Circuit for testing integrated circuits

Claim 2

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a separate circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1e) external from said functional block, cascade connected on said data path for storing said control data external to said functional block for testing said functional block; test data generating means (13a and 11a) for receiving said control data stored in said plurality of latch means and, in response, generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 3

A testing circuit according to claim 1, wherein said test data generating means comprises a first data register (13a) for storing said N bit test data, and said expected value data generating means comprises a second data register (13b) for storing said N bit expected value data.

Claim 4

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1 e) cascade connected on said data path for storing said control data for testing; test data generating mans (13a and 11a) for generating N bit test data for input to said functional block, said test data generating means including a first data register (13a) for storing N bit test data and first pattern changing means (11a) for changing a bit pattern of output data from said first data register responsive to an applied logic signal; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block, said expected value data generating means including a second data register (13b) for storing said N bit expected value data and second pattern changing means (11b) for changing a bit pattern of output data from said second data register responsive to an applied logic signal; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 5

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1 e) cascade connected on said data path for storing said control data for testing; test data generating mans (13a and 11a) for generating N bit test data for input to said functional block, said test data generating means including a first data register (13a) for storing N bit test data and first pattern changing means (11a) for changing a bit pattern of output data from said first data register responsive to an applied logic signal; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block, said expected value data generating means including a second data register (13b) for storing said N bit expected value data and second pattern changing means (11b) for changing a bit pattern of output data from said second data register responsive to an applied logic signal; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 6

A testing circuit according to claim 3, wherein said plurality of latch means comprise a latch circuit (1c) for storing the logic signal to be applied to said first pattern changing means, and a latch circuit (1d) for storing the logic signal to be applied to said second pattern changing means.

Claim 7

A testing circuit according to claim 4, wherein said first and second pattern changing means comprise a plurality (N) of exclusive OR gates (21 and 25) each provided for every bit.

Claim 8

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a first data path (17) to which control data for testing said functional block is applied; a second data path (18) different from said first data path (17) for providing test data to, and resultant data from, said functional block; a plurality of latch means (1a to 1e) cascade connected on said first data path for storing said control data for testing; test data generating means (13a to 11a) for generating N bit test data for input to said functional block, said test data generating means including a first data register (13a) provided on said second data path (18) for storing N bit test data and first pattern changing means (11a) for changing a bit pattern of output data from said first data register responsive to an applied logic signal; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block, said expected value data generating means including a second data register (13b) provided on said second data path (18) for storing said N bit expected value data and second pattern changing means (11b) for changing a bit pattern of output data from said second data register responsive to an applied logic signal; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 9

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a first data path (17) to which control data for testing said functional block is applied; a second data path (18) different from said first data path (17) for providing test data to, and resultant data from, said functional block; a plurality of latch means (1a to 1e) cascade connected on said first data path for storing said control data for testing; test data generating means (13a to 11a) for generating N bit test data for input to said functional block, said test data generating means including a first data register (13a) provided on said second data path (18) for storing N bit test data and first pattern changing means (11a) for changing a bit pattern of output data from said first data register responsive to an applied logic signal; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block, said expected value data generating means including a second data register (13b) provided on said second data path (18) for storing said N bit expected value data and second pattern changing means (11b) for changing a bit pattern of output data from said second data register responsive to an applied logic signal; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 10

A testing circuit according to claim 6, wherein said second data path is a data path provided for testing another functional block.

Claim 11

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1e) cascade connected on said data path for storing said control data for testing; test data generating means (13a and 11a) for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) including a plurality (N) of exclusive OR gates each for comparing a respective correspondence bit of said resultant data outputted from said functional block with respective ones of said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 12

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1e) cascade connected on said data path for storing said control data for testing; test data generating means (13a and 11a) for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) including a plurality (N) of exclusive OR gates each for comparing a respective correspondence bit of said resultant data outputted from said functional block with respective ones of said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 13

A testing circuit according to claim 8, further comprising an OR gate (27) for outputting OR of said a plurality (N) of exclusive OR gates included in said determining means.

Claim 14

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1e) cascade connected on said data path for storing said control data for testing; test data generating mans (13a and 11a) for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof, wherein said functional block to be tested is a rewritable memory (100) of N bits×M words (M is a positive integer).

Claim 15

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which control data for testing said functional block is applied; a plurality of latch means (1a to 1e) cascade connected on said data path for storing said control data for testing; test data generating mans (13a and 11a) for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof, wherein said functional block to be tested is a rewritable memory (100) of N bits×M words (M is a positive integer).

