | 1998-11-05 | 1999-05-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-05-06 | 2002-11-05 | 2003-05-07 | $7700.00 | Window Closed / Lapsed |