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US4992847A Expired / Lapsed US ⏱️ 0.0 years remaining

Thin-film chip-to-substrate interconnect and methods for making same

Assignee: United States Department of Energy
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Filing: 1988-06-06
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Granted: 1991-02-12
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Expires: 2008-06-06
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Abstract

Abstract Integrated circuit chips are electrically connected to a silica wafer interconnection substrate. Thin film wiring is fabricated down bevelled edges of the chips. A subtractive wire fabrication method uses a series of masks and etching steps to form wires in a metal layer. An additive method direct laser writes or deposits very thin metal lines which can then be plated up to form wires. A quasi-additive or subtractive/additive method forms a pattern of trenches to expose a metal surface which can nucleate subsequent electrolytic deposition of wires. Low inductance interconnections on a 25 micron pitch (1600 wires on a 1 cm square chip) can be produced. The thin film hybrid interconnect eliminates solder joints or welds, and minimizes the levels of metallization. Advantages include good electrical properties, very high wiring density, excellent backside contact, compactness, and high thermal and mechanical reliability.

Inventors

  • 👤 David B. Tuckerman

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 14:44
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/117; H10W; H10W70/00; H10W70/60; H10W70/67; H10W70/68; H10W70/69; H10W70/698; H10W72/00; H10W72/30; H10W70/099; H10W72/071; H10W72/073; H10W72/07331; H10W72/07336; H10W72/07337; H10W72/50; H10W72/551; H10W72/552; H10W72/5522; H10W90/00

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 101 words
An interconnected hybrid integrated circuit structure, comprising: an interconnect substrate; one or more integrated circuit chips each having a back surface thereof bonded to a top surface of the substrate to form a hybrid integrated circuit structure; a ground surface formed on one or more lateral sides of each chip and extending across the chip-to-substrate bond into the adjoining substrate after bonding to form a smooth flush chip-to-substrate joint; electrical contacts on the chips; electrical contacts on the substrate; thin film metal wires formed on the ground surface on each chip to electrically connect the chip contacts to the substrate contacts.
Claim 2
Dependent Claim 101 words
An interconnected hybrid integrated circuit structure, comprising: an interconnect substrate; one or more integrated circuit chips each having a back surface thereof bonded to a top surface of the substrate to form a hybrid integrated circuit structure; a ground surface formed on one or more lateral sides of each chip and extending across the chip-to-substrate bond into the adjoining substrate after bonding to form a smooth flush chip-to-substrate joint; electrical contacts on the chips; electrical contacts on the substrate; thin film metal wires formed on the ground surface on each chip to electrically connect the chip contacts to the substrate contacts.
Claim 3
Dependent Claim 13 words
The structure of claim 1 wherein the interconnect substrate is a silicon wafer.
Claim 4
Dependent Claim 20 words
The structure of claim 1 further comprising at least one raised mesa formed on the substrate for mounting the chips.
Claim 5
Dependent Claim 18 words
The structure of claim 1 wherein the chips are bonded to the substrate by a thin film joint.
Claim 6
Dependent Claim 15 words
The structure of claim 4 wherein the thin film joint is made of Au-Si alloy.
Claim 7
Dependent Claim 17 words
The structure of claim 4, wherein the thin film joint has a thickness of about 1-10 microns.
Claim 8
Dependent Claim 21 words
The structure of claim 1 wherein the ground surface is bevelled at an angle of about 60° from the horizontal line.
Claim 9
Dependent Claim 12 words
The structure of claim 1 wherein the ground surface is substantially vertical.
Claim 10
Dependent Claim 22 words
The structure of claim 1 wherein the ground surface is bevelled at a reentrant angle greater than 90° from the horizontal line.
Claim 11
Dependent Claim 24 words
The structure of claim 1 wherein the wires have an interconnect density with a pitch of less than 50 microns from center to center.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-02-11 1994-08-13 1995-02-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-02-11 1998-08-13 1999-02-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-02-11 2002-08-13 2003-02-12 $7700.00 Window Closed / Lapsed

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