Claim 16

In an integrated circuit comprising a functional block (10, 15 and 16) with N (N is an integer no less than 2) bit input, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which data required for testing said functional block are inputted; a plurality of latch means (1a to 1e) cascade connected on said data path for holding said data required for testing; and test data generating means (13a and 11a) for generating N bit test data to be inputted to said functional block; wherein said test data generating means comprises a data register (13a) for storing said N bit test data, and pattern changing means (11a) for changing a bit pattern of output data of said data register based on an applied logic signal; and said plurality of latch means comprises a latch circuit (1c) for storing the logic signal to be applied to said pattern changing means.

Claim 17

In an integrated circuit comprising a functional block (10, 15 and 16) with N (N is an integer no less than 2) bit input, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which data required for testing said functional block are inputted; a plurality of latch means (1a to 1e) cascade connected on said data path for holding said data required for testing; and test data generating means (13a and 11a) for generating N bit test data to be inputted to said functional block; wherein said test data generating means comprises a data register (13a) for storing said N bit test data, and pattern changing means (11a) for changing a bit pattern of output data of said data register based on an applied logic signal; and said plurality of latch means comprises a latch circuit (1c) for storing the logic signal to be applied to said pattern changing means.

Claim 18

A testing circuit according to claim 11, wherein said pattern changing means comprises a plurality (N) of exclusive OR gates 21 each provided for every bit.

Claim 19

A testing circuit according to claim 11, wherein said data register is provided on another data path (18) different from said data path (17).

Claim 20

A testing circuit according to claim 13, wherein said another data path is provided for testing another functional block.

Claim 21

In an integrated circuit comprising a functional block (10, 15 and 16) with N (N is an integer no less than 2) bit input, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which data required for testing said functional block are inputted; a plurality of latch means (1a to 1e) cascade connected on said data path for holding said data required for testing; expected value data generating means (13b and 11b) for generating N bit expected value data; and determining means (24) for comparing every corresponding bit of the N bit data outputted from said functional block with said N bit expected value data to determine coincidence or non-coincidence therebetween; wherein said expected value generating means comprises a data register (13b) for storing N bit expected value data, and pattern changing means (11b) for changing a bit pattern of output data of said data register based on an applied logic signal; and said plurality of latch means comprises a latch circuit (1c) for storing the logic signal to be applied to said pattern changing means.

Claim 22

In an integrated circuit comprising a functional block (10, 15 and 16) with N (N is an integer no less than 2) bit input, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a data path (17) to which data required for testing said functional block are inputted; a plurality of latch means (1a to 1e) cascade connected on said data path for holding said data required for testing; expected value data generating means (13b and 11b) for generating N bit expected value data; and determining means (24) for comparing every corresponding bit of the N bit data outputted from said functional block with said N bit expected value data to determine coincidence or non-coincidence therebetween; wherein said expected value generating means comprises a data register (13b) for storing N bit expected value data, and pattern changing means (11b) for changing a bit pattern of output data of said data register based on an applied logic signal; and said plurality of latch means comprises a latch circuit (1c) for storing the logic signal to be applied to said pattern changing means.

Claim 23

A testing circuit according to claim 15, wherein said pattern changing means comprises N exclusive OR gates (25) provided for every bit.

Claim 24

A testing circuit according to claim 16, further comprising an OR gates for outputting OR of said N exclusive OR gates included in said determining means.

Claim 25

A testing circuit according to claim 15, wherein said determining means comprises N exclusive OR gates (24) provided for every bit.

Claim 26

A testing circuit according to claim 15, wherein said data register is provided on another data path (18) different from said data path (17).

Claim 27

A testing circuit according to claim 19, wherein said another data path is a data path provided for testing another functional block.

Claim 28

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a first data path (17) receiving control data for testing said functional block; a second data path (18) for providing test data to, and resultant data from, said functional block; a plurality of latch means (1a to 1e) cascade connected on said first data path for storing said control data for testing; test data generating means (13a and 11a) connected on said second data path for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) connected on said second data path for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.

Claim 29

In an integrated circuit comprising a functional block with N (N is an integer no less than 2) bit inputs, a circuit provided on the same chip as said integrated circuit for testing said functional block, comprising: a first data path (17) receiving control data for testing said functional block; a second data path (18) for providing test data to, and resultant data from, said functional block; a plurality of latch means (1a to 1e) cascade connected on said first data path for storing said control data for testing; test data generating means (13a and 11a) connected on said second data path for generating N bit test data for input to said functional block; expected value data generating means (13b and 11b) connected on said second data path for generating N bit expected value data for comparison with resultant data output from said functional block in correspondence with said N bit test data input to said functional block; and determining means (24) for comparing every corresponding bit of said resultant data outputted from said functional block with said N bit expected value data for determining coincidence or non-coincidence thereof.