Patent US4972143A successfully refreshed from Google Patents.
US4972143A
Expired / Lapsed
US
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Diaphragm test probe
Assignee: Raytheon Co
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Filing: 1988-11-30
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Granted: 1990-11-20
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Expires: 2008-11-30
Abstract
Abstract A diaphragm test probe for establishing a detachable electrical connection to the pads on an integrated circuit chip. Leads are electrically connected to a plurality of conductive contacts which are affixed to a flexible diaphragm. The conductive contacts are arranged to match the pattern of the pads on the integrated circuit chip and are aligned with these pads using visual sighting. After alignment, fluidic pressure is applied to the flexible diaphragm, causing it to flex and, in turn, the conductive contacts to make electrical contact with the pads on the integrated circuit. A plurality of sets of conductive contacts may be affixed to a single flexible diaphragm so as to allow multiple chip testing without realignment of the test probe.
Inventors
- 👤 Albert Kamensky
- 👤 James H. Cliborn
- 👤 Louis E. Gates, Jr.
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 13:06
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/0735
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
126 words
A diaphragm test probe for establishing a detachable electrical connection with a pattern of electrical contacts on an integrated circuit comprising: a. a flexible sing-layer diaphragm having a thickness in the range of 5 to 15 microns; b. a plurality of conductive contacts, each electrically insulated form one another and affixed to said flexible diaphragm in a pattern which matches at least a portion of the pattern of the electrical contacts on the integrated circuit; c. a plurality of contact leads, each electrically insulated from one another and connected to one of said conductive contacts; and d. pressure transfer means coupled to said flexible diaphragm for transferring pressure to the portion of said diaphragm to which said conductive contacts are affixed from a source of pressure.
Claim 2
Dependent Claim
126 words
A diaphragm test probe for establishing a detachable electrical connection with a pattern of electrical contacts on an integrated circuit comprising: a. a flexible sing-layer diaphragm having a thickness in the range of 5 to 15 microns; b. a plurality of conductive contacts, each electrically insulated form one another and affixed to said flexible diaphragm in a pattern which matches at least a portion of the pattern of the electrical contacts on the integrated circuit; c. a plurality of contact leads, each electrically insulated from one another and connected to one of said conductive contacts; and d. pressure transfer means coupled to said flexible diaphragm for transferring pressure to the portion of said diaphragm to which said conductive contacts are affixed from a source of pressure.
Claim 3
Dependent Claim
175 words
A diaphragm test probe for establishing a detachable electrical connection with a pattern of electrical contacts on an integrated circuit comprising: a. a flexible single-layer diaphragm having a thickness in the range of 5 to 15 microns; b. a plurality of conductive contacts, each made of soft gold and electrically insulated from one another and affixed to said flexible diaphragm in a pattern which matches at least a portion of the pattern of the electrical contacts on the integrated circuit; c. a plurality of contact leads, each electrically insulated from one another, connected to one of said conductive contacts, and having been affixed to said flexible diaphragm through sputtering techniques, each of said conductive contacts having been deposited on each of said contact leads and having a cross-sectional area of approximately one square mil and being spaced from one another by approximately two mils; and d. pressure transfer means coupled to said flexible diaphragm for transferring pressure to the portion of said diaphragm to which said conductive contacts are affixed from a source of pressure.
Claim 4
Dependent Claim
175 words
A diaphragm test probe for establishing a detachable electrical connection with a pattern of electrical contacts on an integrated circuit comprising: a. a flexible single-layer diaphragm having a thickness in the range of 5 to 15 microns; b. a plurality of conductive contacts, each made of soft gold and electrically insulated from one another and affixed to said flexible diaphragm in a pattern which matches at least a portion of the pattern of the electrical contacts on the integrated circuit; c. a plurality of contact leads, each electrically insulated from one another, connected to one of said conductive contacts, and having been affixed to said flexible diaphragm through sputtering techniques, each of said conductive contacts having been deposited on each of said contact leads and having a cross-sectional area of approximately one square mil and being spaced from one another by approximately two mils; and d. pressure transfer means coupled to said flexible diaphragm for transferring pressure to the portion of said diaphragm to which said conductive contacts are affixed from a source of pressure.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1993-11-19 | 1994-05-21 | 1994-11-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1997-11-19 | 1998-05-21 | 1998-11-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2001-11-19 | 2002-05-21 | 2002-11-20 | $7700.00 | Window Closed / Lapsed |