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Electron-detector diode biassing scheme for improved writing by an electron beam lithography machine

Assignee: Applied Materials Inc
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Filing: 1989-08-08
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Granted: 1991-01-22
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Expires: 2009-08-08
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Abstract

Abstract Disclosed is a biassing scheme for a beam position location apparatus (50) which comprises electron detector diodes (52) in an electron beam lithography machine (10) such that the detector diodes (52) deposit fewer secondary electrons (62) on a substrate (16) being processed by the electron beam (22) and thus reduce or eliminate any charge buildup on said substrate which deflect the electron beam (22) causing pattern distortion.

Inventors

  • 👤 William J. DeVore

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 10:45
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/06; H01J37/30; H01J37/317; H01J37/3174; B; B82; B82Y; B82Y10/00; B82Y40/00; H01J37/244; H01J2237/00; H01J2237/244; H01J2237/2441; H01J2237/24475; H01J2237/2449; H01J2237/245; H01J2237/24507; H01J2237/24571; H01J2237/24578

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 103 words
In an electron beam lithography machine with a beam column and having a controlled electron beam capable of writing a pattern on a substrate located beneath the beam column, the improvement in a beam position locating apparatus comprising, electron detector means which locates the beam position by responding to backscattered electrons generated by the electron bombardment on said substrate by said electron beam, and means to reduce or eliminate secondary electrons emitted from said detector in response to said bombardment from reaching said substrate thereby reducing or eliminating a charge buildup on said substrate which would deflect said beam and cause pattern distortion.
Claim 2
Dependent Claim 103 words
In an electron beam lithography machine with a beam column and having a controlled electron beam capable of writing a pattern on a substrate located beneath the beam column, the improvement in a beam position locating apparatus comprising, electron detector means which locates the beam position by responding to backscattered electrons generated by the electron bombardment on said substrate by said electron beam, and means to reduce or eliminate secondary electrons emitted from said detector in response to said bombardment from reaching said substrate thereby reducing or eliminating a charge buildup on said substrate which would deflect said beam and cause pattern distortion.
Claim 3
Dependent Claim 35 words
The machine as claimed in claim 1 wherein the means to reduce or eliminate said secondary electrons from reaching said substrate comprises a biasing means on said electron detector means to attract said secondary electrons.
Claim 4
Dependent Claim 29 words
The machine as claimed in claim 2 wherein said biasing means comprises the application of a voltage on said detector means which is positive with respect to said substrate.
Claim 5
Dependent Claim 43 words
The machine as claimed in claim 1 wherein said electron detector means comprises diode means and wherein the means to reduce or eliminate said secondary electrons from reaching said substrate comprises a biasing means on said diode means to attract said secondary electrons.
Claim 6
Dependent Claim 29 words
The machine as claimed in claim 4 wherein said biasing means comprises the application of a voltage on said diode means which is positive with respect to said substrate.

References Cited (Backward Citations)

US4680468A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-01-21 1994-07-23 1995-01-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-01-21 1998-07-23 1999-01-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-01-21 2002-07-23 2003-01-22 $7700.00 Window Closed / Lapsed

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