← Back to Patent Explorer
US4992356A Expired / Lapsed US ⏱️ 0.0 years remaining

Process of developing a radiation imaged product with trinuclear novolak oligomer having o-naphthoquinone diazide sulfonyl group

Assignee: Olin Microelectronic Chemicals Inc
•
Filing: 1990-06-08
•
Granted: 1991-02-12
•
Expires: 2010-06-08
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A trinuclear novolak oligomer of the formula (I): ##STR1## wherein each X is selected from the group consisting of hydroxyl group and halide group and Y is selected from the group consisting of a lower alkyl group having 1-4 carbon atoms and halogen atom.

Inventors

  • 👤 Alfred T. Jeffries, III
  • 👤 Andrew J. Blakeney
  • 👤 Medhat A. Toukhy

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 00:07
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/004; G03F7/022; C; C07; C07C; C07C309/00; C07C309/63; C07C309/72; C07C309/76; C07C39/00; C07C39/12; C07C39/15; C08; C08G; C08G8/00; C08G8/04; C08G8/08; C08G8/28

Claims Analysis

Total Claims: 5
Claim 1
Independent Claim 194 words
The process of developing an image-wise exposed photoresist-coated substrate comprising: (1) coating said substrate with a radiation sensitive mixture useful as a positive working photoresist, said mixture comprising an admixture of an alkali soluble binder resin and a photoactive compound of formula II: ##STR10## wherein each X' is selected from the group consisting of hydrogen, OD and halide; Y' is selected from the group consisting of a lower alkyl group having 1-4 carbon atoms and halogen atom; and D is selected from the group consisting of o-naphthoquinone diazide sulfonyl group and hydrogen; with the proviso that at least two Ds are o-naphthoquinone diazide sulfonyl groups; and wherein the amount of said binder resin being about 60% to 95% by weight and the amount of photoactive compound being from about 5% to about 40% by weight, based on the total solids content of said radiation sensitive mixture; (2) subjecting said coating on said substrate to an image-wise exposure of radiation; and (3) subjecting said image-wise exposed coated substrate to a developing solution the exposed areas of said radiation-exposed coating are dissolved and removed from the substrate, thereby resulting in positive image-wise pattern in the coating.
Claim 2
Dependent Claim 194 words
The process of developing an image-wise exposed photoresist-coated substrate comprising: (1) coating said substrate with a radiation sensitive mixture useful as a positive working photoresist, said mixture comprising an admixture of an alkali soluble binder resin and a photoactive compound of formula II: ##STR10## wherein each X' is selected from the group consisting of hydrogen, OD and halide; Y' is selected from the group consisting of a lower alkyl group having 1-4 carbon atoms and halogen atom; and D is selected from the group consisting of o-naphthoquinone diazide sulfonyl group and hydrogen; with the proviso that at least two Ds are o-naphthoquinone diazide sulfonyl groups; and wherein the amount of said binder resin being about 60% to 95% by weight and the amount of photoactive compound being from about 5% to about 40% by weight, based on the total solids content of said radiation sensitive mixture; (2) subjecting said coating on said substrate to an image-wise exposure of radiation; and (3) subjecting said image-wise exposed coated substrate to a developing solution the exposed areas of said radiation-exposed coating are dissolved and removed from the substrate, thereby resulting in positive image-wise pattern in the coating.
Claim 3
Dependent Claim 11 words
The process of claim 1 wherein said radiation is ultraviolet light.
Claim 4
Dependent Claim 34 words
The process of claim 1 wherein said image-wise exposed coated substrate is subjected to a post exposure bake at a temperature from about 90° C. to about 120° C. before said development step (3).
Claim 5
Dependent Claim 27 words
The process of claim 1 wherein said developing solution comprises an aqueous solution of an alkali metal hydroxide or silicates or an aqueous solution of tetramethylammonium hydroxide.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-02-11 1994-08-13 1995-02-12 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-02-11 1998-08-13 1999-02-12 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-02-11 2002-08-13 2003-02-12 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag