US4980739A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Self-aligned bipolar transistor using selective polysilicon growth
Assignee: Texas Instruments Inc
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Filing: 1990-01-09
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Granted: 1990-12-25
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Expires: 2010-01-09
Abstract
Abstract A polysilicon self-aligned transistor has a polysilicon layer (24) with a cavity (30) formed therein. To form the polysilicon layer (24) with a cavity (30), a thin seed layer (14) is disposed over an epitaxial layer (11a). Dielectric layers (16, 18) are formed over the seed layer (14), and are subsequently etched to define the polysilicon layer (24) and the cavity (30). The cavity (30) is defined by a dielectric plug (22). The exposed seed layer (14) is used to selectively grow the polysilicon layer (24). Thereafter, the dielectric plug (22) is removed to form the cavity (30) through which the base (32) is implanted into the substrate (12) and the emitter (36) is formed.
Inventors
- 👤 David P. Favreau
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 13:48
CPC Classifications
H; H10; H10D; H10D10/00; H10D10/01; H10D10/051; H10D62/00; H10D62/10; H10D62/13; H10D62/133; H10D64/00; H10D64/01; H10D64/011; H10D64/0111; H10D64/0113; H10D64/20; H10D64/23; H10D64/231; H10D64/27; H10D64/281
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
263 words
A self-aligned transistor, comprising: a semiconductor substrate of a first conductivity type; an epitaxial layer of a second conductivity type formed on the surface of the substrate; an oxide layer formed over regions of the epitaxial layer, a device region being defined between the regions of the epitaxial layer over which the oxide layer has been formed; a seed layer of silicon formed over the surface of the oxide layer and the surface of the device region, the seed layer having first and second portions, the first portion overlying the device region and portions of the oxide layer around the device region; a polysilicon layer of the first conductivity type grown from the first portion of the seed layer, the polysilicon layer having outer sidewalls overlying the oxide layer and inner sidewalls overlying the device region, the first portion of the seed layer becoming a part of the polysilicon layer and the second portion of the seed layer being undoped; an intrinsic base region formed in alignment with the inner sidewalls of the polysilicon layer; a first insulating layer formed on the inner sidewalls of the polysilicon layer; a polysilicon region of the second conductivity type disposed adjacent to the first insulating layer, the polysilicon region defining an emitter region within said intrinsic base region; an extrinsic base region, the extrinsic base region being formed in alignment with the oxide layer surrounding the device region; and a second insulating layer formed on the outer sidewalls of the polysilicon layer to electrically isolate said polysilicon layer from said second portion of said seed layer.
Claim 2
Dependent Claim
263 words
A self-aligned transistor, comprising: a semiconductor substrate of a first conductivity type; an epitaxial layer of a second conductivity type formed on the surface of the substrate; an oxide layer formed over regions of the epitaxial layer, a device region being defined between the regions of the epitaxial layer over which the oxide layer has been formed; a seed layer of silicon formed over the surface of the oxide layer and the surface of the device region, the seed layer having first and second portions, the first portion overlying the device region and portions of the oxide layer around the device region; a polysilicon layer of the first conductivity type grown from the first portion of the seed layer, the polysilicon layer having outer sidewalls overlying the oxide layer and inner sidewalls overlying the device region, the first portion of the seed layer becoming a part of the polysilicon layer and the second portion of the seed layer being undoped; an intrinsic base region formed in alignment with the inner sidewalls of the polysilicon layer; a first insulating layer formed on the inner sidewalls of the polysilicon layer; a polysilicon region of the second conductivity type disposed adjacent to the first insulating layer, the polysilicon region defining an emitter region within said intrinsic base region; an extrinsic base region, the extrinsic base region being formed in alignment with the oxide layer surrounding the device region; and a second insulating layer formed on the outer sidewalls of the polysilicon layer to electrically isolate said polysilicon layer from said second portion of said seed layer.
Claim 3
Dependent Claim
13 words
The transistor of claim 1 wherein said seed layer comprises a polysilicon layer.
Claim 4
Dependent Claim
15 words
The transistor of claim 1 wherein said seed layer comprises a layer of amorphous silicon.
Claim 5
Dependent Claim
16 words
The transistor of claim 1 wherein said first and second insulating layers comprise thermal oxide layers.
References Cited (Backward Citations)
US4782030A
Cited
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